US Patent 8785883 Transmission electron microscope, and method of observing specimen
Patent 8785883 was granted and assigned to Hitachi on July, 2014 by the United States Patent and Trademark Office.
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Patent. https://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/12024705Edits on 26 Sep, 2023
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Patent Inventor Names
Eiko Nakazawa1
Hiroyuki Kobayashi1
Susumu Kuwabata1
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Patent. https://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/8785883Edits on 16 Jul, 2023
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US Patent 08785883 Transmission electron microscope, and method of observing specimen US Patent 8785883 Transmission electron microscope, and method of observing specimen
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Patent Number
087858831
Patent Number
87858831
1
Type: Web page
Patent. https://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/8785883Edits on 22 May, 2023
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Patent. https://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/8785883Edits on 1 Apr, 2023
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Is a
Current Assignee
Patent Jurisdiction
Patent Number
087858831
Date of Patent
July 22, 2014
1Patent Application Number
129186191
Date Filed
April 27, 2009
1Official Website
Patent Primary Examiner
1
Type: Web page
Patent. https://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/8785883Edits on 19 Jun, 2022
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US Patent 08785883 Transmission electron microscope, and method of observing specimen
Infobox
Is a
Current assignee
Patent jurisdiction
Patent number
08785883
Date of patent
July 22, 2014
Patent application number
12918619
Date Filed
April 27, 2009
Patent primary examiner
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