US Patent 8785883 Transmission electron microscope, and method of observing specimen
Patent 8785883 was granted and assigned to Hitachi on July, 2014 by the United States Patent and Trademark Office.
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Patent Citations Received
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Patent Inventor Names
Eiko Nakazawa0
Hiroyuki Kobayashi0
Susumu Kuwabata0
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US Patent 08785883 Transmission electron microscope, and method of observing specimen US Patent 8785883 Transmission electron microscope, and method of observing specimen
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Patent Number
087858830
Patent Number
87858830
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Official Website
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Is a
Current Assignee
Patent Jurisdiction
Patent Number
087858830
Date of Patent
July 22, 2014
0Patent Application Number
129186190
Date Filed
April 27, 2009
0Official Website
Patent Primary Examiner
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US Patent 08785883 Transmission electron microscope, and method of observing specimen
Infobox
Is a
Current assignee
Patent jurisdiction
Patent number
08785883
Date of patent
July 22, 2014
Patent application number
12918619
Date Filed
April 27, 2009
Patent primary examiner
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