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US Patent 8791575 Microelectronic elements having metallic pads overlying vias
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Patent
Date Filed
July 23, 2010
Date of Patent
July 29, 2014
Patent Application Number
12842717
Patent Citations Received
US Patent 12113056 Stacked dies and methods for forming bonded structures
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US Patent RE49987 Multiple plated via arrays of different wire heights on a same substrate
0
US Patent 11764177 Bonded structure with interconnect structure
US Patent 11855064 Techniques for processing devices
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US Patent 11935907 Image sensor device
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US Patent 11955463 Direct bonded stack structures for increased reliability and improved yield in microelectronics
0
US Patent 11990382 Fine pitch BVA using reconstituted wafer with area array accessible for testing
0
Patent Jurisdiction
United States Patent and Trademark Office
Patent Number
8791575
Patent Primary Examiner
Matthew Reames
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