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US Patent 8927907 Thermally zoned substrate holder assembly

Patent 8927907 was granted and assigned to Tokyo Electron on January, 2015 by the United States Patent and Trademark Office.

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Patent
Patent

Patent attributes

Current Assignee
Tokyo Electron
Tokyo Electron
Patent Jurisdiction
United States Patent and Trademark Office
United States Patent and Trademark Office
Patent Number
8927907
Date of Patent
January 6, 2015
Patent Application Number
13307176
Date Filed
November 30, 2011
Patent Citations Received
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US Patent 12061227 Integrated heater and temperature measurement
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US Patent 11841392 Integrated test cell using active thermal interposer (ATI) with parallel socket actuation
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US Patent 11852678 Multi-input multi-zone thermal control for device testing
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US Patent 11940487 Thermal solution for massively parallel testing
0
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US Patent 11656272 Test system with a thermal head comprising a plurality of adapters and one or more cold plates for independent control of zones
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US Patent 11656273 High current device testing apparatus and systems
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US Patent 11674999 Wafer scale active thermal interposer for device testing
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US Patent 11693051 Thermal head for independent control of zones
0
...
Patent Primary Examiner
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Sylvia R. MacArthur
Patent abstract

A thermally zoned substrate holder including a substantially cylindrical base having top and bottom surfaces configured to support a substrate. A plurality of temperature control elements are disposed within the base. An insulator thermally separates the temperature control elements. The insulator is made from an insulting material having a lower coefficient of thermal conductivity than the base (e.g., a gas- or vacuum-filled chamber).

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