US Patent 9262303 Automated semiconductor design flaw detection system
Patent 9262303 was granted and assigned to Altera on February, 2016 by the United States Patent and Trademark Office.
Is a
Current Assignee
Date Filed
December 3, 2009
0
Date of Patent
February 16, 2016
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Patent Application Number
12630719
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Patent Citations Received
Patent Inventor Names
Elliot H. Mednick
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Roderick B. Sullivan, Jr.
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Christopher A. Schalick
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Matthew D. Kopser
0
Patent Jurisdiction
Patent Number
Patent Primary Examiner
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