Is a
Patent attributes
Patent Applicant
Current Assignee
Patent Jurisdiction
Patent Number
Patent Inventor Names
Venkatesh R. Iyer0
Date of Patent
September 13, 2016
Patent Application Number
13786108
Date Filed
March 5, 2013
Patent Citations Received
Patent Primary Examiner
Patent abstract
A quality inspection and analytics system may include a quality inspection module to receive the information for inspection lots and display the information for the inspection lots simultaneously in a scrollable screen via a user interface. The information for the inspection lots may include inspection metrics, expected values for the inspection metrics and measured values for the inspection metrics. The quality inspection module may receive a usage decision and store the usage decision. Also, the system may include a quality analytics module to execute causal analysis of rejected inspection lots based on the inspection lot information.
Timeline
No Timeline data yet.
Further Resources
No Further Resources data yet.
