US Patent 9443217 Manufacturing quality inspection and analytics system
Patent 9443217 was granted and assigned to Accenture on September, 2016 by the United States Patent and Trademark Office.
Is a
Current Assignee
Date Filed
March 5, 2013
Date of Patent
September 13, 2016
Patent Applicant
Patent Application Number
13786108
Patent Inventor Names
Venkatesh R. Iyer
0
Patent Jurisdiction
Patent Number
Patent Primary Examiner
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