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US Patent 9443217 Manufacturing quality inspection and analytics system

Patent 9443217 was granted and assigned to Accenture on September, 2016 by the United States Patent and Trademark Office.

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Patent Citations Received
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US Patent 12106261 Systems and methods for condition compliance
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Patent Citations Received
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US Patent 11836674 Automated inspection system
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Patent abstract

A quality inspection and analytics system may include a quality inspection module to receive the information for inspection lots and display the information for the inspection lots simultaneously in a scrollable screen via a user interface. The information for the inspection lots may include inspection metrics, expected values for the inspection metrics and measured values for the inspection metrics. The quality inspection module may receive a usage decision and store the usage decision. Also, the system may include a quality analytics module to execute causal analysis of rejected inspection lots based on the inspection lot information.

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Patent Inventor Names
Venkatesh R. Iyer0
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Patent Citations Received
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US Patent 11715059 Systems and methods for condition compliance
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Official Website
https://pdfpiw.uspto.gov/.piw?Docid=09443217
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US Patent 09443217 Manufacturing quality inspection and analytics system US Patent 9443217 Manufacturing quality inspection and analytics system

Infobox
Patent Number
09443217
Patent Number
9443217
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Website URL
https://pdfpiw.uspto.gov/.piw?Docid=09443217
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 US Patent 09443217 Manufacturing quality inspection and analytics system

Infobox
Is a
Patent
Patent
Patent applicant
Accenture
Accenture
Current assignee
Accenture
Accenture
Patent jurisdiction
United States Patent and Trademark Office
United States Patent and Trademark Office
Patent number
09443217
Date of patent
September 13, 2016
Patent application number
13786108
Date Filed
March 5, 2013
Patent primary examiner
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Mahesh Dwivedi

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