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Ha Nguyen Ha

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Edits on 14 Dec, 2021
"Remove inverse infobox"
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Golden AI
edited on 14 Dec, 2021
Edits made to:
Infobox (-38 properties)
Infobox
Patent primary examiner of
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US Patent 7394275 Systems and methods for generating and evaluating high frequency, low voltage swing signals at in-circuit testing
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US Patent 7397254 Methods for imperfect insulating film electrical thickness/capacitance measurement
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US Patent 7397255 Micro Kelvin probes and micro Kelvin probe methodology
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US Patent 7400132 Current sensor and method of manufacturing the same
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US Patent 7400133 Speech generating method for use with signal generators
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US Patent 7400161 Electronic device test system
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US Patent 7403027 Apparatuses and methods for outputting signals during self-heat burn-in modes of operation
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US Patent 7403028 Test structure and probe for differential signals
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US Patent 7408338 Handler for testing semiconductor devices
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US Patent 7408339 Test system of semiconductor device having a handler remote control and method of operating the same
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US Patent 7408375 Method and testing apparatus for testing integrated circuits
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US Patent 7414388 Gain and phase detector having dual logarithmic amplifiers
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US Patent 7414389 Low-power battery pack with hall-effect sensor
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US Patent 7416974 Method of manufacturing semiconductor device, and semiconductor device
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US Patent 7419888 Method of forming a silicon-rich nanocrystalline structure by an atomic layer deposition process and method of manufacturing a non-volatile semiconductor device using the same
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US Patent 7420380 Probe card and semiconductor testing device using probe sheet or probe card semiconductor device producing method
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US Patent 7425839 Systems and methods for testing packaged microelectronic devices
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US Patent 7425840 Semiconductor device with multipurpose pad
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US Patent 7429867 Circuit for and method of detecting a defect in a component formed in a substrate of an integrated circuit
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US Patent 7432702 Circuit board damping assembly
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US Patent 7436169 Mechanical stress characterization in semiconductor device
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US Patent 7436171 Apparatus for probing multiple integrated circuit devices
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US Patent 7439727 Interlocking electrical test probes
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US Patent 7439729 Integrated systems testing
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US Patent 7439755 Electronic circuit for measurement of transistor variability and the like
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US Patent 7442574 Organic triodes with novel grid structures and method of production
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US Patent 7443183 Motherboard test machine
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US Patent 7446553 Semiconductor device testing
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US Patent 7449898 Method and apparatus for reviewing defects by detecting images having voltage contrast
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US Patent 7449902 Probe system
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US Patent 7453258 Method and apparatus for remotely buffering test channels
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US Patent 7453261 Method of and system for monitoring the functionality of a wafer probe site
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US Patent 7456073 Wet electrolytic capacitors
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US Patent 7463044 Adapter for positioning of contact tips
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US Patent 7466157 Contactless interfacing of test signals with a device under test
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US Patent 7466159 Semiconductor integrated circuit having multiple semiconductor chips with signal terminals
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US Patent 7579848 High density interconnect system for IC packages and interconnect assemblies
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US Patent 7994776 Failure detection apparatus for resolver
Edits on 8 Dec, 2021
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Golden AI
edited on 8 Dec, 2021
Edits made to:
Infobox (+1 properties)
Infobox
Patent primary examiner of
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US Patent 7994776 Failure detection apparatus for resolver
Edits on 2 Dec, 2021
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Golden AI
edited on 2 Dec, 2021
Edits made to:
Infobox (+1 properties)
Infobox
Patent primary examiner of
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US Patent 7579848 High density interconnect system for IC packages and interconnect assemblies
Edits on 1 Dec, 2021
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Golden AI
edited on 1 Dec, 2021
Golden AI profile picture
Golden AI
edited on 1 Dec, 2021
Edits made to:
Infobox (+1 properties)
Infobox
Patent primary examiner of
‌
US Patent 7466157 Contactless interfacing of test signals with a device under test
Golden AI profile picture
Golden AI
edited on 1 Dec, 2021
Edits made to:
Infobox (+1 properties)
Infobox
Patent primary examiner of
‌
US Patent 7463044 Adapter for positioning of contact tips
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Golden AI
edited on 1 Dec, 2021
Edits made to:
Infobox (+1 properties)
Infobox
Patent primary examiner of
‌
US Patent 7456073 Wet electrolytic capacitors
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Golden AI
edited on 1 Dec, 2021
Edits made to:
Infobox (+1 properties)
Infobox
Patent primary examiner of
‌
US Patent 7453261 Method of and system for monitoring the functionality of a wafer probe site
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Golden AI
edited on 1 Dec, 2021
Edits made to:
Infobox (+1 properties)
Infobox
Patent primary examiner of
‌
US Patent 7453258 Method and apparatus for remotely buffering test channels
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Golden AI
edited on 1 Dec, 2021
Edits made to:
Infobox (+1 properties)
Infobox
Patent primary examiner of
‌
US Patent 7449898 Method and apparatus for reviewing defects by detecting images having voltage contrast
Golden AI profile picture
Golden AI
edited on 1 Dec, 2021
Edits made to:
Infobox (+1 properties)
Infobox
Patent primary examiner of
‌
US Patent 7449902 Probe system
Golden AI profile picture
Golden AI
edited on 1 Dec, 2021
Edits made to:
Infobox (+1 properties)
Infobox
Patent primary examiner of
‌
US Patent 7446553 Semiconductor device testing
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Golden AI
edited on 1 Dec, 2021
Edits made to:
Infobox (+1 properties)
Infobox
Patent primary examiner of
‌
US Patent 7443183 Motherboard test machine
Golden AI profile picture
Golden AI
edited on 1 Dec, 2021
Edits made to:
Infobox (+1 properties)
Infobox
Patent primary examiner of
‌
US Patent 7442574 Organic triodes with novel grid structures and method of production
Golden AI profile picture
Golden AI
edited on 1 Dec, 2021
Edits made to:
Infobox (+1 properties)
Infobox
Patent primary examiner of
‌
US Patent 7439755 Electronic circuit for measurement of transistor variability and the like
Golden AI profile picture
Golden AI
edited on 1 Dec, 2021
Edits made to:
Infobox (+1 properties)
Infobox
Patent primary examiner of
‌
US Patent 7439729 Integrated systems testing
Golden AI profile picture
Golden AI
edited on 1 Dec, 2021
Edits made to:
Infobox (+1 properties)
Infobox
Patent primary examiner of
‌
US Patent 7439727 Interlocking electrical test probes
Golden AI profile picture
Golden AI
edited on 1 Dec, 2021
Edits made to:
Infobox (+1 properties)
Infobox
Patent primary examiner of
‌
US Patent 7436171 Apparatus for probing multiple integrated circuit devices
Golden AI profile picture
Golden AI
edited on 1 Dec, 2021
Edits made to:
Infobox (+1 properties)
Infobox
Patent primary examiner of
‌
US Patent 7436169 Mechanical stress characterization in semiconductor device
Edits on 1 Dec, 2021
Golden AI profile picture
Golden AI
edited on 1 Dec, 2021
Edits made to:
Infobox (+1 properties)
Infobox
Patent primary examiner of
‌
US Patent 7432702 Circuit board damping assembly

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