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US Patent 10546632 Multi-level self-selecting memory device

Patent 10546632 was granted and assigned to Micron Technology on January, 2020 by the United States Patent and Trademark Office.

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Contents

Is a
Patent
Patent

Patent attributes

Patent Applicant
Micron Technology
Micron Technology
Current Assignee
Micron Technology
Micron Technology
Patent Jurisdiction
United States Patent and Trademark Office
United States Patent and Trademark Office
Patent Number
10546632
Patent Inventor Names
Andrea Redaelli0
Agostino Pirovano0
Fabio Pellizzer0
Innocenzo Tortorelli0
Date of Patent
January 28, 2020
Patent Application Number
15842496
Date Filed
December 14, 2017
Patent Citations
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US Patent 10008665 Doping of selector and storage materials of a memory cell
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US Patent 10381075 Techniques to access a self-selecting memory device
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Patent Citations Received
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US Patent 12073881 Techniques for programming multi-level self-selecting memory cell
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US Patent 11605418 Memory device architecture using multiple physical cells per bit to improve read margin and to alleviate the need for managing demarcation read voltages
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US Patent 11610634 Two multi-level memory cells sensed to determine multiple data values
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US Patent 11295822 Multi-state programming of memory cells
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US Patent 11670367 Two memory cells sensed to determine one data value
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US Patent 11783902 Multi-state programming of memory cells
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US Patent 11984191 Pulse based multi-level cell programming
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US Patent 12020743 Memory device architecture using multiple physical cells per bit to improve read margin and to alleviate the need for managing demarcation read voltages
0
...
Patent Primary Examiner
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Ly D Pham
Patent abstract

Methods, systems, and devices related to a multi-level self-selecting memory device are described. A self-selecting memory cell may store one or more bits of data represented by different threshold voltages of the self-selecting memory cell. A programming pulse may be varied to establish the different threshold voltages by modifying one or more durations during which a fixed level of voltage or fixed level of current is maintained across the self-selecting memory cell. The self-selecting memory cell may include a chalcogenide alloy. A non-uniform distribution of an element in the chalcogenide alloy may determine a particular threshold voltage of the self-selecting memory cell. The shape of the programming pulse may be configured to modify a distribution of the element in the chalcogenide alloy based on a desired logic state of the self-selecting memory cell.

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