US Patent 11404244 High-resolution x-ray spectroscopy surface material analysis

A method of performing x-ray spectroscopy surface material analysis of a region of interest of a sample with an evaluation system that includes a scanning electron microscope (SEM) column and an x-ray detector, the method comprising: identifying an element expected to be within the region of interest; selecting a landing energy for a charged particle beam generated by the SEM column based on the identified element; scanning the region of interest with a charged particle beam set to the selected landing energy; detecting x-rays generated while the region of interest is scanned by the charged particle beam; and generating a two-dimensional image of the scanned region of interest based on the detected x-rays.