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US Patent 11837615 Image sensor with increased gate pattern width

OverviewStructured DataIssuesContributorsActivity
Is a
Patent
Patent
0
Date Filed
May 7, 2021
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Date of Patent
December 5, 2023
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Patent Application Number
17314910
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Patent Citations
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US Patent 9570506 Photoelectric conversion device and manufacturing method of the same
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US Patent 9865736 Semiconductor devices and methods of manufacturing the same
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US Patent 9887211 Semiconductor device and method of manufacturing the same
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US Patent 9893114 Method of producing image pick-up apparatus and image pick-up apparatus
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US Patent 10462405 Solid-state imaging device and manufacturing method therefor
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US Patent 10559685 Vertical field effect transistor with reduced external resistance
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US Patent 10553637 Semiconductor device, manufacturing method thereof, and electronic apparatus
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US Patent 10957724 Single-photon avalanche diode image sensor with photon counting and time-of-flight detection capabilities
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US Patent 7335930 Borderless contact structures
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US Patent 7524751 Method for forming contact hole in semiconductor device
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Patent Inventor Names
Kwansik Cho
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Sung In Kim
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Taeyoung Song
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Patent Jurisdiction
United States Patent and Trademark Office
United States Patent and Trademark Office
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Patent Number
11837615
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Patent Primary Examiner
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Kimberly N Rizkallah
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CPC Code
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H01L 27/1463
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H01L 27/14634
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H01L 27/14636
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H01L 27/1464
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H01L 27/14645
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H01L 27/14689
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H01L 2224/08145
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H01L 27/14603
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H01L 27/14638
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H01L 27/14641
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