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US Patent 9372402 Molecular organometallic resists for EUV
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Patent
Date Filed
September 13, 2013
Date of Patent
June 21, 2016
Patent Application Number
14026761
Patent Citations Received
US Patent 12072626 Organometallic radiation patternable coatings with low defectivity and corresponding methods
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US Patent 11947262 Process environment for inorganic resist patterning
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US Patent 11972948 Adhesion layers for EUV lithography
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US Patent 11988961 Radiation based patterning methods
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US Patent 11789362 Semiconductor resist composition, and method of forming patterns using the composition
US Patent 11789361 Semiconductor resist composition, and method of forming patterns using the composition
US Patent 11886116 Multiple patterning with organometallic photopatternable layers with intermediate freeze steps
0
Patent Jurisdiction
United States Patent and Trademark Office
Patent Number
9372402
Patent Primary Examiner
Leszek Kiliman
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