MEMC Electronic Materials

US Patent 7097718 Single crystal silicon wafer having an epitaxial layer substantially free from grown-in defects

US Patent 7105050 Method for the production of low defect density silicon

US Patent 7125450 Process for preparing single crystal silicon using crucible rotation to control temperature gradient

US Patent 7132091 Single crystal silicon ingot having a high arsenic concentration

US Patent 7135351 Method for controlling of thermal donor formation in high resistivity CZ silicon

US Patent 7182809 Nitrogen-doped silicon substantially free of oxidation induced stacking faults

US Patent 7201800 Process for making silicon wafers with stabilized oxygen precipitate nucleation centers

US Patent 7223304 Controlling melt-solid interface shape of a growing silicon crystal using a variable magnetic field

US Patent 7229693 Low defect density, ideal oxygen precipitating silicon

US Patent 7242037 Process for making non-uniform minority carrier lifetime distribution in high performance silicon power devices

US Patent 7291221 Electromagnetic pumping of liquid silicon in a crystal growing process

US Patent 7291222 Systems and methods for measuring and reducing dust in granular material

US Patent 7323421 Silicon wafer etching process and composition

US Patent 7344594 Melter assembly and method for charging a crystal forming apparatus with molten source material

US Patent 7404856 Nitrogen-doped silicon substantially free of oxidation induced stacking faults

US Patent 7431765 Process for preparing single crystal silicon having improved gate oxide integrity

US Patent 7442253 Process for forming low defect density, ideal oxygen precipitating silicon

US Patent 7462246 Modified susceptor for barrel reactor

US Patent 7465351 Melter assembly and method for charging a crystal forming apparatus with molten source material

US Patent 7485928 Arsenic and phosphorus doped silicon wafer substrates having intrinsic gettering

US Patent 7497907 Partially devitrified crucible

US Patent 7521382 High resistivity silicon structure and a process for the preparation thereof

US Patent 7559825 Method of polishing a semiconductor wafer

US Patent 7566951 Silicon structures with improved resistance to radiation events

US Patent 7573587 Method and device for continuously measuring silicon island elevation

US Patent 7601049 Double side wafer grinder and methods for assessing workpiece nanotopology

US Patent 7611580 Controlling melt-solid interface shape of a growing silicon crystal using a variable magnetic field

US Patent 7662023 Double side wafer grinder and methods for assessing workpiece nanotopology

US Patent 7691199 Melter assembly and method for charging a crystal forming apparatus with molten source material

US Patent 7691351 Method for treatment of a gas stream containing silicon tetrafluoride and hydrogen chloride

US Patent 7696103 Method for purifying silicon carbide coated structures

US Patent 7846006 Dressing a wafer polishing pad

US Patent 7846007 System and method for dressing a wafer polishing pad

US Patent 7878562 Semiconductor wafer carrier blade

US Patent 7879198 Processes for the purification of trichlorosilane and silicon tetrachloride

US Patent 7888685 High purity silicon carbide structures

US Patent 7922817 Method and device for feeding arsenic dopant into a silicon crystal growing apparatus

US Patent 7927185 Method for assessing workpiece nanotopology using a double side wafer grinder

US Patent 7930058 Nanotopography control and optimization using feedback from warp data

US Patent 7938982 Silicon wafer etching compositions

US Patent 7943108 Processes for purification of silicon tetrafluoride