Sang H Nguyen

US Patent 11175237 Inspection machine

US Patent 7142313 Interaxis angle correction method

US Patent 7148973 Position detecting method and apparatus, exposure apparatus and device manufacturing method

US Patent 7154596 Method and apparatus for backlighting and imaging multiple views of isolated features of an object

US Patent 7164471 Electronic imaging apparatus and microscope apparatus using the same

US Patent 7170592 Method of inspecting a sphere without orienting the sphere

US Patent 7170593 Method of reviewing detected defects

US Patent 7173704 Measuring device for immunochromatography test piece and light source device

US Patent 7177025 Measuring specular reflectance of a sample

US Patent 7177033 Image processing type of measuring device, lighting system for the same, lighting system control method, lighting system control program, and a recording medium with the lighting system control program recorded therein

US Patent 7180595 Gas detection method and gas detector device

US Patent 7193731 Optical displacement sensor

US Patent 7212282 Method for characterizing mask defects using image reconstruction from X-ray diffraction patterns

US Patent 7212293 Optical determination of pattern feature parameters using a scalar model having effective optical properties

US Patent 7212294 Method for determination of the level of two or more measurement points, and an arrangement for this purpose

US Patent 7215418 Inspection of transparent substrates for defects

US Patent 7215419 Method and apparatus for position-dependent optical metrology calibration

US Patent 7215430 Integrated system for quickly and accurately imaging and modeling three-dimensional objects

US Patent 7221443 Appearance inspection apparatus and method of image capturing using the same

US Patent 7221445 Methods and apparatus for detecting and quantifying surface characteristics and material conditions using light scattering

US Patent 7221446 Fluid dispenser and lens inspection device

US Patent 7221462 Method and device for optical detection of the position of an object

US Patent 7221847 Optical elements having programmed optical structures

US Patent 7224175 Probe mark reading device and probe mark reading method

US Patent 7224450 Method and apparatus for position-dependent optical metrology calibration

US Patent 7224470 Method and apparatus for measuring surface configuration

US Patent 7224471 Azimuthal scanning of a structure formed on a semiconductor wafer

US Patent 7224473 Strobe light and laser beam detection for laser receiver

US Patent 7224474 Positioning method for biochip

US Patent 7227623 Method and apparatus for standardization of a measuring instrument

US Patent 7227628 Wafer inspection systems and methods for analyzing inspection data

US Patent 7227647 Method for measuring surface properties and co-ordinate measuring device

US Patent 7227648 Method and apparatus for a touch-free examination of objects, particularly regarding the surface character of the same

US Patent 7227649 Surface inspection apparatus

US Patent 7230687 Blood leak detector for extracorporeal treatment system

US Patent 7230711 Envelope functions for modulation spectroscopy

US Patent 7230722 Shadow moire using non-zero talbot distance

US Patent 7230723 High-accuracy pattern shape evaluating method and apparatus

US Patent 7230724 Three-dimensional measuring apparatus for scanning an object and a measurement head of a three-dimensional measuring apparatus and method of using the same

US Patent 7233391 Optical device integrated with well

US Patent 7236218 Locating device for measuring distances between dots of a light guide plate and method for using same

US Patent 7236239 Illumination system and exposure apparatus

US Patent 7236246 Method of measuring a physical function using a composite function which includes the physical function and an arbitrary reference function

US Patent 7236247 Method of measuring a physical function using a composite function which includes the physical function and an arbitrary reference function

US Patent 7236257 Jump takeoff position indicator system

US Patent 7239381 Particle detection method

US Patent 7242467 Method and apparatus for high-resolution defect location and classification

US Patent 7242479 Gas sensors

US Patent 7245378 Measuring laser light transmissivity in a to-be-welded region of a work piece

US Patent 7245386 Object measuring device and associated methods

US Patent 7245387 Three-dimensional measuring instrument

US Patent 7248351 Optimizing light path uniformity in inspection systems

US Patent 7248374 Spherically mounted light source with angle measuring device, tracking system, and method for determining coordinates

US Patent 7251024 Defect inspection method and apparatus therefor

US Patent 7253891 Method and apparatus for simultaneous 2-D and topographical inspection

US Patent 7253908 Non-destructive inspection using laser profiling and associated method

US Patent 7256899 Wireless methods and systems for three-dimensional non-contact shape sensing

US Patent 7258953 Multi-layer registration and dimensional test mark for scatterometrical measurement

US Patent 7259850 Approach to improve ellipsometer modeling accuracy for solving material optical constants N & K

US Patent 7259873 Method for measuring the dimension of a non-circular cross-section of an elongated article in particular of a flat cable or a sector cable

US Patent 7262418 Method and apparatus for multiple charged particle beams

US Patent 7265832 Optical flow meter for measuring gases and liquids in pipelines

US Patent 7265837 Sensitive polarization monitoring and controlling

US Patent 7267546 Light meter for detecting and measuring intensity of two or more wavelengths of light

US Patent 7268315 Monitoring slot formation in substrates

US Patent 7268874 Method of measuring properties of dispersed particles in a container and corresponding apparatus

US Patent 7268881 Light scattering detector

US Patent 7268893 Optical projection system

US Patent 7271891 Apparatus and methods for providing selective defect sensitivity

US Patent 7271898 Method and system for remote sensing of optical instruments and analysis thereof

US Patent 7271904 Seal dispenser for fabricating liquid crystal display panel and method for detecting discontinuous portion of seal pattern using the same

US Patent 7272916 Method and device for inspecting and monitoring the seal integrity of sterile packages

US Patent 7274443 Corrosion monitoring system, optical corrosion probe, and methods of use

US Patent 7274447 Material porosity pressure impulse testing system

US Patent 7277187 Overhead dimensioning system and method

US Patent 7280199 System for detecting anomalies and/or features of a surface

US Patent 7280232 Method and apparatus for measuring wafer thickness

US Patent 7283227 Oblique transmission illumination inspection system and method for inspecting a glass sheet

US Patent 7283235 Optical device and inspection module

US Patent 7283256 Method and apparatus for measuring wafer thickness

US Patent 7286214 Method and program product for determining a radiance field in an optical environment

US Patent 7286220 Test piece for optoelectronic image analysis systems

US Patent 7286246 Method and apparatus for non-contact three-dimensional surface measurement

US Patent 7286755 Method and apparatus for testing an optical component

US Patent 7289199 Electronic imaging apparatus and microscope apparatus using the same

US Patent 7292327 Circuit-pattern inspection apparatus

US Patent 7292330 Wafer inspection with a customized reflective optical channel component

US Patent 7295301 Dual stage defect region identification and defect detection method and apparatus

US Patent 7295318 Apparatus and method for evaluating the interior quality of fruits and vegetables

US Patent 7295329 Position detection system

US Patent 7299147 Systems for managing production information

US Patent 7301604 Method to predict and identify defocus wafers

US Patent 7301619 Evaluating a multi-layered structure for voids

US Patent 7301623 Transferring, buffering and measuring a substrate in a metrology system

US Patent 7304714 Use of optical sensor in motion picture film projector lamphouse to detect state of projector to prevent interruption of feature film presentation by kodak digital cinema system designed for cinema advertising

US Patent 7304732 Microelectromechanical resonant photoacoustic cell

US Patent 7307704 Light delivery control system and method

US Patent 7307707 Method and system for measuring the imaging quality of an optical imaging system

US Patent 7307713 Apparatus and method for inspection of a wafer

US Patent 7307714 Apparatus and process for detecting inclusions

US Patent 7307730 Apparatus and method for measuring temperature dependent properties of liquid

US Patent 7310140 Method and apparatus for inspecting a wafer surface

US Patent 7310149 Systems and methods for measurement of properties of small volume liquid samples

US Patent 7310155 Extraction of tool independent line-edge-roughness (LER) measurements using in-line programmed LER and reliability structures

US Patent 7312865 Method for in situ monitoring of chamber peeling

US Patent 7317521 Particle detection method

US Patent 7319524 Air purged optical densitometer

US Patent 7319530 System and method for measuring germanium concentration for manufacturing control of BiCMOS films

US Patent 7321433 Method and apparatus for optically measuring the topography of nearly planar periodic structures

US Patent 7324218 Method and device for distance measurement

US Patent 7328889 Measuring unit, partition member, mold for molding the partition member, and production method for the partition member

US Patent 7330250 Nondestructive evaluation of subsurface damage in optical elements

US Patent 7330259 Optical measurements of patterned articles

US Patent 7333192 Apparatus and method for inspecting defects

US Patent 7333210 Method and apparatus for feedback control of tunable laser wavelength

US Patent 7333218 Systems and methods for determining the location and angular orientation of a hole with an obstructed opening residing on a surface of an article

US Patent 7336346 Distance measuring device and method thereof

US Patent 7336373 Surface shape measuring apparatus and surface shape measuring method

US Patent 7336375 Wireless methods and systems for three-dimensional non-contact shape sensing

US Patent 7336377 Foot measuring device

US Patent 7339660 Illumination device for product examination

US Patent 7339661 Dark field inspection system

US Patent 7339662 Exposure apparatus and a device manufacturing method using the same

US Patent 7342668 High speed multiple line three-dimensional digitalization

US Patent 7345806 Method and apparatus for characterizing microelectromechanical devices on wafers

US Patent 7349078 Characterization of lenses

US Patent 7352477 Two dimensional position detecting device

US Patent 7353690 Atmospheric refractivity profiling apparatus and methods

US Patent 7355694 Method and apparatus for measuring a particle diameter of foam on a malt alcoholic drink

US Patent 7355696 Method and apparatus for sorting cells

US Patent 7359043 Pattern inspecting method and pattern inspecting apparatus

US Patent 11181828 Method of determining a value of a parameter of interest of a patterning process, device manufacturing method

US Patent 7369225 Device and method for inspecting surfaces in the interior of holes

US Patent 7369236 Defect detection through image comparison using relative measures

US Patent 7372556 Apparatus and methods for inspecting a composite structure for inconsistencies

US Patent 7372583 Controlling a fabrication tool using support vector machine

US Patent 7375807 System for the preparation of multiple solid state samples, in particular for spectroscopic and microscopic analysis

US Patent 7378636 Method of evaluating non-linear optical crystal and device therefor and wavelength conversion method and device therefor

US Patent 7388679 Pattern light irradiation device, three dimensional shape measuring device, and method pattern light irradiation

US Patent 7405835 High-accuracy pattern shape evaluating method and apparatus

US Patent 11186044 Optical sensing techniques for calibration of an additive fabrication device and related systems and methods

US Patent 11187575 High density optical measurement systems with minimal number of light sources

US Patent 11187616 Optical power detector and reader

US Patent 11187643 Laser sensor module for particle density detection