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Teradyne

Teradyne

Teradyne is the world's largest supplier of Automatic Test Equipment and is a leading supplier of interconnection systems.

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Edits on 14 Feb, 2024
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Golden Au
edited on 14 Feb, 2024
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Industry
Robotics
Robotics
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Edits on 23 Jan, 2024
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Golden Au
edited on 23 Jan, 2024
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Industry
Automation
Automation
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Edits on 19 Dec, 2023
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Golden AI
approved a suggestion from Golden's AI on 19 Dec, 2023
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Legal Entity Identifier
C3X4YJ278QNZHRJULN750
"NL fact extraction"
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Golden Au
edited on 19 Dec, 2023
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Founded Date
January 1, 1960
B2X
B2B
B2B
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Founded Date
1960
0
Edits on 24 May, 2023
"Clean up website values by canonicalizing and removing duplicates"
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Golden AI
edited on 24 May, 2023
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Official Website
http://www.teradyne.com
Edits on 27 Oct, 2022
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Biz Bezviz
edited on 27 Oct, 2022
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Contact Page URL
https://www.teradyne.com/company/contact-teradyne/
Edits on 26 Jul, 2022
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Alexander Baychikov
edited on 26 Jul, 2022
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Legal classification
Public company
Public company
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Edits on 23 Jul, 2022
"clean up phone number value"
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Golden AI
edited on 23 Jul, 2022
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Phone number
+1 800-837-2396 978 370-2700
Phone number
+18008372396
Edits on 1 Jun, 2022
"update inverses"
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Golden AI
edited on 1 Jun, 2022
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Competitors
Sensata Technologies
Sensata Technologies
Edits on 31 May, 2022
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Anatoliy Korchagin
edited on 31 May, 2022
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Infobox (+12 properties)
Infobox
Date incorporated
1960
Board of Directors
Sanjay Mehta
Sanjay Mehta
‌
Mark Jagiela
CEO
‌
Mark Jagiela
CFO
Sanjay Mehta
Sanjay Mehta
Legal name
Terradyne Den, Inc.
Crunchbase
https://www.crunchbase.com/organization/terradyne
Email address
inquiries@terradyne.com
Key people
Sanjay Mehta
Sanjay Mehta
‌
Mark Jagiela
‌
John Wood
Pitchbook URL
https://pitchbook.com/profiles/company/25328-62#overview
Edits on 21 May, 2022
"update inverses"
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Golden AI
edited on 21 May, 2022
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Competitors
inTEST Corporation
inTEST Corporation
Edits on 17 May, 2022
"prospector:1525:749871"
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Katrina-Kay Pettitt
edited on 17 May, 2022
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Is a
Organization
Organization
Edits on 14 Apr, 2022
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Kseniya Shikalova
edited on 14 Apr, 2022
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Article (+247 characters)
Article

Teradyne companies deliver manufacturing automation across industries, applications and the world. Together, we solve complex test and automation challenges and enable businesses to achieve higher production volumes, higher quality and higher ROI.

Infobox
YouTube channel
http://www.youtube.com/teradyneinc
Edits on 8 Apr, 2022
"Patent autocalculation"
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Golden AI
edited on 8 Apr, 2022
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Patents assigned (count)
310
Edits on 25 Feb, 2022
"update inverses"
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Golden AI
edited on 25 Feb, 2022
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Invested in
MachineMetrics
MachineMetrics
Edits on 14 Dec, 2021
"Remove inverse infobox"
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Golden AI
edited on 14 Dec, 2021
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Infobox (-151 properties)
Infobox
Patents
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US Patent 11103994 System and method for natural tasking of one or more robots
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US Patent 11119155 Voltage driver circuit
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US Patent 11092654 Measuring a leakage characteristic of a signal path
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US Patent 11156692 Calibrating differential measurement circuitry
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US Patent 11159248 Optical receiving device
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US Patent 11162980 Coaxial via arrangement in probe card for automated test equipment
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US Patent 11169203 Determining a configuration of a test system
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US Patent 7088092 Silicon-on-insulator channel architecture for automatic test equipment
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US Patent 7102375 Pin electronics with high voltage functionality
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US Patent 7117410 Distributed failure analysis memory for automatic test equipment
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US Patent 7123075 Current mirror compensation using channel length modulation
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US Patent 7126519 Low-spur low-distortion digital-to-analog converter
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US Patent 7127506 PC configuration fault analysis
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US Patent 7135854 Rear-mounted gimbal for supporting test head
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US Patent 7135881 Method and system for producing signals to test semiconductor devices
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US Patent 7143323 High speed capture and averaging of serial data by asynchronous periodic sampling
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US Patent 7146584 Scan diagnosis system and method
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US Patent 7151367 Method of measuring duty cycle
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US Patent 7161392 Comparator feedback peak detector
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US Patent 7171587 Automatic test system with easily modified software
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US Patent 7174279 Test system with differential signal measurement
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US Patent 7180321 Tester interface module
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US Patent 7183953 Calibrating automatic test equipment containing interleaved analog-to-digital converters
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US Patent 7187549 Heat exchange apparatus with parallel flow
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US Patent 7208937 Hybrid AC/DC-coupled channel for testing
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US Patent 7216273 Method for testing non-deterministic device data
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US Patent 7221298 Calibration circuitry
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US Patent 7222041 High-speed digital multiplexer
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US Patent 7222261 Automatic test equipment for design-for-test (DFT) and built-in-self-test circuitry
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US Patent 7224746 Pre-compensation for digital bit streams
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US Patent 7230553 Parallel source/capture architecture
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US Patent 7239259 Digitizer with enhanced accuracy
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US Patent 7253607 Site-aware objects
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US Patent 7254508 Site loops
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US Patent 7256600 Method and system for testing semiconductor devices
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US Patent 7263174 Predicting performance of telephone lines for data services
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US Patent 7271610 Using a parametric measurement unit to sense a voltage at a device under test
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US Patent 7285851 Liquid immersion cooled multichip module
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US Patent 7295642 Jitter compensation and generation in testing communication devices
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US Patent 7305466 Network fault isolation
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US Patent 7319936 Instrument with interface for synchronization in automatic test equipment
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US Patent 7323898 Pin electronics driver
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US Patent 7327816 High resolution synthesizer with improved signal purity
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US Patent 7327870 Method for inspecting a region of interest
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US Patent 7334041 Vehicle communications interface
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US Patent 7336748 DDS circuit with arbitrary frequency control clock
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US Patent 7337377 Enhanced loopback testing of serial devices
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US Patent 7343279 Universal approach for simulating, emulating, and testing a variety of serial bus types
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US Patent 7343387 Algorithm for configuring clocking system
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US Patent 7343558 Configurable automatic-test-equipment system
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US Patent 7345549 Phase locking on aliased frequencies
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US Patent 7349818 Determining frequency components of jitter
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US Patent 7352306 Analog-to-digital converter with non-linearity compensation
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US Patent 7375542 Automated test equipment with DIB mounted three dimensional tester electronics bricks
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US Patent 7378854 Dual sine-wave time stamp method and apparatus
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US Patent 7379395 Precise time measurement apparatus and method
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US Patent 7389461 Data capture in automatic test equipment
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US Patent 7395479 Over-voltage test for automatic test equipment
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US Patent 7403030 Using parametric measurement units as a source of power for a device under test
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US Patent 7408337 Compensating for loss in a transmission path
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US Patent 7420375 Method for digital bus testing
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US Patent 7428218 Flexible approach for representing different bus protocols
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US Patent 7429939 Signal analysis using dual converters and cross spectrum
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US Patent 7432751 High performance signal generation
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US Patent 7454681 Automatic test system with synchronized instruments
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US Patent 7459642 RIM slot filler module and method of manufacturing the same
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US Patent 7480581 Calibrating a testing device
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US Patent 7487422 Delayed processing of site-aware objects
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US Patent 7489125 Calibrating a tester using ESD protection circuitry
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US Patent 7489146 V/I source and test system incorporating the same
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US Patent 7492146 Impedance controlled via structure
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US Patent 7504822 Automatic testing equipment instrument card and probe cabling system and apparatus
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US Patent 7507099 Floating interface linkage
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US Patent 7508228 Method and system for monitoring test signals for semiconductor devices
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US Patent 7509226 Apparatus and method for testing non-deterministic device data
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US Patent 7509227 High-speed digital multiplexer
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US Patent 11187745 Stabilizing a voltage at a device under test
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US Patent 7519490 Determining frequency components of jitter
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US Patent 7519878 Obtaining test data for a device
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US Patent 7523007 Calibration device
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US Patent 7523238 Device and method to reduce simultaneous switching noise
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US Patent 7528623 Distributing data among test boards to determine test parameters
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US Patent 7535263 Comparator feedback peak detector
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US Patent 7536621 Quantized data-dependent jitter injection using discrete samples
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US Patent 7538539 Current meter with reduced range switching and load transients
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US Patent 7538708 Efficient, selective error reduction for parallel, time-interleaved analog-to-digital converter
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US Patent 7541819 Modularized device interface with grounding insert between two strips
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US Patent 7541958 Error reduction for parallel, time-interleaved analog-to-digital converter
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US Patent 7545224 Cost effective low noise single loop synthesizer
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US Patent 7554323 Direct facility water test head cooling architecture
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US Patent 7560947 Pin electronics driver
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US Patent 7573957 Strobe technique for recovering a clock in a digital signal
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US Patent 7574632 Strobe technique for time stamping a digital signal
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US Patent 7584029 Telematics-based vehicle data acquisition architecture
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US Patent 7584068 Electrically stimulated fingerprint sensor test method
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US Patent 7589548 Design-for-test micro probe
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US Patent 7590170 Method and apparatus for measuring jitter
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US Patent 7593497 Method and apparatus for adjustment of synchronous clock signals
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US Patent 7595746 Interpolation digital-to-analog converter
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US Patent 7598725 Alignment receptacle of a sensor adapted to interact with a pin to generate position data along at least two transverse axes for docking a test head
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US Patent 7606675 Jitter frequency determining system
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US Patent 7626175 Method of and system for obtaining linear data for object scanned using non-collimated, poly-energetic X-rays
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US Patent 7636642 Direct jitter analysis of binary sampled data
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US Patent 7642802 Method and apparatus for cooling non-native instrument in automatic test equipment
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US Patent 7643545 Calibrating automatic test equipment to account for magnitude and phase offsets
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US Patent 7649375 Connector-to-pad printed circuit board translator and method of fabrication
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US Patent 7663389 Automated test equipment with DIB mounted three dimensional tester electronics bricks
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US Patent 7668235 Jitter measurement algorithm using locally in-order strobes
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US Patent 7673199 Multi-stream interface for parallel test processing
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US Patent 7685885 Manipulator constant force spring counterbalance
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US Patent 7701232 Rotational positioner and methods for semiconductor wafer test systems
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US Patent 7719446 Method and apparatus for computing interpolation factors in sample rate conversion systems
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US Patent 7733081 Automated test equipment interface
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US Patent 7769559 Instrument with interface for synchronization in automatic test equipment
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US Patent 7778031 Test slot cooling system for a storage device testing system
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US Patent 7786718 Time measurement of periodic signals
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US Patent 7788564 Adjustable test pattern results latency
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US Patent 7804349 Timing signal generator providing synchronized timing signals at non-integer clock multiples adjustable by more than one period
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US Patent 7809999 Ternary search process
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US Patent 7815466 Coaxial cable to printed circuit board interface module
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US Patent 7816932 Test system with high frequency interposer
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US Patent 7819581 Method of and system for calibration of inspection systems producing X-ray images
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US Patent 7847570 Laser targeting mechanism
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US Patent 7848106 Temperature control within disk drive testing systems
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US Patent 7856578 Strobe technique for test of digital signal timing
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US Patent 7863888 Efficient switching architecture with reduced stub lengths
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US Patent 7881397 Wireless communication system
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US Patent 7885361 Method and apparatus for 0/180 degree phase detector
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US Patent 7888947 Calibrating automatic test equipment
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US Patent 7890207 Transferring storage devices within storage device testing systems
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US Patent 7890562 Sine wave generator with dual port look-up table
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US Patent 7890822 Tester input/output sharing
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US Patent 7904211 Dependent temperature control within disk drive testing systems
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US Patent 7908029 Processing storage devices
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US Patent 7908531 Networked test system
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US Patent 7911778 Vibration isolation within disk drive testing systems
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US Patent 7920380 Test slot cooling system for a storage device testing system
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US Patent 7925074 Adaptive background propagation method and device therefor
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US Patent 7929303 Storage device testing system cooling
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US Patent 7932734 Individually heating storage devices in a testing system
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US Patent 7933942 Low cost, high purity sign wave generator
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US Patent 7940529 Storage device temperature sensing
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US Patent 7945424 Disk drive emulator and method of use thereof
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US Patent 7946853 Compliant electro-mechanical device
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US Patent 7957461 Calibrating automatic test equipment
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US Patent 7977583 Shielded cable interface module and method of fabrication
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US Patent 7987018 Transferring disk drives within disk drive testing systems
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US Patent 7987063 Fast, low power formatter for automatic test system
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US Patent 7991046 Calibrating jitter
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US Patent 7995349 Storage device temperature sensing
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US Patent 7996174 Disk drive testing
"Created using industry superset tool"
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Golden AI
edited on 14 Dec, 2021
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Infobox (+1 properties)
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Industry
Radio spectrum
Radio spectrum
Edits on 11 Dec, 2021
"prospector:929:316206"
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Keeri Tramm
edited on 11 Dec, 2021
Edits made to:
Infobox (+1 properties)
Infobox
Industry
Millimeter-wave
Millimeter-wave
Edits on 9 Dec, 2021
"prospector:929:316206"
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Keeri Tramm
edited on 9 Dec, 2021
Edits made to:
Infobox (+3 properties)
Description (+122 characters)
Topic thumbnail

Teradyne

Teradyne is the world's largest supplier of Automatic Test Equipment and is a leading supplier of interconnection systems.

Infobox
Industry
Extremely high frequency
Extremely high frequency
Phone number
+1 800-837-2396 978 370-2700
Website
http://teradyne.com
Edits on 8 Dec, 2021
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Golden AI
edited on 8 Dec, 2021
Edits made to:
Infobox (+1 properties)
Infobox
Patents
‌
US Patent 7996174 Disk drive testing

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