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Vinh Nguyen

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Edits on 14 Dec, 2021
"Remove inverse infobox"
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Golden AI
edited on 14 Dec, 2021
Edits made to:
Infobox (-65 properties)
Infobox
Patent primary examiner of
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US Patent 7088118 Modularized probe card for high frequency probing
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US Patent 7088120 Method and apparatus for measuring and evaluating local electrical characteristics of a sample having a nano-scale structure
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US Patent 7088121 Non-contact method and apparatus for on-line interconnect characterization in VLSI circuits
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US Patent 7091730 Dual probe assembly for a printed circuit board test apparatus
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US Patent 7091733 Reliability evaluation test apparatus, reliability evaluation test system, contactor, and reliability evaluation test method
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US Patent 7095243 AC generator exciter rotor slip-ring test apparatus
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US Patent 7098652 Analytical circuit for an inductive sensor
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US Patent 7098681 Semiconductor device, method for testing the same and IC card
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US Patent 7098682 Testing method and tester for semiconductor integrated circuit device comprising high-speed input/output element
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US Patent 7102368 Method of applying the analysis of scrub mark morphology and location to the evaluation and correction of semiconductor testing, analysis, and manufacture
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US Patent 7102370 Compliant micro-browser for a hand held probe
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US Patent 7102372 Apparatus and method for testing conductive bumps
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US Patent 7102375 Pin electronics with high voltage functionality
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US Patent 7105366 Method for in-line testing of flip-chip semiconductor assemblies
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US Patent 7106046 Current measuring method and current measuring device
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US Patent 7106080 Probe card and contactor of the same
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US Patent 7109735 Method for measuring gate dielectric properties for three dimensional transistors
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US Patent 7109739 Wafer-level opto-electronic testing apparatus and method
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US Patent 7109742 Current sensing in a two-phase motor
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US Patent 7119531 Pusher in an autohandler for pressing a semiconductor device
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US Patent 7119560 Probe apparatus
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US Patent 7119562 Contact-type film probe
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US Patent 7119567 System and method for testing one or more dies on a semiconductor wafer
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US Patent 7126366 Semiconductor test apparatus
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US Patent 7126367 Test apparatus, test method, electronic device, and electronic device manufacturing method
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US Patent 7129726 Testing device and testing method of a semiconductor device
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US Patent 7129736 Element substrate
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US Patent 7135876 Electrical feedback detection system for multi-point probes
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US Patent 7135877 Temperature and condensation control system for functional tester
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US Patent 7141999 Semiconductor probe with resistive tip and method of fabricating the same, and information recording apparatus, information reproducing apparatus, and information measuring apparatus having the semiconductor probe
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US Patent 7145321 Current sensor with magnetic toroid
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US Patent 7145356 Circuits for transistor testing
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US Patent 7148715 Systems and methods for testing microelectronic imagers and microfeature devices
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US Patent 7148719 Method for analyzing organic light-emitting device
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US Patent 7151386 Apparatus for testing integrated circuit chips
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US Patent 7161347 Test head for semiconductor integrated circuit tester
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US Patent 7161368 Semiconductor component with internal heating
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US Patent 7170275 Method and apparatus for determining the temperature of a junction using voltage responses of the junction and a correction factor
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US Patent 7170308 On-chip voltage regulator using feedback on process/product parameters
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US Patent 7170311 Testing method for LCD panels
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US Patent 7187187 Signal acquisition probing system using a micro-cavity laser
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US Patent 7187192 Semiconductor test device having clock recovery circuit
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US Patent 7190182 Test probe for finger tester and corresponding finger tester
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US Patent 7193426 Test system and test structure for testing an integrated circuit and an integrated circuit having a test structure
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US Patent 7196507 Apparatus for testing substrates
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US Patent 7196536 Method and apparatus for non-contact electrical probe
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US Patent 7199573 Electronic circuit with test unit
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US Patent 7199596 Manual testing instrument
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US Patent 7202685 Embedded probe-enabling socket with integral probe structures
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US Patent 7202691 Non-contact method for acquiring charge-voltage data on miniature test areas of semiconductor product wafers
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US Patent 7206549 System and method for testing wireless devices
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US Patent 7224158 Circuit arrangement and a method for compensating changes of a transfer factor of a magnetic field sensor arrangement
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US Patent 7253601 Current sensor having hall element
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US Patent 7285966 Probe and method of making same
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US Patent 7288928 Solenoidal Hall effects current sensor
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US Patent 7292057 Probe station thermal chuck with shielding for capacitive current
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US Patent 7295031 Method for non-contact testing of marginal integrated circuit connections
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US Patent 7298157 Device for generating internal voltages in burn-in test mode
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US Patent 7298161 Circuitry and methodology to establish correlation between gate dielectric test site reliability and product gate reliability
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US Patent 7301357 Inspection method and inspection equipment
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US Patent 7307434 Operation voltage supply apparatus and operation voltage supply method for semiconductor device
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US Patent 7323897 Mock wafer, system calibrated using mock wafer, and method for calibrating automated test equipment
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US Patent 7348786 Probe module for testing chips with electrical and optical input/output interconnects, methods of use, and methods of fabrication
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US Patent 8004232 Method of battery charging and power control in conjunction with maximum power point tracking
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US Patent 8004274 Inductive position sensor
Edits on 8 Dec, 2021
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edited on 8 Dec, 2021
Edits made to:
Infobox (+1 properties)
Infobox
Patent primary examiner of
‌
US Patent 8004274 Inductive position sensor
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edited on 8 Dec, 2021
Edits on 24 Nov, 2021
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edited on 24 Nov, 2021
Edits on 23 Nov, 2021
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edited on 23 Nov, 2021
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Golden AI
edited on 23 Nov, 2021
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Golden AI
edited on 23 Nov, 2021
Edits made to:
Infobox (+1 properties)
Infobox
Patent primary examiner of
‌
US Patent 7301357 Inspection method and inspection equipment
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Golden AI
edited on 23 Nov, 2021
Golden AI profile picture
Golden AI
edited on 23 Nov, 2021
Edits made to:
Infobox (+1 properties)
Infobox
Patent primary examiner of
‌
US Patent 7298157 Device for generating internal voltages in burn-in test mode
Golden AI profile picture
Golden AI
edited on 23 Nov, 2021
Edits made to:
Infobox (+1 properties)
Infobox
Patent primary examiner of
‌
US Patent 7295031 Method for non-contact testing of marginal integrated circuit connections
Golden AI profile picture
Golden AI
edited on 23 Nov, 2021
Edits made to:
Infobox (+1 properties)
Infobox
Patent primary examiner of
‌
US Patent 7292057 Probe station thermal chuck with shielding for capacitive current
Golden AI profile picture
Golden AI
edited on 23 Nov, 2021
Edits made to:
Infobox (+1 properties)
Infobox
Patent primary examiner of
‌
US Patent 7288928 Solenoidal Hall effects current sensor
Golden AI profile picture
Golden AI
edited on 23 Nov, 2021
Edits made to:
Infobox (+1 properties)
Infobox
Patent primary examiner of
‌
US Patent 7285966 Probe and method of making same
Golden AI profile picture
Golden AI
edited on 22 Nov, 2021
Edits made to:
Infobox (+1 properties)
Infobox
Patent primary examiner of
‌
US Patent 7253601 Current sensor having hall element
Golden AI profile picture
Golden AI
edited on 22 Nov, 2021
Golden AI profile picture
Golden AI
edited on 22 Nov, 2021
Edits made to:
Infobox (+1 properties)
Infobox
Patent primary examiner of
‌
US Patent 7206549 System and method for testing wireless devices
Golden AI profile picture
Golden AI
edited on 22 Nov, 2021
Golden AI profile picture
Golden AI
edited on 22 Nov, 2021
Edits made to:
Infobox (+1 properties)
Infobox
Patent primary examiner of
‌
US Patent 7202685 Embedded probe-enabling socket with integral probe structures
Golden AI profile picture
Golden AI
edited on 22 Nov, 2021
Edits made to:
Infobox (+1 properties)
Infobox
Patent primary examiner of
‌
US Patent 7199596 Manual testing instrument
Golden AI profile picture
Golden AI
edited on 22 Nov, 2021
Edits made to:
Infobox (+1 properties)
Infobox
Patent primary examiner of
‌
US Patent 7199573 Electronic circuit with test unit

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