Roy M Punnoose

US Patent 11169089 Surface plasmon resonance measurement method for measuring amount of substance in a specimen including whole blood

US Patent 11169311 Polarization state generation with a metasurface

US Patent 11175220 Surface defect measuring apparatus and method by microscopic scattering polarization imaging

US Patent 11175221 Instantaneous ellipsometer or scatterometer and associated measuring method

US Patent 7193729 Instrument cluster with laser beam illumination

US Patent 7215431 Systems and methods for immersion metrology

US Patent 7221455 Integrated, fluorescence-detecting microanalytical system

US Patent 7227638 Calibration system and method for calibration of various types of polarimeters

US Patent 7230725 Method and apparatus for imaging three-dimensional structure

US Patent 7239391 Method of analysis of multiple layer samples

US Patent 7253910 Optical measuring device

US Patent 7256882 Photometer device and method

US Patent 7256892 Measuring instrument and fluorometric method

US Patent 7259872 Light beam switch system for locating the edge of a workpiece

US Patent 7262835 Fluorescence measuring device for gemstones

US Patent 7262836 Apparatus for measuring biological information and method for measuring biological information

US Patent 7262838 Optical detection system for flow cytometry

US Patent 7262847 Optical assembly and method for detection of light transmission

US Patent 7262848 Fiber polarimeter, the use thereof, as well as polarimetric method

US Patent 7262849 Method of polishing thin film formed on substrate

US Patent 7262854 Multi-angle colorimeter

US Patent 7262858 Apparatus and method for accessing and processing reflection image from microwell-plate-based biochip

US Patent 7262862 Measurement of a 3d surface of an object during pressure exposure

US Patent 7262863 Distance measuring device

US Patent 7262865 Method and apparatus for controlling a calibration cycle or a metrology tool

US Patent 7268873 Method for characterising particles in suspension from frequency domain photon migration measurements

US Patent 7268876 General virtual interface algorithm for in-situ spectroscopic ellipsometric data analysis

US Patent 7268878 Fluorescence correlation spectroscopy instrument and method of using the same

US Patent 7268895 Inspection system and a method for inspecting a semiconductor wafer

US Patent 7271882 Shape measuring apparatus, shape measuring method, and aligning method

US Patent 7271885 Plasmon resonance measuring method and apparatus

US Patent 7271900 Magneto-optical imaging method and device

US Patent 7271910 Systems and methods for compensating for temperature induced spectral emission variations in LED based color parameter measuring devices

US Patent 7274449 System for determining stokes parameters

US Patent 7274450 Sample entry purge system in spectrophotometer, ellipsometer, polarimeter and the like systems

US Patent 7277172 Measuring overlay and profile asymmetry using symmetric and anti-symmetric scatterometry signals

US Patent 7277189 Generation of a library of periodic grating diffraction signals

US Patent 7280194 Accurate determination of refractive indices of solid, fluid and liquid materials

US Patent 7280209 Method and apparatus for improved ellipsometric measurement of ultrathin films

US Patent 7283218 Method and apparatus for the determination of characteristic layer parameters at high temperatures

US Patent 7283241 Method and apparatus for a microscope image selector

US Patent 7283305 Solid state image pickup device, method for producing the same, and image pickup system comprising the solid state image pickup device

US Patent 7286226 Method and apparatus for measuring birefringence

US Patent 7286234 Copper foil inspection device copper foil inspection method defect inspection device and defeat inspection method

US Patent 7289198 Process compensation for step and scan lithography

US Patent 7289217 Fluorescent detector with automatic changing filters

US Patent 7292321 Contact detection sensor and contact detection method

US Patent 7292338 Particle detection apparatus and particle detection method used therefor

US Patent 7292353 Method and apparatus for measuring the position of ferrule of a laser module

US Patent 7295308 Air sampling method and sensor system for spectroscopic detection and identification of chemical and biological contaminants

US Patent 7295312 Rapid 4-Stokes parameter determination via Stokes filter wheel

US Patent 7295316 Fluorescent detector with automatic changing filters

US Patent 7295317 Device for inspecting filled and closed receptacles

US Patent 7298462 Method for mobile on and off-line monitoring of colored and high-gloss automobile component surfaces

US Patent 7298496 Apparatus and methods for overlay, alignment mark, and critical dimension metrologies based on optical interferometry

US Patent 7298499 Method and system for characterizing structural damage from observing surface distortions

US Patent 7298500 Position sensor

US Patent 7301616 Method and apparatus for object alignment

US Patent 7301630 Light scattering analysis and measurement

US Patent 7301633 High-throughput chiral detector and methods for using same

US Patent 7301648 Self-referenced tracking

US Patent 7304728 Test device and method for laser alignment calibration

US Patent 7304736 Method and apparatus for measuring polarization

US Patent 7304742 Flow-through aerosol photoacoustic systems and methods

US Patent 7307721 Particle imaging system with a varying flow rate

US Patent 7307726 Device for ellipsometric two-dimensional display of a sample, display method and ellipsometric measurement method with spatial resolution

US Patent 7307729 Electro-optically inspecting and determining internal properties and characteristics of a longitudinally moving rod of material

US Patent 7307737 Three-dimensional (3D) measuring with multiple reference frames

US Patent 7307740 Method for measurement of three-dimensional objects by single-view backlit shadowgraphy

US Patent 7310133 Finger identification apparatus

US Patent 7310145 Apparatus and method for determining optical retardation and birefringence

US Patent 7312861 Method and apparatus for measuring the angular orientation between two surfaces

US Patent 7312869 Out-of-plane birefringence measurement

US Patent 7312874 Apparatus and a method for determining the color stimulus specification of translucent objects

US Patent 7312880 Wafer edge structure measurement method

US Patent 7312881 Parametric profiling using optical spectroscopic systems to adjust processing parameter

US Patent 7315360 Surface coordinate system

US Patent 7315371 Multi-channel spectrum analyzer

US Patent 7315373 Wafer positioning method and device, wafer process system, and wafer seat rotation axis positioning method for wafer positioning device

US Patent 7315375 Reagents for arsenic meter

US Patent 7319514 Optical inclination sensor

US Patent 7324188 Characterization of color and clarity enhancement agents in gems

US Patent 7324190 System for visualization of optical marking on an ophthalmic lens, stamp-marking device and method for orientation of lenses using such a system

US Patent 7324217 Device and method for measuring components

US Patent 7327443 Stroboscopic LED light source for blood processing apparatus

US Patent 7327445 Enhanced surface plasmon resonance sensor using Goos-Hänchen effect

US Patent 7327446 Self-compensating laser tracker

US Patent 7327455 Process monitoring system, process monitoring method, and method for manufacturing semiconductor device

US Patent 7327456 Spectrophotometer, ellipsometer, polarimeter and the like systems

US Patent 7327459 Fluorescence detector for detecting microfluid

US Patent 7327474 Method and apparatus for measuring displacement of an object

US Patent 7327476 Thin films measurement method and system

US Patent 7330246 Tilt meter based on the field transmission through a resonator

US Patent 7330247 Apparatus and method for connecting optical waveguides

US Patent 7330260 Method for measuring ion-implanted semiconductors with improved repeatability

US Patent 7333188 Method and apparatus for real-time measurement of trace metal concentration in chemical mechanical polishing (CMP) slurry

US Patent 7333191 Scanning probe microscope and measurement method using the same

US Patent 7333193 Analysis apparatus irradiating detection light and reading state of analysis object

US Patent 7333202 Yarn sensor

US Patent 7333217 System and method for detecting and correcting position deviations of an object having a curved surface

US Patent 7333219 Handheld metrology imaging system and method

US Patent 7336358 Method and apparatus for determining particle size and composition of mixtures

US Patent 7336360 Imaging polarimetry

US Patent 7336362 Arsenic meter

US Patent 7339670 Wavelength normalized depolarization ratio lidar

US Patent 7339672 Solid-state image pickup device and signal reading method therefor

US Patent 7339684 Proximity detector

US Patent 7339685 Method and apparatus for electronically generating an outline indicating the size of an energy zone imaged onto the IR detector of a radiometer

US Patent 7342660 Detection system and method for aerosol delivery

US Patent 7342669 Three-dimensional shape measuring method and its device

US Patent 7345746 Method of and apparatus for in-situ monitoring of crystallization state

US Patent 7345761 Film measurement

US Patent 7345762 Control of beam spot size in ellipsometer and the like systems

US Patent 7345763 Method for operating a color measurement system

US Patent 7345772 Optical triangulation device and method of measuring a variable of a web using the device

US Patent 7349079 Methods for measurement or analysis of a nitrogen concentration of a specimen

US Patent 7349080 Label-independent detection of unpurified analytes

US Patent 7349084 Particle diameter measuring apparatus

US Patent 7349087 Method for determining stokes parameters

US Patent 7349088 Process monitoring system, process monitoring method, and method for manufacturing semiconductor device

US Patent 7349092 System for reducing stress induced effects during determination of fluid optical constants

US Patent 7352452 Method and apparatus for setting optical imaging properties by means of radiation treatment

US Patent 7355683 Systems and methods for evaluating and displaying the dispersion of a diamond or other gemstone

US Patent 7355685 Stroboscopic LED light source for blood processing apparatus

US Patent 7355690 Double inspection of reticle or wafer

US Patent 7355727 Method and system for checking the position of a mechanical part with a light beam

US Patent 7359068 Laser triangulation method for measurement of highly reflective solder balls

US Patent 7362435 Method of determining initial thickness value for sample surface layer, and use of splines for fitting ellipsometric data

US Patent 7362452 Method of adjusting the operating region of a tool component to a pre-determined element

US Patent 11181483 Adaptive diffuse illumination systems and methods

US Patent 7365849 Portable, scanning and analyzing apparatus

US Patent 7365850 Two-dimensional spectroradiometer

US Patent 7365863 System and method for recalculating analysis report of 3D scan data

US Patent 7369218 Analysis disc with analysis object

US Patent 7369231 Flow cytometer for classifying leukocytes and method for determining detection angle range of the same

US Patent 7369232 Stokes parameter measurement device and method

US Patent 7372566 Cytometer

US Patent 7372584 Dual photo-acoustic and resistivity measurement system

US Patent 7375805 Reticle and optical characteristic measuring method

US Patent 7375831 Line width measuring method, substrate processing method, substrate processing apparatus and substrate cooling processing unit

US Patent 7379182 Pointer instrument for automotive meter

US Patent 7382452 Particle counter for foreign particles in a fluid stream

US Patent 7382458 Fiber optic fluid probe

US Patent 7382460 Light sensor, and detecting mechanism and light-measuring mechanism in analyzing device

US Patent 7385694 Tribological debris analysis system

US Patent 7385695 Polarimetry

US Patent 7385696 Birefringence measurement of polymeric films and the like

US Patent 7385697 Sample analysis methodology utilizing electromagnetic radiation

US Patent 7385703 Method of determining the pressure of a gas mixture in a vacuum container by means of absorption spectroscopy

US Patent 7388658 Inclination detection methods and apparatus

US Patent 7388665 Multicolour chromaticity sensor

US Patent 7391515 Automated visual inspection system for the detection of microbial growth in solutions

US Patent 7394539 Method and apparatus for improved ellipsometric measurement of ultrathin films

US Patent 7400400 Method for monitoring particle size

US Patent 7403276 Photomask for measuring lens aberration, method of its manufacture, and method of its use

US Patent 7408642 Registration target design for managing both reticle grid error and wafer overlay

US Patent 7408655 Lithographic apparatus and method for calibrating the same

US Patent 7411663 Apparatus for generating data for determining a property of a gemstone

US Patent 7411677 Driverless ellipsometer and ellipsometry

US Patent 7411679 Optical filter and fluorescence spectroscopy system incorporating the same

US Patent 7414712 Large dynamic range Shack-Hartmann wavefront sensor

US Patent 7414720 Measuring particle size distribution in pharmaceutical aerosols

US Patent 7414725 Method and apparatus for a microscope image selector

US Patent 7420660 Systems and methods for optically sensing characteristics of a blood flow

US Patent 7420680 Method for designing a colorimeter having integral CIE color-matching filters

US Patent 7420681 Gas purge system and methods

US Patent 7420685 Dispersion-free, automatically phase-matched, and broad spectral-band femtosecond autocorrelation technique

US Patent 7423740 Reticle and optical characteristic measuring method

US Patent 7423758 Gloss sensor for a paper machine

US Patent 7423768 Scanning unit for a position measuring system for the optical scanning of a scale and position measuring system utilizing such a scanning unit

US Patent 7426030 Reduced gas flow purging system in reflectometer, ellipsometer, polarimeter and the like systems

US Patent 7428049 Apparatus and method for inspecting film defect

US Patent 7430047 Small container fluid dynamics to produce optimized inspection conditions

US Patent 7430051 Methods for characterizing semiconductor material using optical metrology

US Patent 7433026 Microscope with LED illumination source

US Patent 7436497 Apparatus and method for providing spot lighting for gemstone observation

US Patent 7436525 Three-dimensional shape measuring method, three-dimensional shape measuring apparatus, and focus adjusting method

US Patent 7436527 Systems and methods for immersion metrology

US Patent 7443490 Medium discrimination device, image forming apparatus, and program having simplified mechanism

US Patent 7443517 Measuring instrument and laser beam machine for wafer

US Patent 7446874 Reagents for arsenic meter

US Patent 7446886 Three-dimensional reconstruction of surface profiles

US Patent 7446887 Matching optical metrology tools using hypothetical profiles

US Patent 7446888 Matching optical metrology tools using diffraction signals

US Patent 7450224 Determination of the boundaries between fractions and extraction of selected fractions in a fractionated sample

US Patent 7450248 Three-dimensional measuring method and three-dimensional measuring apparatus

US Patent 7450249 Position sensor

US Patent 7453562 Ellipsometry measurement and analysis

US Patent 7453582 Position detection system

US Patent 7456962 Conical refraction polarimeter

US Patent 7460217 Device for determining a refractive index in a large number of points of a physical environment

US Patent 7466401 Self-compensating laser tracker

US Patent 7466412 Method of detecting displacement of exposure position marks

US Patent 7468787 Finger identification apparatus

US Patent 7471380 Rubbing angle-measuring equipment, and manufacturing methods of liquid crystal display device and optical film

US Patent 7471384 Via hole depth detector

US Patent 7474390 Test strip with permutative grey scale calibration pattern

US Patent 7474391 Method for determining a test strip calibration code using a calibration strip

US Patent 7474414 System and method of guiding real-time inspection using 3D scanners

US Patent 7477375 Optical reference standard

US Patent 7477376 Self-calibrating optical reflectance probe system

US Patent 7477381 Optical system and method for optically analyzing light from a sample

US Patent 7477385 Method of determining physical properties of an optical layer or layer system

US Patent 7477396 Methods and systems for determining overlay error based on target image symmetry

US Patent 7477397 Self-calibrating optical reflectance probe system

US Patent 7477401 Trench measurement system employing a chromatic confocal height sensor and a microscope

US Patent 7477402 Method and apparatus for imaging three-dimensional structure

US Patent 7477404 Method for analyzing a sample on a test element and analysis system for same

US Patent 7477405 Method and system for measuring patterned structures

US Patent 7477406 Photomask evaluation method and manufacturing method of semiconductor device

US Patent 7480032 Device and method for in vitro determination of analyte concentrations within body fluids

US Patent 7480035 Glare-directed imaging

US Patent 7480052 Opaque cloud detection

US Patent 7483138 Device for analysis or absorption measurement on a small amount of liquid

US Patent 7483153 Power-saving control method in laser measuring system and laser measuring system

US Patent 7483154 Position detecting device, liquid ejecting apparatus and method of cleaning smear of scale

US Patent 7486387 Optical detection system for flow cytometry

US Patent 7486408 Lithographic apparatus and device manufacturing method with reduced scribe lane usage for substrate measurement

US Patent 7489410 Optical displacement meter, optical displacement measuring method, optical displacement measuring program, computer-readable recording medium, and device that records the program

US Patent 7492456 Method for operating a color measurement system

US Patent 7492457 Methods and devices for testing germicide activity

US Patent 7492465 Method for determining optimal resist thickness

US Patent 7495749 Rapid method for sub-critical fatigue crack growth evaluation

US Patent 7495765 Fiber polarimeter, the use thereof, as well as polarimetric method

US Patent 7495766 Spectroscopic analysis technique for measuring the amount of surface material on wire

US Patent 7495782 Method and system for measuring patterned structures

US Patent 7499157 System for monitoring foreign particles, process processing apparatus and method of electronic commerce

US Patent 7499158 Positionable calibration target for a digital printer or image scanner

US Patent 7499171 Methods for using light reflection patterns to determine diving angle of grain

US Patent 7502110 Design for particle sensor system

US Patent 7502116 Densitometers and methods for measuring optical density

US Patent 7502128 Monitoring arrangement for rotating components

US Patent 7505149 Apparatus for surface inspection and method and apparatus for inspecting substrate

US Patent 7505155 Apparatus and method for inspecting poly-silicon

US Patent 7508498 Apparatus with a combination of a point light source and a single lens

US Patent 7508511 Method and apparatus for improved ellipsometric measurement of ultrathin films

US Patent 7511814 Particle-measuring system and particle-measuring method

US Patent 7515251 Fluorescence measuring device for gemstones

US Patent 7515252 Optical fingerprint imaging system and method with protective film

US Patent 7515266 System and method for enhancing confocal reflectance images of tissue specimens

US Patent 11187658 Fluorescence imaging with fixed pattern noise cancellation

US Patent 7518726 Compact optical detection system for a microfluidic device

US Patent 7518739 Use of optical fourier transform for dimensional control in microelectronics

US Patent 7522269 Bonded part peeling shape identification device

US Patent 7522295 Consecutive measurement of structures formed on a semiconductor wafer using a polarized reflectometer

US Patent 7525649 Surface inspection system using laser line illumination with two dimensional imaging

US Patent 7525671 Registration method and apparatus therefor

US Patent 7528939 Method and apparatus for real-time measurement of trace metal concentration in chemical mechanical polishing (CMP) slurry

US Patent 7528945 Method to determine the optical quality of a glazing

US Patent 7528946 System for detecting deflection of a boring tool

US Patent 7528965 Lithographic apparatus and method for calibrating the same

US Patent 7532326 Multiple-label fluorescence imaging using excitation-emission matrices

US Patent 7535560 Method and system for the inspection of integrated circuit devices having leads

US Patent 7576848 System and method to decrease probe size for improved laser ultrasound detection