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Julio J Maldonado
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Edits on 14 Dec, 2021
"Remove inverse infobox"
Golden AI
edited on 14 Dec, 2021
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Patent primary examiner of
US Patent 11183586 Cascode transistor device
US Patent 7602010 Multi-bit multi-level non-volatile memory device and methods of operating and fabricating the same
US Patent 7608522 Method for fabricating a hybrid orientation substrate
US Patent 7618896 Semiconductor die package including multiple dies and a common node structure
US Patent 7622777 Semiconductor device and method for fabricating the same
US Patent 7645646 Manufacture of electronic devices comprising thin-film circuit elements
US Patent 7648903 Modular bonding pad structure and method
US Patent 7666748 Method of forming amorphous source/drain extensions
US Patent 7670887 Field-effect transistors with weakly coupled layered inorganic semiconductors
US Patent 7670952 Method of manufacturing metal silicide contacts
US Patent 7679153 Sealed surface acoustic wave element package
US Patent 7682932 Method for fabricating a hybrid orientation substrate
US Patent 7687306 CMOS image sensor and method for manufacturing the same
US Patent 7687336 Method of manufacturing a MOSFET structure
US Patent 7687404 Method for manufacturing display device
US Patent 7687884 Manufacture of solid state capacitors
US Patent 7687889 Organic electroluminescent display device having electrical communication between conducting layer and cathode layer
US Patent 7691655 Method of manufacturing semiconductor optical device
US Patent 7691661 Method of fabricating a surface probing device
US Patent 7691672 Substrate treating method and method of manufacturing semiconductor apparatus
US Patent 7691679 Pre-plated leadframe having enhanced encapsulation adhesion
US Patent 7691735 Method for manufacturing metal chips by plasma from a layer comprising several elements
US Patent 7692188 Display device and manufacturing method thereof
US Patent 7696014 Method for breaking adhesive film mounted on back of wafer
US Patent 7709278 Method of making PCB circuit modification from multiple to individual chip enable signals
US Patent 7713874 Periodic plasma annealing in an ALD-type process
US Patent 7714384 Castellated gate MOSFET device capable of fully-depleted operation
US Patent 7723179 Light emitting device and method for manufacturing the same
US Patent 7745940 Forming ultra dense 3-D interconnect structures
US Patent 7749798 Optimized photodiode process for improved transfer gate leakage
US Patent 7749901 Method for forming a tapered via of a semiconductor device
US Patent 7749903 Gate patterning scheme with self aligned independent gate etch
US Patent 7754585 Method of heat treatment of silicon wafer doped with boron
US Patent 7755143 Semiconductor device
US Patent 7759204 Process for high voltage superjunction termination
US Patent 7759221 Methods for packaging microelectronic devices and microelectronic devices formed using such methods
US Patent 7763487 Integrated differential pressure sensor and manufacturing process thereof
US Patent 7767516 Semiconductor device, manufacturing method thereof, and manufacturing method of antenna
US Patent 7767591 Method and device for producing electronic components
US Patent 7768075 Semiconductor die packages using thin dies and metal substrates
US Patent 7772040 Manufacturing method of semiconductor device, adhesive sheet used therein, and semiconductor device obtained thereby
US Patent 7776757 Method of fabricating high-k metal gate devices
US Patent 7781255 Donor sheet and method of manufacturing donor sheet and organic thin film transistor
US Patent 7781351 Methods for producing low-k carbon doped oxide films with low residual stress
US Patent 7786013 Method of fabricating semiconductor device
US Patent 7790478 Manufacturing method of semiconductor integrated circuit device
US Patent 7790493 Wafer-level, polymer-based encapsulation for microstructure devices
US Patent 7790571 SOQ substrate and method of manufacturing SOQ substrate
US Patent 7790584 Method of growing semi-polar nitride single crystal thin film and method of manufacturing nitride semiconductor light emitting diode using the same
US Patent 7791183 Universal low cost MEM package
US Patent 7800185 Closed trench MOSFET with floating trench rings as termination
US Patent 7803688 Capacitive substrate and method of making same
US Patent 7807479 Method and apparatus for improving force control in wafer scribing
US Patent 7820515 Nonvolatile semiconductor memory element excellent in charge retention properties and process for producing the same
US Patent 7820550 Negative tone double patterning method
US Patent 7824930 Method of manufacturing substrate, substrate manufacturing system, and method of manufacturing display
US Patent 7825025 Method and system for improved nickel silicide
US Patent 7825026 Method for processing copper surface, method for forming copper pattern wiring and semiconductor device manufactured using such method
US Patent 7829431 Method for manufacturing a SOI with plurality of single crystal substrates
US Patent 7833825 Solution-based deposition process for metal chalcogenides
US Patent 7833839 Method for decreasing surface delamination of gel-type thermal interface material by management of the material cure temperature
US Patent 7833855 Methods of producing integrated circuit devices utilizing tantalum amine derivatives
US Patent 7838955 Image sensor and method for manufacturing the same
US Patent 7842609 Method for manufacturing semiconductor device
US Patent 7846849 Frequency tripling using spacer mask having interposed regions
US Patent 7851372 Composition for removing an insulation material, method of removing an insulation layer and method of recycling a substrate using the same
US Patent 7858489 Method for manufacturing semiconductor device capable of increasing current drivability of PMOS transistor
US Patent 7863085 Organic thin film transistor, method of manufacturing the same, and biosensor using the transistor
US Patent 7863684 High integrated semiconductor memory device
US Patent 7863694 Organic thin film transistors
US Patent 7867817 Method for manufacturing a wafer level package
US Patent 7867839 Method to reduce threshold voltage (Vt) in silicon germanium (SiGe), high-k dielectric-metal gate, p-type metal oxide semiconductor field effect transistors
US Patent 7867880 Metal precursors for low temperature deposition and methods of forming a metal thin layer and manufacturing a phase-change memory device using the metal precursors
US Patent 7872255 Organic light-emitting device
US Patent 7872261 Transparent thin film transistor and image display unit
US Patent 7883954 Self-aligned epitaxially grown bipolar transistor
US Patent 7883981 Method for manufacturing flash memory device
US Patent 7892867 Method for manufacturing flexible display panel
US Patent 7892886 Semiconductor chip and semiconductor device, and method of manufacturing the same
US Patent 7892908 Integration scheme for changing crystal orientation in hybrid orientation technology (HOT) using direct silicon bonded (DSB) substrates
US Patent 7892929 Shallow trench isolation corner rounding
US Patent 7897453 Dual insulating layer diode with asymmetric interface state and method of fabrication
US Patent 7897877 Capacitive substrate
US Patent 7910432 Non-volatile semiconductor storage device and method of manufacturing the same
US Patent 7910433 Methods of fabricating multi-layer nonvolatile memory devices
US Patent 7910957 Semiconductor device
US Patent 7911000 Semiconductor memory device
US Patent 7911063 Semiconductor device
US Patent 7919376 CMOS transistor and method for manufacturing the same
US Patent 7923383 Method and apparatus for treating a semi-conductor substrate
US Patent 7927987 Method of reducing channeling of ion implants using a sacrificial scattering layer
US Patent 7932153 Semiconductor device and method for fabricating the same
US Patent 7935575 Method of forming a semiconductor package and structure therefor
US Patent 7943504 Self-releasing spring structures and methods
US Patent 7944019 Voltage-controlled semiconductor inductor and method
US Patent 7951678 Metal-gate high-k reference structure
US Patent 7951723 Integrated etch and supercritical CO
US Patent 7951730 Decreasing the etch rate of silicon nitride by carbon addition
US Patent 7955909 Strained ultra-thin SOI transistor formed by replacement gate
US Patent 7955959 Method for manufacturing GaN-based film LED
US Patent 7956400 MIM capacitor integration
US Patent 7964483 Growth method for nitride semiconductor epitaxial layers
US Patent 7964493 Method of manufacturing semiconductor device
US Patent 7972964 Semiconductor device with contact structure and manufacturing method thereof
US Patent 7972977 ALD of metal silicate films
US Patent 7977254 Method of forming a gate insulator in group III-V nitride semiconductor devices
US Patent 7981810 Methods of depositing highly selective transparent ashable hardmask films
US Patent 7985964 Light-emitting semiconductor device
US Patent 7989320 Die bonding
US Patent 7993936 System and method for controlling an electrochemical etch process
US Patent 7998823 Method for reducing leakage currents caused by misalignment of a contact structure by increasing an error tolerance of the contact patterning process
US Patent 8006640 Plasma processing apparatus and plasma processing method
US Patent 8008685 Light emitting device, method of manufacturing light emitting device, light emitting device package, and lighting system
Edits on 8 Dec, 2021
Golden AI
edited on 8 Dec, 2021
Edits made to:
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+1
properties)
Infobox
Patent primary examiner of
US Patent 8008685 Light emitting device, method of manufacturing light emitting device, light emitting device package, and lighting system
Golden AI
edited on 8 Dec, 2021
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+1
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Infobox
Patent primary examiner of
US Patent 8006640 Plasma processing apparatus and plasma processing method
Golden AI
edited on 8 Dec, 2021
Edits made to:
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+1
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Infobox
Patent primary examiner of
US Patent 7998823 Method for reducing leakage currents caused by misalignment of a contact structure by increasing an error tolerance of the contact patterning process
Golden AI
edited on 8 Dec, 2021
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+1
properties)
Infobox
Patent primary examiner of
US Patent 7993936 System and method for controlling an electrochemical etch process
Golden AI
edited on 8 Dec, 2021
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+1
properties)
Infobox
Patent primary examiner of
US Patent 7989320 Die bonding
Golden AI
edited on 8 Dec, 2021
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+1
properties)
Infobox
Patent primary examiner of
US Patent 7985964 Light-emitting semiconductor device
Golden AI
edited on 8 Dec, 2021
Edits made to:
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+1
properties)
Infobox
Patent primary examiner of
US Patent 7981810 Methods of depositing highly selective transparent ashable hardmask films
Golden AI
edited on 8 Dec, 2021
Edits made to:
Infobox
(
+1
properties)
Infobox
Patent primary examiner of
US Patent 7977254 Method of forming a gate insulator in group III-V nitride semiconductor devices
Edits on 8 Dec, 2021
Golden AI
edited on 8 Dec, 2021
Edits made to:
Infobox
(
+1
properties)
Infobox
Patent primary examiner of
US Patent 7972964 Semiconductor device with contact structure and manufacturing method thereof
Golden AI
edited on 8 Dec, 2021
Edits made to:
Infobox
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+1
properties)
Infobox
Patent primary examiner of
US Patent 7972977 ALD of metal silicate films
Golden AI
edited on 8 Dec, 2021
Edits made to:
Infobox
(
+1
properties)
Infobox
Patent primary examiner of
US Patent 7964493 Method of manufacturing semiconductor device
Golden AI
edited on 8 Dec, 2021
Edits made to:
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+1
properties)
Infobox
Patent primary examiner of
US Patent 7964483 Growth method for nitride semiconductor epitaxial layers
Golden AI
edited on 7 Dec, 2021
Edits made to:
Infobox
(
+1
properties)
Infobox
Patent primary examiner of
US Patent 7956400 MIM capacitor integration
Golden AI
edited on 7 Dec, 2021
Edits made to:
Infobox
(
+1
properties)
Infobox
Patent primary examiner of
US Patent 7955959 Method for manufacturing GaN-based film LED
Golden AI
edited on 7 Dec, 2021
Edits made to:
Infobox
(
+1
properties)
Infobox
Patent primary examiner of
US Patent 7955909 Strained ultra-thin SOI transistor formed by replacement gate
Golden AI
edited on 7 Dec, 2021
Edits made to:
Infobox
(
+1
properties)
Infobox
Patent primary examiner of
US Patent 7951730 Decreasing the etch rate of silicon nitride by carbon addition
Golden AI
edited on 7 Dec, 2021
Edits made to:
Infobox
(
+1
properties)
Infobox
Patent primary examiner of
US Patent 7951723 Integrated etch and supercritical CO
Golden AI
edited on 7 Dec, 2021
Edits made to:
Infobox
(
+1
properties)
Infobox
Patent primary examiner of
US Patent 7951678 Metal-gate high-k reference structure
Golden AI
edited on 7 Dec, 2021
Edits made to:
Infobox
(
+1
properties)
Infobox
Patent primary examiner of
US Patent 7944019 Voltage-controlled semiconductor inductor and method
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