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US Patent 12123908 Loopback testing of integrated circuits

Patent 12123908 was granted and assigned to ProteanTecs on October, 2024 by the United States Patent and Trademark Office.

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 US Patent 12123908 Loopback testing of integrated circuits

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Patent abstract

Loopback testing may be provided for one or more transmission output paths of a semiconductor Integrated Circuit (IC). One or more parametric loopback sensors are provided in the semiconductor IC, each parametric loopback sensor being configured to receive a clocked data input signal to a respective transmitter of the IC and a signal from a transmission output path from the respective transmitter of the IC, and to generate a respective sensor output based on a comparison of the clocked data input signal and the signal from the transmission output path for the respective transmitter of the IC. A programmable load circuit is also provided in the semiconductor IC, coupled to each transmission output path.

Infobox
Is a
Patent
Patent
0
Patent Applicant
ProteanTecs
ProteanTecs
0
Current Assignee
ProteanTecs
ProteanTecs
0
Patent Jurisdiction
United States Patent and Trademark Office
United States Patent and Trademark Office
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Patent Number
121239080
Patent Inventor Names
Evelyn Landman0
Eyal Fayneh0
Guy Redler0
Shai Cohen0
Date of Patent
October 22, 2024
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Patent Application Number
183673330
Date Filed
September 12, 2023
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Patent Citations
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Patent Primary Examiner
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Farhana A Hoque
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CPC Code
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G01R 31/2896
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G01R 31/3177
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G01R 31/31727
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