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Jermele M Hollington

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Edits on 15 Dec, 2021
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edited on 15 Dec, 2021
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Patent primary examiner of
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US Patent 11169194 Technologies for verifying a de-embedder for interconnect measurement
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US Patent 11169212 External battery short-circuit testing device
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US Patent 11175314 Multimeter with a meter probe module and phasing probe module capable of wireless communication and taking measurements proximally
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US Patent 11175323 Process monitoring using crystal with reactance sensor
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US Patent 11175346 Power supply monitoring systems and methods using ultrasonic sensors
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US Patent 7151367 Method of measuring duty cycle
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US Patent 11179052 Distinguishing diseased tissue from healthy tissue based on tissue component fractions using magnetic resonance fingerprinting (MRF)
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US Patent 11181394 Distance measuring device
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US Patent 11181590 Diamond magnetic sensor
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US Patent 11183969 Testing of a photovoltaic panel
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US Patent 7365551 Excess overdrive detector for probe cards
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US Patent 7378861 Optical alignment loops for the wafer-level testing of optical and optoelectronic chips
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US Patent 7388365 Method and system for inspecting specimen
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US Patent 7388388 Thin film with MEMS probe circuits and MEMS thin film probe head using the same
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US Patent 7394240 Current sensor
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US Patent 7394270 Semiconductor device, method and apparatus for testing same, and method for manufacturing semiconductor device
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US Patent 7397263 Sensor differentiated fault isolation
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US Patent 7403029 Massively parallel interface for electronic circuit
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US Patent 7408366 Probe tips and method of making same
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US Patent 7408370 Lighting device
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US Patent 7411382 Current detection apparatus
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US Patent 7411408 Measurement method using solar simulator
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US Patent 7414421 Insertable calibration device
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US Patent 7423418 Module part
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US Patent 7427856 Current sensing apparatus
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US Patent 7427857 Resistor structures to electrically measure unidirectional misalignment of stitched masks
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US Patent 7429856 Voltage source measurement unit with minimized common mode errors
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US Patent 7429868 Socket assembly for testing semiconductor device
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US Patent 7432699 Transformer with protection against direct current magnetization caused by zero sequence current
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US Patent 7432726 Probe
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US Patent 7432729 Methods of testing electronic devices
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US Patent 7436198 Test pattern of semiconductor device and test method using the same
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US Patent 7439757 Apparatus and method for inspecting liquid crystal display
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US Patent 7443181 High performance probe system
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US Patent 7446545 Anisotropically conductive sheet
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US Patent 7446547 Cooling apparatus and testing machine using the same
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US Patent 7449900 Probe card and testing method of semiconductor chip, capacitor and manufacturing method thereof
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US Patent 7449904 Integrated circuit burn-in methods and apparatus
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US Patent 7449908 Process monitor for monitoring an integrated circuit chip
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US Patent 7456642 Handheld electronic test probe assembly
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US Patent 7459921 Method and apparatus for a paddle board probe card
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US Patent 7463048 Packaged circuit module for improved installation and operation
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US Patent 7463050 System and method for controlling temperature during burn-in
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US Patent 7466152 Probe card and testing method of semiconductor chip, capacitor and manufacturing method thereof
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US Patent 7466153 Apparatuses for inspecting pogo pins of an electrical die sorting system and a method for performing the same
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US Patent 7471077 Conveyor device, electronic device handling apparatus and conveying method in electronic device handling apparatus
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US Patent 7471094 Method and apparatus for adjusting a multi-substrate probe structure
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US Patent 7471098 Testing device and method for an integrated circuit
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US Patent 7471099 Semiconductor device with mechanism for leak defect detection
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US Patent 7474088 Power monitoring system
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US Patent 7474111 Electrical probe assembly with guard members for the probes
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US Patent 7474112 Method and apparatus for non-invasively testing integrated circuits
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US Patent 7477065 Method for fabricating a plurality of elastic probes in a row
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US Patent 7479778 Adaptive slope compensation for switching regulators
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US Patent 7479792 Methods for making plated through holes usable as interconnection wire or probe attachments
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US Patent 7482825 Burn-in testing apparatus and method
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US Patent 7486093 Arrangement for contacting an integrated circuit in a package
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US Patent 7489122 Method and device for measuring voltage
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US Patent 7495462 Method of wafer-level packaging using low-aspect ratio through-wafer holes
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US Patent 7504838 Methods of determining characteristics of doped regions on device wafers, and system for accomplishing same
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US Patent 7511524 Contact tip structure of a connecting element
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US Patent 7511525 Boundary-scan system architecture for remote environmental testing
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US Patent 7514944 Probe head having a membrane suspended probe
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US Patent 7514949 Testing method detecting localized failure on a semiconductor wafer
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US Patent 11187722 Probe pin and electronic device using the same
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US Patent 11187742 Display panel and method for testing for occurrence of crack in display panel
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US Patent 11190132 Photocurrent scanning system
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US Patent 11191152 Printed circuit board signal layer testing
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US Patent 7518392 Systems and methods for continuity testing using a functional pattern
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US Patent 7521916 Apparatus for the detection of a current and method for operating such an apparatus
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US Patent 7528614 Apparatus and method for voltage contrast analysis of a wafer using a tilted pre-charging beam
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US Patent 7528621 Packaged circuit module for improved installation and operation
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US Patent 7535244 Apparatus for testing a semiconductor device
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US Patent 7535245 Integrated circuit with integrated circuit section to aid in testing
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US Patent 7535247 Interface for testing semiconductors
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US Patent 7538540 Bus bar current detecting apparatus
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US Patent 7541823 Circuit board checker and circuit board checking method
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US Patent 7541826 Compliant pad wafer chuck
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US Patent 7545160 Probe chip and probe card
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US Patent 7548054 Integration methods for energy metering systems using a Rogowski coil
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US Patent 7550986 Semiconductor wafer having a dielectric reliability test structure, integrated circuit product and test method
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US Patent 7550989 System for automatic mounting of workpieces
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US Patent 7550990 Method and apparatus for testing integrated circuits for susceptibility to latch-up
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US Patent 7554347 High input/output density optoelectronic probe card for wafer-level test of electrical and optical interconnect components, methods of fabrication, and methods of use
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US Patent 7554349 Handlers for testing semiconductor devices that are capable of maintaining stable temperature in test environments
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US Patent 7557565 Handler for sorting packaged chips
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US Patent 7560949 Manufacturing method of semiconductor device and semiconductor device corresponding to loop back test
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US Patent 7564233 Shielded Rogowski coil assembly and methods
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US Patent 7564254 Semiconductor device and test method thereof
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US Patent 7567074 Measuring device for measuring differential current, trip module comprising one such measuring device and switchgear unit having one such module
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US Patent 7573277 Thin film probe card
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US Patent 7573280 Semiconductor device, method and apparatus for testing same, and method for manufacturing semiconductor device
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US Patent 7573282 Ball grid array connection monitoring system and method
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US Patent 7579849 Probe holder for a probe for testing semiconductor components
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US Patent 7589517 Adaptive slope compensation for switching regulators
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US Patent 7589519 Electronic apparatus with driving power having different voltage levels
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US Patent 7589520 Soak profiling
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US Patent 7589550 Semiconductor device test system having reduced current leakage
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US Patent 7595652 System and method for reducing heat dissipation during burn-in
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US Patent 7598724 Flexible current transformer assembly
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US Patent 7602198 Accuracy enhancing mechanism and method for current measuring apparatus
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US Patent 7602201 High temperature ceramic socket configured to test packaged semiconductor devices
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US Patent 7609079 Probeless DC testing of CMOS I/O circuits
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US Patent 7616023 Method of detecting a malfunction of an encoder for a vehicle drive system
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US Patent 7619424 Probe needle, method for manufacturing the probe needle and method for constructing a three-dimensional structure
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US Patent 7619431 High sensitivity magnetic built-in current sensor
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US Patent 7622911 Electrical power metering device and method of operation thereof
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US Patent 7622935 Probe card assembly with a mechanically decoupled wiring substrate
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US Patent 7622938 Contact unit for a device to place a part into operation, testing device, and method for placing into operation of and testing a part
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US Patent 7622941 Liquid crystal display panel and testing and manufacturing methods thereof
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US Patent 7622943 Electrical inspection method and method of fabricating semiconductor display devices
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US Patent 7626403 Photosensor testing device with built-in light source and tester provided with said device
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US Patent 7626409 Frequency specific closed loop feedback control of integrated circuits
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US Patent 7633286 Electric current monitoring device
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US Patent 7633303 Semiconductor wafer inspection apparatus
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US Patent 7633307 Method for determining temperature profile in semiconductor manufacturing test
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US Patent 7639025 Collection optics integrating an objective and a SIL
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US Patent 7639027 Method of testing circuit elements on a semiconductor wafer
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US Patent 7642792 Probe card for tests on photosensitive chips and corresponding illumination device
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US Patent 7649368 Wafer level interposer
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US Patent 7652464 RF power sensor with chopping amplifier
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US Patent 7652466 Buffer circuit, amplifier circuit, and test apparatus
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US Patent 7652495 Pusher assemblies for use in microfeature device testing, systems with pusher assemblies, and methods for using such pusher assemblies
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US Patent 7656172 System for testing semiconductors
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US Patent 7656178 Method for calibrating semiconductor device tester
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US Patent 7659737 Electrical, high temperature test probe with conductive driven guard
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US Patent 7663391 Test system and method for reducing test signal loss for integrated circuits
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US Patent 7663396 Substrate for electro-optical device, electro-optical device, and checking method
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US Patent 7667479 Apparatus for testing concentration-type solar cells
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US Patent 7671610 Vertical guided probe array providing sideways scrub motion
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US Patent 7671614 Apparatus and method for adjusting an orientation of probes
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US Patent 7671621 Closed loop feedback control of integrated circuits
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US Patent 7675310 Device under test power supply
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US Patent 7679394 Power supply noise resistance testing circuit and power supply noise resistance testing method
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US Patent 7683645 High-frequency probe card and transmission line for high-frequency probe card
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US Patent 7688090 Wafer-level burn-in and test
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US Patent 7688091 Chuck with integrated wafer support
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US Patent 7692440 Handler for semiconductor singulation and method therefor
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US Patent 7696766 Ultra-fine pitch probe card structure
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US Patent 7696771 Test apparatus and test method
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US Patent 7701240 Integrated circuit with error correction mechanisms to offset narrow tolerancing
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US Patent 7710105 Circuit reset testing methods
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US Patent 7710134 Probe card assembly
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US Patent 7710141 Method and apparatus for dynamic characterization of reliability wearout mechanisms
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US Patent 7714568 Power supply
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US Patent 7714603 Predictive, adaptive power supply for an integrated circuit under test
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US Patent 7714604 System and method for testing an operating condition of LEDs on a motherboard
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US Patent 7719300 Method for testing a semiconductor wafer and apparatus thereof
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US Patent 7723977 Optical sensor arrangement for electrical switchgear
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US Patent 7724014 On-chip servo loop integrated circuit system test circuitry and method
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US Patent 7724016 Characterizing circuit performance by separating device and interconnect impact on signal delay
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US Patent 7728611 Compressive conductors for semiconductor testing
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US Patent 7728613 Device under test pogo pin type contact element
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US Patent 7733099 Monitoring pattern for detecting a defect in a semiconductor device and method for detecting a defect
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US Patent 7746059 Current measurement apparatus
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US Patent 7750620 MTJ sensor based method to measure an electric current
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US Patent 7755380 Repairing manufacturing defects in flat panel displays
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US Patent 7759952 Method of forming probe card assembly
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US Patent 7759958 Apparatus, system, and method for integrated component testing
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US Patent 7759961 Ball grid array connection monitoring system and method
‌
US Patent 7764075 High performance probe system
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US Patent 7768292 Non-invasive power supply tester
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US Patent 7772828 Automatic test equipment capable of high speed test
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US Patent 7772830 Test handler automatic contactor cleaner methods and surrogate cleaning device
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US Patent 7772833 Flexible on chip testing circuit for I/O's characterization
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US Patent 7772860 Massively parallel interface for electronic circuit
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US Patent 7777508 Electrical test lead with a replaceable inline fuse
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US Patent 7782073 High accuracy and universal on-chip switch matrix testline
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US Patent 7786721 Multilayer type test board assembly for high-precision inspection
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US Patent 7786740 Probe cards employing probes having retaining portions for potting in a potting region
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US Patent 7786747 Microdisplay assemblies and methods of packaging microdisplays
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US Patent 7791359 Probe for high frequency signal transmission and probe card using the same
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US Patent 7795893 Test mode enable circuit
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US Patent 7800355 Apparatus for measuring the electrical energy delivered to a rail traction unit by a high voltage line
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US Patent 7804312 Silicon wafer for probe bonding and probe bonding method using thereof
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US Patent 7807998 Evaluation pattern suitable for evaluation of lateral hillock formation
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US Patent 7808257 Ionization test for electrical verification
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US Patent 7808265 Differential voltage defectivity monitoring circuit
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US Patent 7816905 Arrangements for a current sensing circuit and integrated current sensor
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US Patent 7821250 RF sensor clamp assembly
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US Patent 7830162 Vertical probe and methods of fabricating and bonding the same
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US Patent 7830163 Testing circuit board for testing devices under test
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US Patent 7834648 Controlling temperature in a semiconductor device
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US Patent 7843188 Remote sensor network powered inductively from data lines
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US Patent 7843205 Process monitor for monitoring an integrated circuit chip
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US Patent 7847574 Semiconductor device
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US Patent 7855549 Integrated process condition sensing wafer and data analysis system
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US Patent 7859284 Semiconductor device and semiconductor device module
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US Patent 7859287 Device power supply extension circuit, test system including the same and method of testing semiconductor devices
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US Patent 7863921 Circuit board and method for automatic testing
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US Patent 7863925 Test circuit, wafer, measuring apparatus, and measuring method
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US Patent 7868634 Probe or measuring head with illumination of the contact region
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US Patent 7868636 Probe card and method for fabricating the same
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US Patent 7876090 Calibration method and calibration apparatus for a hand-held locating device
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US Patent 7876114 Differential waveguide probe
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US Patent 7876120 Test apparatus, pin electronics card, electrical device and switch
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US Patent 7884597 Apparatus for testing a protective measuring or metering device as a constituent part of a high or medium voltage installation, more specifically of a utility protective relay, of a generator protective device, of a current meter, or of other protective, measuring or metering electrical devices in a high or medium voltage installation
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US Patent 7884630 IC carrie, IC socket and method for testing IC device
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US Patent 7888951 Integrated unit for electrical/reliability testing with improved thermal control
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US Patent 7888952 Circuit arrangement for balancing a resistance circuit
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US Patent 7893706 Test apparatus for liquid crystal display device and test method using the same
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US Patent 7898280 Electrical characterization of semiconductor materials
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US Patent 7898281 Interface for testing semiconductors
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US Patent 7902812 Rogowski coil assembly and methods
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US Patent 7902847 Semiconductor device and test method thereof
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US Patent 7906978 Device for measuring or inspecting substrates of the semiconductor industry
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US Patent 7915897 Foil-leaf electrometer for static field detection with permanently separating leaves
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US Patent 7923985 Active autoranging current sensing circuit
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US Patent 7924018 MEMS electrometer that measures amount of repulsion of adjacent beams from each other for static field detection
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US Patent 7928751 MEMS interconnection pins fabrication on a reusable substrate for probe card application
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US Patent 7932735 Probeless DC testing of CMOS I/O circuits
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US Patent 7936163 Method and system for detecting electricity theft
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US Patent 7940040 Foil-leaf electrometer for static field detection with triggered indicator
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US Patent 7940069 System for testing semiconductors
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US Patent 7948253 Probe assembly
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US Patent 7948257 Method and apparatus for testing and protecting digital output circuits
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US Patent 7952379 Substrate testing device and method thereof
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US Patent 7956603 Sensor inductors, sensors for monitoring movements and positioning, apparatus, systems and methods therefore
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US Patent 7956617 Testing circuits for degradation without removal from host equipment
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US Patent 7956626 Circuit arrangement with switchable functionality and electronic component
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US Patent 7956632 Socket, module board, and inspection system using the module board
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US Patent 7960996 Variable delay circuit, timing generator and semiconductor testing apparatus
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US Patent 7960997 Cascode current sensor for discrete power semiconductor devices
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US Patent 7965095 Separate testing of continuity between an internal terminal in each chip and an external terminal in a stacked semiconductor device
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US Patent 7965097 Test circuit, wafer, measuring apparatus, measuring method, device manufacturing method and display apparatus
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US Patent 7973527 Electronic circuit configured to reset a magnetoresistance element
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US Patent 7973548 Semiconductor test equipment with concentric pogo towers
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US Patent 7982475 Structure and method for reliability evaluation of FCPBGA substrates for high power semiconductor packaging applications
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US Patent 7982478 Liquid TIM dispense and removal method and assembly
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US Patent 7986153 Method and apparatus for sensing
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US Patent 7990131 Device and method for measuring a first voltage and a second voltage by means of a differential voltmeter
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US Patent 7990133 Non-intrusive electric alternating current sensor
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US Patent 7990157 Card for simulating peripheral component interconnect loads
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US Patent 7990163 Systems and methods for defect testing of externally accessible integrated circuit interconnects
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US Patent 7990165 Contact probe and method of making the same
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US Patent 7990169 Electrical testing device
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US Patent 7990171 Stacked semiconductor apparatus with configurable vertical I/O
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US Patent 7999551 Method for detection of signal source using estimation of noise statistics
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US Patent 8004272 Digital multimeter having visible light communication port
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US Patent 8004284 Leak detecting circuit
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US Patent 8004303 Method and system for measuring film stress in a wafer film
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US Patent 8004304 Semiconductor device, and life prediction circuit and life prediction method for semiconductor device
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US Patent 8008906 Prime-based frequency sampling
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US Patent 8008936 Probe card actuator
Edits on 8 Dec, 2021
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US Patent 8008936 Probe card actuator
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US Patent 8008906 Prime-based frequency sampling
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US Patent 8004303 Method and system for measuring film stress in a wafer film
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Patent primary examiner of
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US Patent 8004284 Leak detecting circuit
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edited on 8 Dec, 2021
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Infobox
Patent primary examiner of
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US Patent 8004272 Digital multimeter having visible light communication port
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Golden AI
edited on 8 Dec, 2021
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Patent primary examiner of
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US Patent 7999551 Method for detection of signal source using estimation of noise statistics
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Golden AI
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Patent primary examiner of
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US Patent 7990171 Stacked semiconductor apparatus with configurable vertical I/O
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edited on 8 Dec, 2021
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Infobox
Patent primary examiner of
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US Patent 7990169 Electrical testing device
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Patent primary examiner of
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US Patent 7990165 Contact probe and method of making the same
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edited on 8 Dec, 2021
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Patent primary examiner of
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US Patent 7990157 Card for simulating peripheral component interconnect loads
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Golden AI
edited on 8 Dec, 2021
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Patent primary examiner of
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US Patent 7990133 Non-intrusive electric alternating current sensor
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edited on 8 Dec, 2021
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edited on 8 Dec, 2021
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Patent primary examiner of
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US Patent 7986153 Method and apparatus for sensing
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edited on 8 Dec, 2021
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Patent primary examiner of
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US Patent 7982478 Liquid TIM dispense and removal method and assembly
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edited on 8 Dec, 2021
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Patent primary examiner of
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US Patent 7973548 Semiconductor test equipment with concentric pogo towers
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edited on 8 Dec, 2021
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Patent primary examiner of
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US Patent 7973527 Electronic circuit configured to reset a magnetoresistance element

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