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Daborah Chacko-Davis
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Edits on 15 Dec, 2021
"Remove inverse infobox"
Golden AI
edited on 15 Dec, 2021
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Patent primary examiner of
US Patent 11174350 Resin and photosensitive resin composition
US Patent 11181821 Composition for forming organic film, substrate for manufacturing semiconductor apparatus, method for forming organic film, patterning process, and polymer
US Patent 7462442 Biocompatible microchip and a method for producing the same
US Patent 7498106 Method and apparatus for controlling etch processes during fabrication of semiconductor devices
US Patent 7498124 Sacrificial surfactanated pre-wet for defect reduction in a semiconductor photolithography developing process
US Patent 7501226 Immersion lithography system with wafer sealing mechanisms
US Patent 11187981 Resist composition and method of forming resist pattern
US Patent 11187983 EUV patterning of monolayers for selective atomic layer deposition
US Patent 11187985 Method and composition for improving LWR in patterning step using negative tone photoresist
US Patent 7517639 Seal ring arrangements for immersion lithography systems
US Patent 7625694 Selective provision of a diblock copolymer material
US Patent 7632629 Interference colored filters
US Patent 7649184 Processing method and system
US Patent 7655384 Methods for reducing spherical aberration effects in photolithography
US Patent 7662546 Apparatus for processing substrate and method of processing the same
US Patent 7666580 System and method for contrast enhanced zone plate array lithography
US Patent 7667819 System and method for contrast enhanced zone plate array lithography
US Patent 7670759 Micro pattern forming method and semiconductor device manufacturing method
US Patent 7678535 Method for fabricating semiconductor device with recess gate
US Patent 7713684 System and method for absorbance modulation lithography
US Patent 7714988 System and method for absorbance modulation lithography
US Patent 7718347 Method for making an improved thin film solar cell interconnect using etch and deposition process
US Patent 7718350 Method of metal plating by using frame
US Patent 7732121 Near-field exposure method
US Patent 7738078 Optimized mirror design for optical direct write
US Patent 7766640 Contact lithography apparatus, system and method
US Patent 7771892 Double exposure method and photomask for same
US Patent 7776495 Semiconductor device and manufacturing method thereof
US Patent 7781152 Ozone-assisted lithography process with image enhancement for CPP head manufacturing
US Patent 7787706 Method for controlling an intensity of an infrared source used to detect objects adjacent to an interactive display surface
US Patent 7790359 Plating method
US Patent 7795369 Sulfur atom-containing anti-reflective coating forming composition for lithography
US Patent 7799517 Single/double dipole mask for contact holes
US Patent 7803517 Method of forming fine contact hole and method of fabricating semiconductor device using block copolymers
US Patent 7807334 Substrate having fine line, electron source and image display apparatus
US Patent 7807336 Method for manufacturing semiconductor device
US Patent 7807342 Transmission mask with differential attenuation to improve ISO-dense proximity
US Patent 7811745 Method of manufacturing semiconductor device
US Patent 7811746 Method of patterning a positive tone resist layer overlaying a lithographic substrate
US Patent 7811747 Method of patterning an anti-reflective coating by partial developing
US Patent 7816071 Process of imaging a photoresist with multiple antireflective coatings
US Patent 7820363 Process for forming a solder mask, apparatus thereof and process for forming electric-circuit patterned internal dielectric layer
US Patent 7824842 Method of patterning a positive tone resist layer overlaying a lithographic substrate
US Patent 7827682 Apparatus for making circuitized substrates having photo-imageable dielectric layers in a continuous manner
US Patent 7842450 Method of forming a semiconductor device
US Patent 7846649 High resolution printer and a method for high resolution printing
US Patent 7851137 Method of manufacturing semiconductor device
US Patent 7851139 Pattern forming method
US Patent 7855048 Wafer assembly having a contrast enhancing top anti-reflecting coating and method of lithographic processing
US Patent 7858293 Method for double imaging a developable anti-reflective coating
US Patent 7858294 Method to restore hydrophobicity in dielectric films and materials
US Patent 7859642 Apparatus and method for exposing edge of substrate
US Patent 7862985 Method for double patterning a developable anti-reflective coating
US Patent 7867687 Methods and compositions for reducing line wide roughness
US Patent 7867695 Methods for mastering microstructures through a substrate using negative photoresist
US Patent 7867696 Method and apparatus for monitoring saturation levels of solvents used during rapid prototyping processes
US Patent 7868464 Multilayer substrate and manufacturing method thereof
US Patent 7875419 Method for removing resist pattern and method for manufacturing semiconductor device
US Patent 7879531 Immersion lithography fluids
US Patent 7879534 Fabrication of a high resolution biological molecule detection device
US Patent 7879538 Frequency division multiplexing (FDM) lithography
US Patent 7883835 Method for double patterning a thin film
US Patent 7883838 Organometallic composition for forming a metal alloy pattern and a method of forming such a pattern using the composition
US Patent 7883839 Method and apparatus for nano-pantography
US Patent 7886428 Method of producing multilayer printed wiring board and photosensitive dry film used therefor
US Patent 7887999 Method of making a pillar pattern using triple or quadruple exposure
US Patent 7897324 Lithographic method
US Patent 7923198 Method of manufacturing fine T-shaped electrode
US Patent 7924401 Seal ring arrangements for immersion lithography systems
US Patent 7927783 Tunable lithography with a refractive mask
US Patent 7932017 Method of double patterning a thin film using a developable anti-reflective coating and a developable organic planarization layer
US Patent 7932020 Contact or proximity printing using a magnified mask image
US Patent 7943289 Inverse resist coating process
US Patent 7947428 Method for forming photosensitive polyimide pattern and electronic devices having the pattern
US Patent 7947429 Long length flexible circuits and method of making same
US Patent 7968272 Semiconductor device manufacturing method to form resist pattern
US Patent 7977034 Method for making circuitized substrates having photo-imageable dielectric layers in a continuous manner
US Patent 7989142 Photo-masking method for fabricating TFT array substrate
US Patent 7989151 Resolution enhancement in optical lithography via absorbance-modulation enabled multiple exposures
US Patent 7989152 Magneto-optical photoresist
US Patent 7989155 Lithographic method
US Patent 7993814 Method for forming patterns using single mask
US Patent 7993815 Line ends forming
US Patent 7998663 Pattern formation method
US Patent 8003300 Methods for fabricating complex micro and nanoscale structures and electronic devices and components made by the same
US Patent 8007986 Immersion lithography fluids
US Patent 8012670 Photoresist systems
US Patent 8012673 Processing a copolymer to form a polymer memory cell
Edits on 13 Dec, 2021
Golden AI
edited on 13 Dec, 2021
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Patent primary examiner of
US Patent 8012673 Processing a copolymer to form a polymer memory cell
Golden AI
edited on 13 Dec, 2021
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Patent primary examiner of
US Patent 8012670 Photoresist systems
Edits on 8 Dec, 2021
Golden AI
edited on 8 Dec, 2021
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Patent primary examiner of
US Patent 8007986 Immersion lithography fluids
Golden AI
edited on 8 Dec, 2021
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+1
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Infobox
Patent primary examiner of
US Patent 8003300 Methods for fabricating complex micro and nanoscale structures and electronic devices and components made by the same
Golden AI
edited on 8 Dec, 2021
Edits made to:
Infobox
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+1
properties)
Infobox
Patent primary examiner of
US Patent 7998663 Pattern formation method
Golden AI
edited on 8 Dec, 2021
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+1
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Patent primary examiner of
US Patent 7993815 Line ends forming
Golden AI
edited on 8 Dec, 2021
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+1
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Infobox
Patent primary examiner of
US Patent 7993814 Method for forming patterns using single mask
Golden AI
edited on 8 Dec, 2021
Edits made to:
Infobox
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+1
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Infobox
Patent primary examiner of
US Patent 7989151 Resolution enhancement in optical lithography via absorbance-modulation enabled multiple exposures
Golden AI
edited on 8 Dec, 2021
Edits made to:
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+1
properties)
Infobox
Patent primary examiner of
US Patent 7989155 Lithographic method
Golden AI
edited on 8 Dec, 2021
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+1
properties)
Infobox
Patent primary examiner of
US Patent 7989152 Magneto-optical photoresist
Golden AI
edited on 8 Dec, 2021
Edits made to:
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+1
properties)
Infobox
Patent primary examiner of
US Patent 7989142 Photo-masking method for fabricating TFT array substrate
Golden AI
edited on 8 Dec, 2021
Edits made to:
Infobox
(
+1
properties)
Infobox
Patent primary examiner of
US Patent 7977034 Method for making circuitized substrates having photo-imageable dielectric layers in a continuous manner
Golden AI
edited on 8 Dec, 2021
Edits made to:
Infobox
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+1
properties)
Infobox
Patent primary examiner of
US Patent 7968272 Semiconductor device manufacturing method to form resist pattern
Edits on 7 Dec, 2021
Golden AI
edited on 7 Dec, 2021
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+1
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Infobox
Patent primary examiner of
US Patent 7947429 Long length flexible circuits and method of making same
Golden AI
edited on 7 Dec, 2021
Edits made to:
Infobox
(
+1
properties)
Infobox
Patent primary examiner of
US Patent 7947428 Method for forming photosensitive polyimide pattern and electronic devices having the pattern
Golden AI
edited on 7 Dec, 2021
Edits made to:
Infobox
(
+1
properties)
Infobox
Patent primary examiner of
US Patent 7943289 Inverse resist coating process
Golden AI
edited on 7 Dec, 2021
Edits made to:
Infobox
(
+1
properties)
Infobox
Patent primary examiner of
US Patent 7932017 Method of double patterning a thin film using a developable anti-reflective coating and a developable organic planarization layer
Golden AI
edited on 7 Dec, 2021
Edits made to:
Infobox
(
+1
properties)
Infobox
Patent primary examiner of
US Patent 7932020 Contact or proximity printing using a magnified mask image
Golden AI
edited on 7 Dec, 2021
Edits made to:
Infobox
(
+1
properties)
Infobox
Patent primary examiner of
US Patent 7927783 Tunable lithography with a refractive mask
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