Michael P Stafira

US Patent 11169092 Sample observation device and sample observation method

US Patent 7099013 System and method of broad band optical end point detection for film change indication

US Patent 7099018 Measurement of optical properties of radiation sensitive materials

US Patent 7102740 Method and system for determining surface feature characteristics using slit detectors

US Patent 7102743 Semiconductor wafer inspection apparatus

US Patent 7102752 Systems to view and analyze the results from diffraction-based diagnostics

US Patent 7102753 Optical system for measurement

US Patent 7102754 Measuring method and apparatus using attenuation in total internal reflection

US Patent 7106429 Apparatus and method for detecting change of dielectric constant

US Patent 7106442 Multi-spectral optical method and system for detecting and classifying biological and non-biological particles

US Patent 7106446 Modulated reflectance measurement system with multiple wavelengths

US Patent 7106458 Device for detecting edges of sheet-shaped materials

US Patent 7110095 Multiple adaptable 3-dimensional ultra-high speed scanning system for organic and inorganic surface topography and spectrometry

US Patent 7113272 Device and method for automatically inspecting objects traveling in an essentially monolayer flow

US Patent 7113285 Multimode reader

US Patent 7116406 Security element structure for documents, devices for checking documents with such security elements, method for the use thereof

US Patent 7116412 Angle detection optical system, angle detection apparatus, optical signal switch system and information recording and reproduction system

US Patent 7116413 Inspection system for integrated applications

US Patent 7116419 Wavelength-parallel polarization measurement systems and methods

US Patent 7116424 Modulated reflectance measurement system with multiple wavelengths

US Patent 7119889 Apparatus for reducing ambient light into an optical print scanner

US Patent 7123353 Method for monitoring slope lands and buildings on the slope lands

US Patent 7123356 Methods and systems for inspecting reticles using aerial imaging and die-to-database detection

US Patent 7123357 Method of detecting and classifying scratches and particles on thin film disks or wafers

US Patent 7130037 Systems for inspecting wafers and reticles with increased resolution

US Patent 7130038 Method and apparatus for optical film measurements in a controlled environment

US Patent 7133127 Lighting optical machine and defect inspection system

US Patent 11175128 Quality control of substrate coatings

US Patent 11175236 Image acquisition system and image acquisition method

US Patent 7136158 Optical apparatus for laser scattering by objects having complex shapes

US Patent 7136159 Excimer laser inspection system

US Patent 7139076 Stable optical diffuse reflection measurement

US Patent 7142299 Turbidity sensor

US Patent 7142304 Method and system for enhanced imaging of a scattering medium

US Patent 7148960 Method and device for non-destructive analysis of perforations in a material

US Patent 7154592 Multiwavelength readhead for use in the determination of analytes in body fluids

US Patent 7154593 Method and apparatus for measuring blood sugar

US Patent 7154594 Apparatus and method for determining the viability of eggs

US Patent 7154595 Cavity enhanced optical detector

US Patent 7154597 Method for inspecting surface and apparatus for inspecting it

US Patent 7154598 Excitation and imaging of fluorescent arrays

US Patent 7154607 Flat spectrum illumination source for optical metrology

US Patent 7161665 High resolution imaging fountain flow cytometry

US Patent 7161670 Inspection systems using sensor array and double threshold arrangement

US Patent 7161675 Beam splitting apparatus, transmittance measurement apparatus, and exposure apparatus

US Patent 7170609 Sensor systems and methods for quantification of physical parameters, chemical and biochemical volatile and nonvolatile compounds in fluids

US Patent 7173691 Method for calibrating the geometry of a multi-axis metrology system

US Patent 7173692 Device and method for optically inspecting operating holes formed in heads of screws

US Patent 7173697 Low truncation loss, non-reciprocal nephelometer with integrating sphere

US Patent 7173703 Apparatus on a textile fibre processing machine for evaluating textile fibre material

US Patent 7173706 Apparatus and method for gas sensing

US Patent 7184133 Automated verification systems and method for use with optical interference devices

US Patent 7184135 Refractometer with blazed bragg gratings

US Patent 7184147 Device for determining the properties of surfaces

US Patent 7184151 Method for identifying measuring points in an optical measuring system

US Patent 7187436 Multi-resolution inspection system and method of operating same

US Patent 7187437 Plurality of light sources for inspection apparatus and method

US Patent 7187438 Apparatus and method for inspecting defects

US Patent 7187440 Holographic sensor, especially for recognition of moisture on a glass pane of a motor vehicle

US Patent 7187444 Measuring method and apparatus using attenuation in total internal reflection

US Patent 7190446 System for processing electronic devices

US Patent 7190447 Double sided optical inspection of thin film disks or wafers

US Patent 7190459 Multi beam scanning with bright/dark field imaging

US Patent 7193699 Method and apparatus for scanning a semiconductor wafer

US Patent 7196781 Method for verifying a perforation pattern serving as a security characteristic

US Patent 7199878 Scan exposure apparatus and method, and device manufacturing method

US Patent 7202943 Object identification using quantum dots fluorescence allocated on Fraunhofer solar spectral lines

US Patent 7206067 Method and apparatus for obtaining geometrical data relating to the ear canal of the human body

US Patent 7209228 Scanning apparatus

US Patent 7209234 Combined use of oscillating means and ellipsometry to determine uncorrelated effective thickness and optical constants of material deposited from a fluid

US Patent 7215427 Device for controlling material

US Patent 7218386 Detection of printing and coating media

US Patent 7218390 Apparatus and methods for automatically measuring a curl of an optical sheet

US Patent 7218401 Surface plasmon sensor, surface plasmon resonance measurement device, and detection chip

US Patent 7221456 Surface plasmon resonance sensor

US Patent 7221457 Imaging platform for nanoparticle detection applied to SPR biomolecular interaction analysis

US Patent 7224454 Apparatus and process for analyzing a stream of fluid

US Patent 7224455 Measuring particulate matter in a fluid

US Patent 7227631 Method for examining a test sample by means of fluorescence spectroscopy, especially fluorescence correlatin spectroscopy, and device for carrying out said method

US Patent 7227641 Method and apparatus for measuring a pitch of stranded cable

US Patent 7230695 Defect repair device and defect repair method

US Patent 7230708 Method and device for photothermal examination of microinhomogeneities

US Patent 7230712 Reduction of residual amplitude modulation in frequency-modulated signals

US Patent 7236249 Rain sensor

US Patent 7239380 Tensioning rail applied by injection molding

US Patent 7239390 Modulated scatterometry

US Patent 7239395 Optical interrogation systems with reduced parasitic reflections and a method for filtering parasitic reflections

US Patent 7245365 Apparatus and method for detecting particles on an object

US Patent 7248352 Method for inspecting defect and apparatus for inspecting defect

US Patent 7251033 In-situ reticle contamination detection system at exposure wavelength

US Patent 7253889 Shaft cone metrology system and method

US Patent 7253890 Door obstacle sensor

US Patent 7259843 Foreign matter detection and removal device

US Patent 7259845 Disposable optical cuvette cartridge with low fluorescence material

US Patent 7259854 Control device for a conveyor

US Patent 7265833 Electrophoretic system with multi-notch filter and laser excitation source

US Patent 7265844 Horizontal surface plasmon resonance instrument with improved light path

US Patent 7265846 Methods for detecting ice and liquid water on surfaces

US Patent 7271890 Method and apparatus for inspecting defects

US Patent 7271903 Apparatus and method for testing liquid crystal display panel

US Patent 7274444 Multi mode inspection method and apparatus

US Patent 7277165 Method of characterizing flare

US Patent 7280193 Distinguishing mirror speckle from target images in weak signal applications

US Patent 7280207 Time-delay integration in a flow cytometry system

US Patent 7283222 Optical measuring device

US Patent 7283225 Particle detection device, lithographic apparatus and device manufacturing method

US Patent 7283254 Apparatus for shifting reference distance of laser displacement sensor

US Patent 7289200 Confocal reflectommeter/ellipsometer to inspect low-temperature fusion seals

US Patent 7292325 Method and apparatus for determining absolute angle and torque with optical detection module

US Patent 7292328 Method for inspection of a wafer

US Patent 7292340 Procedure for detecting and classifying impurities in longitudinally moving textile inspection material

US Patent 7292341 Optical system operating with variable angle of incidence

US Patent 7295310 Apparatus for determining the shape and/or size of little particles

US Patent 7298461 Far field light microscopical method, system and computer program product for analysing at least one object having a subwavelength size

US Patent 7298469 Specific density detector with electro mechanical actuator and improved mirror

US Patent 7298471 Surface inspection apparatus and surface inspection method

US Patent 7298480 Broadband ellipsometer / polarimeter system

US Patent 7301620 Inspecting apparatus, image pickup apparatus, and inspecting method

US Patent 7301621 Method and device for non-destructive analysis of perforations in a material

US Patent 7307712 Method of detecting mask defects, a computer program and reference substrate

US Patent 7307732 Photonic crystal interferometer

US Patent 7310141 Inspection device and inspection method for pattern profile, exposure system

US Patent 7312864 Measurement device and process for determining the straightness of hollow cylindrical or hollow conical bodies and their orientation relative to one another

US Patent 7315363 Inspection method and inspection apparatus

US Patent 7315365 System and methods for classifying anomalies of sample surfaces

US Patent 7315366 Apparatus and method for inspecting defects

US Patent 7319516 Measurement instrument for inspecting painted bodywork parts, the instrument being provided with an anti-damage device

US Patent 7324191 Optical seat belt tension sensor

US Patent 7324219 Method and device for carrying out a measurement on a claw coupling

US Patent 7330258 Spectrometer designs

US Patent 7336348 Apparatus and method for determining the viability of eggs

US Patent 7342652 Biomedical optical device and biomedical optical measuring method

US Patent 7345751 Material independent optical profilometer

US Patent 7345767 Method for measuring optical-phase distribution

US Patent 7349081 Method and device for checking the integrity of a glass protecting tube for the spiral-wound filament of an infrared radiator heat source

US Patent 7349082 Particle detection device, lithographic apparatus and device manufacturing method

US Patent 7349086 Systems and methods for optical measurement

US Patent 7349090 Methods and systems for determining a property of a specimen prior to, during, or subsequent to lithography

US Patent 7349094 Laser radar apparatus having multiple output wavelengths

US Patent 7352448 Personal identification system

US Patent 7359055 Optical sensor for determining the concentrations of dyes and/or particles in liquid or gaseous media and method for operating the same

US Patent 7362437 Vision inspection system device and method

US Patent 11181360 Evaluating method and evaluation system

US Patent 7369224 Surface inspection apparatus, surface inspection method and exposure system

US Patent 7375826 High speed three-dimensional laser scanner with real time processing

US Patent 7379171 Optical object distance simulation device

US Patent 7382457 Illumination system for material inspection

US Patent 7385702 Process and apparatus to control the integrity of a planar substrate

US Patent 7391507 Method of photo-reflectance characterization of strain and active dopant in semiconductor structures

US Patent 7394529 Fingerprint sensor using microlens

US Patent 7394536 Method and apparatus for inspecting front surface shape

US Patent 7394544 Elution test method and apparatus

US Patent 7400402 Modulated scatterometry

US Patent 7400416 Accurate target orientation measuring system

US Patent 7403272 Method and device for the detection of counterfeit documents and banknotes

US Patent 7403278 Surface inspection apparatus and surface inspection method

US Patent 7403279 Information recording medium examining apparatus and method

US Patent 7403296 Method and apparatus for noncontact relative rail displacement, track modulus and stiffness measurement by a moving rail vehicle

US Patent 7405827 Gas content measuring apparatus and method

US Patent 7408647 Surface plasmon resonance sensor device

US Patent 7414710 Device for checking banknotes

US Patent 7417720 Lighting optical machine and defect inspection system

US Patent 7417721 Defect detector and defect detecting method

US Patent 7423741 Method for visualizing a mark on a spectacle lens

US Patent 7423747 Floating cuvette for lens inspection

US Patent 7423754 Web planarity gauge and method

US Patent 7423757 Modulated reflectance measurement system with multiple wavelengths

US Patent 7426031 Method and apparatus for inspecting target defects on a wafer

US Patent 7428047 Time-delay integration in a flow cytometry system

US Patent 7430043 Turbidimeter improvements

US Patent 7433033 Inspection method and apparatus using same

US Patent 7433797 Method for verifying scan precision of a laser measurement machine

US Patent 7436504 Non-destructive testing and imaging

US Patent 7436523 Eyeglass frame measurement apparatus

US Patent 7443492 Device and method for testing lens modules

US Patent 7443499 Method for measuring the sagging of a glass panel

US Patent 7443501 Light guide plate measurement apparatus

US Patent 7443507 Surface plasmon resonance sensor

US Patent 7446865 Method of classifying defects

US Patent 7446866 Apparatus and method for inspecting pattern

US Patent 7446870 Method for verification of particles having a sensor area and sensor arrangement for carrying out this method

US Patent 7446871 Method and apparatus for real-time polarization difference imaging (PDI) video

US Patent 7446875 Apparatus and method for acquiring time-resolved measurements utilizing direct digitization of the temporal point spread function of the detected light

US Patent 7446889 Method of evaluating film thickness, method of detecting polishing terminal, and device-manufacturing apparatus

US Patent 7450223 Sample analyzer

US Patent 7453555 Aggregometer with near ultraviolet light source

US Patent 7453561 Method and apparatus for inspecting foreign particle defects

US Patent 7453563 Device and method for detecting scratches

US Patent 7453572 Method and apparatus for continuous measurement of the refractive index of fluid

US Patent 7463348 Rail vehicle mounted rail measurement system

US Patent 7463359 Plasmon tomography

US Patent 7466402 System and method for testing a lighting diode

US Patent 7466420 Plasmon tomography

US Patent 7468793 Time-delay integration in electrophoretic detection systems

US Patent 7471383 Method of automated quantitative analysis of distortion in shaped vehicle glass by reflected optical imaging

US Patent 7477372 Optical scanning system for surface inspection

US Patent 7480036 Stored light intensity measurement device

US Patent 7480037 System for projecting flaws and inspection locations and associated method

US Patent 7480039 Multi mode inspection method and apparatus

US Patent 7480041 Inspection system and method

US Patent 7483150 Measuring device having an optical probe tip

US Patent 7486392 Method of inspecting for defects and apparatus for performing the method

US Patent 7486396 Electrophoretic system with multi-notch filter and laser excitation source

US Patent 7486398 Groundwater monitoring system and method

US Patent 7489391 Polarization and reflection based non-contact latent fingerprint imaging and lifting

US Patent 7495750 Monitoring device for rotating body

US Patent 7495751 Measuring apparatus

US Patent 7495756 Pattern inspection apparatus

US Patent 7495757 Semiconductor manufacturing apparatus and wafer processing method

US Patent 7495759 Damage and wear detection for rotary cutting blades

US Patent 7495763 Dual function measurement system

US Patent 7499169 Fuel cell and product of combustion humidity sensor

US Patent 7502101 Apparatus and method for enhanced critical dimension scatterometry

US Patent 7502104 Probe beam profile modulated optical reflectance system and methods

US Patent 7502124 Wheel and tire assembly and method of dynamically measuring topological parameters of the inside surface of the pertinent portion of the tire

US Patent 7505151 Arrangement for the optical distance determination of a reflecting surface

US Patent 7508503 Integrating sphere having means for temperature control

US Patent 7511806 Apparatus and method for inspecting defects

US Patent 7511819 Light source for a downhole spectrometer

US Patent 7511820 Surface plasmon resonance sensing system and method thereof

US Patent 7515255 Method and apparatus for detecting concentricity of lens module

US Patent 11185925 Process abnormality detection system for three-dimensional additive manufacturing device, three-dimensional additive manufacturing device, process abnormality detection method for three-dimensional additive manufacturing device, method for manufacturing three-dimensional additive manufactured product, and three-dimensional additive manufactured product

US Patent 11187613 Opto electrical test measurement system for integrated photonic devices and circuits

US Patent 11187651 Methods and devices for improved signal detection from biological samples

US Patent 7518723 Systems and methods for detecting radiation, biotoxin, chemical, and biological warfare agents using a multiple angle light scattering (MALS) instrument

US Patent 7522273 Apparatus and method for measuring an optical characteristic without adverse effects of a deviation of a polarized component

US Patent 7525651 Inspection apparatus and inspection method for pattern profile, and exposure apparatus

US Patent 7525655 Optical design of a particulate measurement system

US Patent 7525668 Apparatus and method for appearance inspection

US Patent 7528943 Method and apparatus for simultaneous high-speed acquisition of multiple images

US Patent 7532315 Automatic lens blocking apparatus

US Patent 7532327 Systems and methods for detecting scattered light from a particle using illumination incident at an angle

US Patent 7535562 Apparatus and method for defect inspection

US Patent 7535564 Apparatus for determining the internal outline of a duct or cavity, and in particular for determining the internal impression of the auditory canal, a probe for this apparatus, and reflection device for an optical scanning apparatus

US Patent 7545487 Inspection of eggs in the presence of blood

US Patent 7548315 System and method to compensate for critical dimension non-uniformity in a lithography system

US Patent 7548317 Apparatus and method for angular colorimetry

US Patent 7548323 Displacement and flatness measurements by use of a laser with diffractive optic beam shaping and a multiple point sensor array using the back reflection of an illuminating laser beam

US Patent 7551277 Particle monitors and method(s) therefor

US Patent 7551279 Systems and methods for detecting normal levels of bacteria in water using a multiple angle light scattering (MALS) instrument

US Patent 7551283 Orientation meter

US Patent 7551284 Method and device for the optical monitoring of a running fiber strand

US Patent 7554656 Methods and systems for inspection of a wafer

US Patent 7554657 Accomodating device for specimen slides

US Patent 7554658 Cuvette and cuvette cap

US Patent 7554661 Systems and methods for detection and classification of waterborne particles using a multiple angle light scattering (MALS) instrument

US Patent 7557911 Appearance inspection apparatus

US Patent 7561256 Method and apparatus for determining blood oxygen

US Patent 7564551 Systems and methods for a high capture angle, multiple angle light scattering (MALS) instrument

US Patent 7567348 Method and apparatus for the evaluation of the local servers properties of surfaces

US Patent 7570352 Laser scanning apparatus with improved optical features

US Patent 7570373 System and method to measure parameters distribution in sheet-like objects

US Patent 7576857 Particle counter with laser diode

US Patent 7576862 Measuring time dependent fluorescence

US Patent 7576863 Horizontal surface plasmon resonance sensor apparatus

US Patent 7580129 Method and system for improving accuracy of critical dimension metrology

US Patent 7580136 Height position detector for work held on chuck table

US Patent 7583367 Catheter surgery simulation

US Patent 7586594 Method for inspecting defect and apparatus for inspecting defect

US Patent 7586595 Method of scanning and scanning apparatus

US Patent 7586616 Surface plasmon resonance sensor

US Patent 7586624 Apparatus and method for detecting error of transfer system

US Patent 7589832 Inspection method and apparatus, lithographic apparatus, lithographic processing cell and device method

US Patent 7593099 Method and device for configuration examination

US Patent 7593103 Light intensity measuring method and electronic device

US Patent 7595871 Flow cell consisting of layer and connection means

US Patent 7599053 Pattern defect inspection method, photomask manufacturing method, and display device substrate manufacturing method

US Patent 7599072 Method for determining physical properties of a multilayered periodic structure

US Patent 7599074 Grating angle magnification enhanced angular sensor and scanner

US Patent 7602496 Optical sensor with biologically reactive surface

US Patent 7609373 Reducing variations in energy reflected from a sample due to thin film interference

US Patent 7612873 Surface form measuring apparatus and stress measuring apparatus and surface form measuring method and stress measuring method

US Patent 7612875 Personal identification system

US Patent 7612885 Spectroscopy method and apparatus for detecting low concentration gases

US Patent 7616292 Examination apparatus

US Patent 7616330 Geometric measurement system and method of measuring a geometric characteristic of an object

US Patent 7623223 Stress measurement method

US Patent 7623251 Geometric measurement system and method of measuring a geometric characteristic of an object

US Patent 7630069 Illumination system for optical inspection

US Patent 7630072 Fluorescence calibrator for multiple band flat field correction

US Patent 7630074 Device and method for measuring at least one parameter of particles in a fluid

US Patent 7630078 Calibrating implantable optical sensors

US Patent 7630090 Oven width measurement instrument and push-out ram provided with the instrument

US Patent 7633604 Sample analyzer and computer program product

US Patent 7633611 Method and apparatus for testing imager devices using a center turning optic

US Patent 7636159 Time-delay integration in detection of labeled beads

US Patent 7636160 System for detecting markers

US Patent 7636169 Biofidelic displacement measuring system for an anthropomorphic testing device

US Patent 7646491 Determining azimuth angle of incident beam to wafer

US Patent 7649622 Multi-site optical power calibration system and method

US Patent 7652767 Optical sensor with chemically reactive surface

US Patent 7656515 Apparatus and method for analysis of optical storage media

US Patent 7656516 Pattern inspection apparatus

US Patent 7656534 System for automatic detection of forest fires through optic spectroscopy

US Patent 7656540 Apparatus and method for measuring suspension and head assemblies

US Patent 7659984 Device for controlling material

US Patent 7659987 Device and method for acquiring information on objective substance to be detected by detecting a change of wavelength characteristics on the optical transmittance

US Patent 7663738 Method for automatically detecting factors that disturb analysis by a photometer

US Patent 7663743 Sensing system

US Patent 7667837 Capillary tube flow cell

US Patent 7667846 Device and process for inspecting the bottoms of containers

US Patent 7671977 Personal identification system

US Patent 7671996 Surface plasmon resonance sensor and biochip

US Patent 7675624 Portable and cartridge-based surface plasmon resonance sensing systems

US Patent 7679723 Measuring device and method that operates according to the basic principles of confocal microscopy

US Patent 7679739 Device and method for measuring microporous film on battery electrode plate, coater equipped with film measuring device, and coating method using film measuring method

US Patent 7684052 Three-dimensional shape measuring apparatus, program, computer-readable recording medium, and three-dimensional shape measuring method

US Patent 7684061 Electronic component mounting apparatus, height detection method for electronic component, and optical-axis adjustment method for component height detection unit

US Patent 7688439 Optical measuring system

US Patent 7697124 Apparatus for measuring stray light in lens module

US Patent 7697142 Calibration method for compensating for non-uniformity errors in sensors measuring specular reflection

US Patent 7705977 Methods for depth profiling in semiconductors using modulated optical reflectance technology

US Patent 7710558 Automated online measurement of glass part geometry

US Patent 7714992 Equipment and method for monitoring an immersion lithography device

US Patent 7714994 Beam splitter for optical measurement systems for determining the characteristics of machine tools

US Patent 7714997 Apparatus for inspecting defects

US Patent 7714999 High resolution wafer inspection system

US Patent 7715011 Methods for using light reflection patterns to determine location of pith and curvature of the annual ring

US Patent 7715023 Jig mounting apparatus

US Patent 7719668 Confocal fiber-optic laser device and method for intraocular lens power measurements

US Patent 7724360 Method and apparatus for inspecting foreign particle defects

US Patent 7724367 Particle monitors and method(s) therefor

US Patent 7728968 Excimer laser inspection system

US Patent 7733504 Shape evaluation method, shape evaluation device, and device having the shape evaluation device

US Patent 7738092 System and method for reducing speckle noise in die-to-die inspection systems

US Patent 7738098 Particle monitors and method(s) therefor

US Patent 7738105 System and method of applying horizontally oriented arc-lamps in ellipsometer or the like systems

US Patent 7738120 Method and apparatus for determining geometrical dimensions of a vehicle wheel

US Patent 7746459 Systems configured to inspect a wafer

US Patent 7746486 Pellet sorting by diameter measurement

US Patent 7751038 Apparatus and method for obtaining images of a borehole

US Patent 7751040 Microchip with expansion channel and flowcytometer using this microchip

US Patent 7755751 Optical inspection method and optical inspection apparatus

US Patent 7755754 Calibration device for use in an optical part measuring system

US Patent 7755774 Method and apparatus for noncontact relative rail displacement, track modulus and stiffness measurement by a moving rail vehicle

US Patent 7760342 Multidimensional spectrometer

US Patent 7764367 Surface inspection method and surface inspection apparatus

US Patent 7764388 Autofocus control voltage for indicating package dimensions

US Patent 7768634 Defects inspecting apparatus and defects inspecting method

US Patent 7768659 Determining copper concentration in spectra

US Patent 7773210 Appearance inspection apparatus

US Patent 7773225 Device for the optical analysis, including two-dimensional, of a thread or yarn

US Patent 7773235 Method and apparatus for vibration detection and vibration analysis, and lithographic apparatus equipped with such an apparatus

US Patent 7777877 High efficiency coupling optics for pumping and detection of fluorescence

US Patent 7777900 Method and system for optically inspecting parts

US Patent 7782452 Systems and method for simultaneously inspecting a specimen with two distinct channels

US Patent 7782462 Sono-photonic gas sensor

US Patent 7796242 Information identification device, information identification method, and information identification system

US Patent 7796249 Mask haze early detection

US Patent 7796253 Image forming apparatus for forming image on record medium

US Patent 7796264 Method and system for enhanced remote detection of low concentration vapors

US Patent 7800748 Edge inspection apparatus

US Patent 7804590 Multi mode inspection method and apparatus

US Patent 7804599 Fluid volume verification system

US Patent 7804602 Apparatus and method for relocating an articulating-arm coordinate measuring machine

US Patent 7812970 Method and system for inspecting parts utilizing triangulation

US Patent 7817266 Small volume cell

US Patent 7817288 Device and method for measuring profiles of electron beam and laser beam

US Patent 7821631 Architecture of laser sources in a flow cytometer

US Patent 7830508 Method and assembly for determining soot particles in a gas stream

US Patent 7830517 Flow schemes for enhanced light-target interaction in fluidic channels

US Patent 7830521 Detection apparatus, detection method, and optically transparent member

US Patent 7834990 Evaluation method for evaluating optical characteristics of optical system, evaluation method for evaluating projector, evaluation device for evaluating optical characteristics, and screen

US Patent 7834993 Surface inspection apparatus and surface inspection method

US Patent RE41949 System and method for tomographic imaging of dynamic properties of a scattering medium

US Patent 7839508 Surface plasmon resonance sensor and sensor chip

US Patent 7843558 Optical inspection tools featuring light shaping diffusers

US Patent 7843575 Reflective piano keyboard scanner

US Patent 7847946 Verification apparatus and methods for optical inspection machine

US Patent 7859657 Methods of making and using an apparatus and devices for placing light and sample in photo-emitting or absorbing devices

US Patent 7864306 Personal identification system

US Patent 7872747 Reflex sight

US Patent 7880887 Apparatus and method for measuring the concentration of gases in a sterilization chamber

US Patent 7884929 Blade breakage and abrasion detecting device

US Patent 7884948 Surface inspection tool and surface inspection method

US Patent 7894051 Reticle defect inspection apparatus and reticle defect inspection method

US Patent 7894060 Modular dust measurement

US Patent 7898650 Inspection method for transparent article

US Patent 7898660 Spectrometer designs

US Patent 7898667 Optical element and method for preparing the same, sensor apparatus and sensing method

US Patent 7903239 Porous photonic crystal with light scattering domains and methods of synthesis and use thereof

US Patent 7903244 Method for inspecting defect and apparatus for inspecting defect

US Patent 7903265 Method for measuring coating uniformity

US Patent 7911600 Apparatus and a method for inspection of a mask blank, a method for manufacturing a reflective exposure mask, a method for reflective exposure, and a method for manufacturing semiconductor integrated circuits

US Patent 7911601 Apparatus and method for inspecting pattern

US Patent 7911602 Inspection device for inspecting container closures

US Patent 7911609 Evaporative light scattering detector

US Patent 7911610 Optical measuring device

US Patent 7916289 Apparatus for quantifying shear stress on a formulation comprising biomolecules

US Patent 7916311 Method and system for inspecting blade tip clearance

US Patent 7920266 Detection element, detection apparatus for detecting target substance, method of detecting target substance and metal-containing member

US Patent 7924419 Illumination system for optical inspection

US Patent 7929121 Method and apparatus for detecting and counting platelets individually and in aggregate clumps

US Patent 7929123 Method and apparatus for measuring insertion loss in a fiber optic cable connection

US Patent 7929135 Method and apparatus for detecting size of particles in liquid

US Patent 7933005 Modified method and apparatus for measuring analytes

US Patent 7933009 Method and apparatus for verifying proper substrate positioning

US Patent 7933012 Microfluidic chip apparatuses, systems and methods having fluidic and fiber optic interconnections

US Patent 7944562 Device and method for the topographical determination of surface properties

US Patent 7944563 Sensing apparatus

US Patent 7944564 Device and method for acquiring information on objective substance to be detected by detecting a change of wavelength characteristics on the optical transmittance

US Patent 7948619 Cuvette and method for using the cuvette

US Patent 7948628 Window cleanliness detection system

US Patent 7948629 Microscope and method for total internal reflection-microscopy

US Patent 7948630 Auto focus of a workpiece using two or more focus parameters

US Patent 7952693 Detecting microorganisms in blood utilizing physical and chemical changes in blood

US Patent 7952703 Device and method for measuring microporous film on battery electrode plate, coater equipped with film measuring device, and coating method using film measuring method

US Patent 7952713 Bonding agent sticking inspection apparatus, mounting apparatus, and method of manufacturing electrical component

US Patent 7956989 Surface plasmon assisted microscope

US Patent 7961328 Multiple-angle retroreflectometer

US Patent 7965391 Airborne tunable mid-IR laser gas-correlation sensor

US Patent 7965395 Optical axis orientation measuring device, optical axis orientation measuring method, spherical surface wave device manufacturing device, and spherical surface wave device manufacturing method

US Patent 7969563 Lens measuring device and method applied therein

US Patent 7969565 Device for inspecting a surface

US Patent 7969567 Method and device for detecting shape of surface of medium

US Patent 7969584 Measuring method including measuring angle of concave portion and irradiating light over concave portion

US Patent 7969585 Geometric measurement system and method of measuring a geometric characteristic of an object

US Patent 7973917 Method using concentrator for measuring luminous flux of LED

US Patent 7973919 High resolution wafer inspection system

US Patent 7973923 Multi-port inline flow cell for use in monitoring multiple parameters in a sanitary process line

US Patent 7973934 Plasmon resonance sensor

US Patent 7978311 Method of locating an object in 3D

US Patent 7978326 DNA sequencing system

US Patent 7978328 Vision inspection system device and method

US Patent 7982867 Methods for depth profiling in semiconductors using modulated optical reflectance technology

US Patent 7982874 Method and apparatus for measuring particle sizes in a liquid field of the invention

US Patent 7982884 Autofocus system with error compensation

US Patent 7986404 Inspection system employing illumination that is selectable over a continuous range angles

US Patent 7986406 Method and apparatus for spectroscopic analysis

US Patent 7986417 Laser projection systems and methods

US Patent 7990529 Detection circuit and foreign matter inspection apparatus for semiconductor wafer

US Patent 7990530 Optical inspection method and optical inspection apparatus

US Patent 7991219 Method and apparatus for detecting positions of electrode pads

US Patent 7999941 Surface plasmon resonance sensor chip and surface plasmon resonance sensor

US Patent 7999942 Surface plasmon resonance sensor

US Patent 8004666 Apparatus for inspecting defects

US Patent 8004669 SPR apparatus with a high performance fluid delivery system

US Patent 8004764 Color compensating retinal safety filter

US Patent 8005290 Method for image calibration and apparatus for image acquiring

US Patent 8005291 Inspecting method by using mark partitioning