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Vinh P Nguyen

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Edits on 15 Dec, 2021
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Golden AI
edited on 15 Dec, 2021
Edits made to:
Infobox (-402 properties)
Infobox
Patent primary examiner of
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US Patent 11169181 Measuring system and method
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US Patent 7088090 Apparatus and method for monitoring power and current flow
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US Patent 7088124 Utilizing clock shield as defect monitor
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US Patent 7098648 Automatic range finder for electric current testing
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US Patent 7102379 Apparatus and method for monitoring and/or analysis of electrical machines during operation
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US Patent 7106044 Systems, methods, and apparatuses for detecting residential electricity theft in firmware
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US Patent 7106045 Apparatus for a simplified power disturbance indicator gage with learning capability options
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US Patent 7106048 Fault indicator with auto-configuration for overhead or underground application
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US Patent 7106079 Using an interposer to facilate capacitive communication between face-to-face chips
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US Patent 7106086 Method of dynamically switching voltage screen test levels based on initial device parameter measurements
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US Patent 7106089 Inspection device and inspection method for active matrix panel, and manufacturing method for active matrix organic light emitting diode panel
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US Patent 7109731 Membrane probing system with local contact scrub
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US Patent 7109732 Electronic component test apparatus
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US Patent 7109733 Test head docking system and method
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US Patent 7109737 Arrangements having IC voltage and thermal resistance designated on a per IC basis
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US Patent 7112950 Integrated circuit for use with an external hall sensor, and hall sensor module
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US Patent 7112979 Testing arrangement to distribute integrated circuits
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US Patent 7116125 Semiconductor test device using leakage current and compensation system of leakage current
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US Patent 7119564 Method and system for compensating thermally induced motion of probe cards
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US Patent 7119568 Methods for wafer level burn-in
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US Patent 7129695 Electrical test circuit with an active-load and an output sampling capability
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US Patent 11175336 System and method of automated burn-in testing on integrated circuit devices
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US Patent 7135878 Burn-in apparatus for burning MAC address
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US Patent 7138810 Probe station with low noise characteristics
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US Patent 7145355 Selectively configurable probe structures, e.g., for testing microelectronic components
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US Patent 7148709 Freely deflecting knee probe with controlled scrub motion
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US Patent 7148710 Probe tile for probing semiconductor wafer
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US Patent 7148714 POGO probe card for low current measurements
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US Patent 7148718 Articles of manufacture and wafer processing apparatuses
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US Patent 7154259 Isolation buffers with controlled equal time delays
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US Patent 7154260 Precision measurement unit having voltage and/or current clamp power down upon setting reversal
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US Patent 7157898 Magnetic flux concentrator anti-differential current sensing topology
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US Patent 7157923 Method for full wafer contact probing, wafer design and probe card device with reduced probe contacts
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US Patent 7161363 Probe for testing a device under test
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US Patent 7164263 Current sensor
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US Patent 7164279 System for evaluating probing networks
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US Patent 7167011 Differential measurement probe having retractable double cushioned variable spacing probing tips with EOS/ESD protection capabilities
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US Patent 7167015 Active cooling to reduce leakage power
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US Patent 7170304 Selectively configurable probe structures, e.g., selectively configurable probe cards for testing microelectronic components
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US Patent 7173440 Probing apparatus and test method including electrical shielding
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US Patent 7176672 DC current sensor
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US Patent 7176702 Contact system for wafer level testing
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US Patent 7180314 Self-calibrating electrical test probe calibratable while connected to an electrical component under test
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US Patent 7180318 Multi-pitch test probe assembly for testing semiconductor dies having contact pads
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US Patent 7187193 MCU test device for multiple integrated circuit chips
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US Patent 7193409 Measuring transformer utilizing a reference current
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US Patent 7199575 TFT-LCD source driver with built-in test circuit and method for testing the same
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US Patent 7199598 Burn-in substrate for semiconductor devices
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US Patent 7202657 Manual actuator for loading leadless microcircuit packages in a circuit tester
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US Patent 7202687 Systems and methods for wireless semiconductor device testing
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US Patent 7205783 Semiconductor integrated circuit, and electrostatic withstand voltage test method and apparatus therefor
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US Patent 7208936 Socket lid and test device
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US Patent 7211997 Planarity diagnostic system, E.G., for microelectronic component test systems
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US Patent 7212017 Electron beam apparatus with detailed observation function and sample inspecting and observing method using electron beam apparatus
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US Patent 7218131 Inspection probe, method for preparing the same, and method for inspecting elements
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US Patent 7221147 Method and socket assembly for testing ball grid array package in real system
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US Patent 7221174 Probe holder for testing of a test device
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US Patent 7224177 Apparatus and method for determining whether motor lock error occurs in sensorless motor
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US Patent 7227348 Apparatus for measuring an a.c. current in a cable
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US Patent 7227349 Method and apparatus for the digital and analog triggering of a signal analysis device
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US Patent 7227368 Testing head contact probe with an eccentric contact tip
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US Patent 7230443 Non-contact mobile charge measurement with leakage band-bending and dipole correction
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US Patent 7233161 Integrated circuit and associated packaged integrated circuit having an integrated marking apparatus
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US Patent 7233162 Arrangements having IC voltage and thermal resistance designated on a per IC basis
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US Patent 7239167 Utilizing clock shield as defect monitor
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US Patent 7245134 Probe card assembly including a programmable device to selectively route signals from channels of a test system controller to probes
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US Patent 7245136 Methods of processing a workpiece, methods of communicating signals with respect to a wafer, and methods of communicating signals within a workpiece processing apparatus
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US Patent 7245137 Test head assembly having paired contact structures
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US Patent 7248035 Automatic test equipment pin channel with T-coil compensation
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US Patent 7248062 Contactless charge measurement of product wafers and control of corona generation and deposition
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US Patent 7248067 Semiconductor device with test circuit disconnected from power supply connection
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US Patent 7250748 Integrated anti-differential current sensing system
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US Patent 7250750 System and method for testing and orientation of components for assembly
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US Patent 7253608 Planarity diagnostic system, e.g., for microelectronic component test systems
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US Patent 7253648 Signal acquisition probe having a retractable double cushioned probing tip with EOS/ESD protection capabilities
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US Patent 7253649 Automatic mercury probe for use with a semiconductor wafer
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US Patent 7256599 Protection circuit for semiconductor device and semiconductor device including the same
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US Patent 7259545 Integrated sensor
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US Patent 7259546 Temperature compensating integrated anti-differential current sensing system
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US Patent 7268567 Probe assembly with multi-directional freedom of motion and mounting assembly therefor
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US Patent 7271580 Apparatus and method for programmable trip settings in a faulted circuit indicator
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US Patent 7271603 Shielded probe for testing a device under test
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US Patent 7274186 Temperature compensated and self-calibrated current sensor
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US Patent 7274195 Semiconductor device test probe
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US Patent 7274197 Contact system for interfacing a semiconductor wafer to an electrical tester
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US Patent 7276894 Dynamic cradle assembly positioner system for positioning an electronic device test head
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US Patent 7276919 High density integral test probe
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US Patent 7276921 Probe of under side of component through opening in a printed circuit board
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US Patent 7276923 Semiconductor device test probe
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US Patent 7279884 Temperature compensated and self-calibrated current sensor using reference magnetic field
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US Patent 7279885 Temperature compensated current sensor using reference magnetic field
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US Patent 7279918 Methods for wafer level burn-in
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US Patent 7282945 Wafer scale high density probe assembly, apparatus for use thereof and methods of fabrication thereof
‌
US Patent 7285968 Apparatus and method for managing thermally induced motion of a probe card assembly
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US Patent 7285973 Methods for standardizing a test head assembly
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US Patent 7288954 Compliant contact pin test assembly and methods thereof
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US Patent 7294997 Electrical meter system with color coding features
‌
US Patent 7295025 Probe station with low noise characteristics
‌
US Patent 7298133 Magnetic flux concentrator anti-differential current sensor with flux concentrating recesses
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US Patent 7298135 Electronic revenue meter with automatic service sensing
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US Patent 7304488 Shielded probe for high-frequency testing of a device under test
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US Patent 7307443 Test socket for an integrated circuit
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US Patent 7312602 Electrical meter with retractable leads
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US Patent 7312618 Method and system for compensating thermally induced motion of probe cards
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US Patent 7312621 Semiconductor test unit having low contact resistance with examined electronic products, semiconductor contact board, method for testing semiconductor device, semiconductor device, and method for manufacturing thereof
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US Patent 7317326 Inspection device and inspection method for active matrix panel, and manufacturing method for active matrix organic light emitting diode panel
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US Patent 7319340 Integrated circuit load board and method having on-board test circuit
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US Patent 7321226 Temperature compensated and self-calibrated current sensor using reference current
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US Patent 7321227 Measuring electrical current flowing through a conductor
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US Patent 7321233 System for evaluating probing networks
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US Patent 7321235 Input circuit for an integrated circuit
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US Patent 7323895 Low-current pogo probe card
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US Patent 7327155 Elastic metal gate MOS transistor for surface mobility measurement in semiconductor materials
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US Patent 7327156 LSI testing apparatus for testing an electronic device
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US Patent 7330039 Method for making a socket to perform testing on integrated circuits
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US Patent 7330046 Circuits and methods for failure prediction of parallel MOSFETs
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US Patent RE40105 Probe card having groups of probe needles in a probing test apparatus for testing semiconductor integrated circuits
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US Patent 7342408 Semiconductor test device using leakage current and compensation system of leakage current
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US Patent 7345494 Probe tile for probing semiconductor wafer
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US Patent 7345497 Protection circuit for semiconductor device and semiconductor device including the same
‌
US Patent 7345498 Method and measurement program for burn-in test of two semiconductor devices simultaneously
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US Patent 7352195 Electron beam apparatus with detailed observation function and sample inspecting and observing method using electron beam apparatus
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US Patent 7355384 Apparatus, method, and computer program product for monitoring and controlling a microcomputer using a single existing pin
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US Patent 7355386 Method of automatically carrying IC-chips, on a planar array of vacuum nozzles, to a variable target in a chip tester
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US Patent 7355429 On-chip power supply noise detector
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US Patent 7355431 Test arrangement including anisotropic conductive film for testing power module
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US Patent 7358751 Contact pin assembly and contactor card
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US Patent 7362092 Isolation buffers with controlled equal time delays
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US Patent 7362093 IC selectively connecting logic and bypass conductors between opposing pads
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US Patent 7362116 Method for probing impact sensitive and thin layered substrate
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US Patent 7362118 Probe with contact ring
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US Patent 11181574 Testing device includes radiation shields for testing integrated circuits on a wafer
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US Patent 7365550 Low impedance test fixture for impedance measurements
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US Patent 7368924 Probe structure having a plurality of discrete insulated probe tips projecting from a support surface, apparatus for use thereof and methods of fabrication thereof
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US Patent 7372252 Automated platform for electronic apparatus environmental testing & method of use
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US Patent 7372285 Socket-less test board and clamp for electrical testing of integrated circuits
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US Patent 7378859 System and method for estimation of integrated circuit signal characteristics using optical measurements
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US Patent 7382117 Delay circuit and test apparatus using delay element and buffer
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US Patent 7385385 System for testing DUT and tester for use therewith
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US Patent 7388366 Test system connection system with triaxial cables
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US Patent 7388389 Electronic probe apparatus
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US Patent 7394241 Method and apparatus for testing power switches using a logic gate tree
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US Patent 7394269 Probe for testing a device under test
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US Patent 7394276 Active cancellation matrix for process parameter measurements
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US Patent 7397235 Pin electronic for automatic testing of integrated circuits
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US Patent 7397258 Burn-in system with heating blocks accommodated in cooling blocks
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US Patent 7397261 Monitoring system for detecting and characterizing classes of leakage in CMOS devices
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US Patent 7397266 System and method for testing the electromagnetic susceptibility of an electronic display unit
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US Patent 7400162 Integrated circuit testing methods using well bias modification
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US Patent 7402994 Self-cleaning lower contact
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US Patent 7402995 Jig device for transporting and testing integrated circuit chip
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US Patent 7403024 Contactor having contact electrodes of metal springs embedded in a plate-like structure
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US Patent 7408372 Method and apparatus for measuring device mismatches
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US Patent 7408376 Array substrate
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US Patent 7411383 Method and apparatus for discharging voltages from a circuit under test
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US Patent 7411409 Digital leakage detector that detects transistor leakage current in an integrated circuit
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US Patent 7411410 LCD test device and test process thereof
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US Patent 7417445 Probing method and prober for measuring electrical characteristics of circuit devices
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US Patent 7420379 Semiconductor device test method and semiconductor device tester
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US Patent 7420382 Apparatus and method for testing semiconductor chip
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US Patent 7423443 Method of performing parallel test on semiconductor devices by dividing voltage supply unit
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US Patent 7425820 High current measurement with temperature compensation
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US Patent 7425837 Spatial transformer for RF and low current interconnect
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US Patent 7427855 Circuit for measuring inrush current
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US Patent 7427870 Test system for testing integrated circuits and a method for configuring a test system
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US Patent 7432700 Surface inspection apparatus
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US Patent 7436191 Differential measurement probe having a ground clip system for the probing tips
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US Patent 7436192 Probe skates for electrical testing of convex pad topologies
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US Patent 7436194 Shielded probe with low contact resistance for testing a device under test
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US Patent 7436195 Test apparatus for semiconductor elements on a semiconductor wafer, and a test method using the test apparatus
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US Patent 7436197 Virtual test head for IC
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US Patent 7439728 System and method for test socket calibration using composite waveform
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US Patent 7439752 Methods of providing semiconductor components within sockets
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US Patent 7439753 Inverter test device and a method thereof
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US Patent 7443185 Apparatus and method for the application of prescribed, predicted, and controlled contact pressure on wires
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US Patent 7443187 On-chip power supply noise detector
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US Patent 7443189 Method to detect and predict metal silicide defects in a microelectronic device during the manufacture of an integrated circuit
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US Patent 7446548 Elastic micro probe and method of making same
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US Patent 7449899 Probe for high frequency signals
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US Patent 7453259 Loading a socket and/or adapter device with a semiconductor component
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US Patent 7456639 Compliant contact structure
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US Patent 7456641 Probe card that controls a temperature of a probe needle, test apparatus having the probe card, and test method using the test apparatus
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US Patent 7459922 Microcontactor probe assembly having a plunger and electric probe unit using the same
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US Patent 7459923 Probe interposers and methods of fabricating probe interposers
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US Patent 7463041 High-density electroconductive contact probe with uncompressed springs
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US Patent 7466122 Test head docking system and method
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US Patent 7466161 Direct detect sensor for flat panel displays
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US Patent 7468602 Digital multi-meter
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US Patent 7477061 Probe card
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US Patent 7479781 System and method for testing a link control card
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US Patent 7482823 Shielded probe for testing a device under test
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US Patent 7482828 Methods and apparatus for device testing at the wafer level
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US Patent 7486092 Apparatus for supporting semiconductor devices during testing
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US Patent 7486096 Method and apparatus for testing to determine minimum operating voltages in electronic devices
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US Patent 7486098 Integrated circuit testing method using well bias modification
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US Patent 7486102 Method and apparatus for testing liquid crystal display
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US Patent 7489149 Shielded probe for testing a device under test
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US Patent 7492176 Prober and probe contact method
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US Patent 7492178 Method and apparatus for testing a hall magnetic field sensor on a wafer
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US Patent 7498801 Apparatus, method, and computer program product for monitoring and controlling a microcomputer using a single existing pin
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US Patent 7498829 Shielded probe for testing a device under test
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US Patent 7501841 Probe assembly with multi-directional freedom of motion and mounting assembly therefor
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US Patent 7501842 Shielded probe for testing a device under test
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US Patent 7504821 Auxiliary power supply for supplying power to additional functions within a meter
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US Patent 7504839 Flexible circuit with micro-sized probe tips and a method of making the same
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US Patent 7504842 Probe holder for testing of a test device
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US Patent 7504846 Testable cascode circuit and method for testing the same using a group of switching elements
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US Patent 7504847 Mechanism for detection and compensation of NBTI induced threshold degradation
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US Patent 7504849 On failure detecting apparatus of power supply circuit
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US Patent 11187730 Probe head, probe coupler and probe arrangement
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US Patent 7518354 Multi-substrate integrated sensor
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US Patent 7518387 Shielded probe for testing a device under test
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US Patent 7528615 Measurement method of the current-voltage characteristics of photovoltaic devices, a solar simulator for the measurement, and a module for setting irradiance and a part for adjusting irradiance used for the solar simulator
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US Patent 7535238 In-line electron beam test system
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US Patent 7535243 Method and program for controlling an apparatus for measurement of characteristics of a semiconductor device under test
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US Patent 7535246 Computing the characteristics of a field-effect-transistor (FET)
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US Patent 7538542 Test handler and operation method thereof
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US Patent 7538565 High density integrated circuit apparatus, test probe and methods of use thereof
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US Patent 7541801 Probe card transfer assist apparatus, and inspection equipment and method using same
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US Patent 7541821 Membrane probing system with local contact scrub
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US Patent 7541824 Forced air cooling of components on a probecard
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US Patent 7548055 Testing an electronic device using test data from a plurality of testers
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US Patent 7548078 Performance board for electronically connecting a device under test with a test apparatus for testing a device under test
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US Patent 7548083 Test apparatus having auto probe that contacts a display device and test method using the same
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US Patent 7550982 Semiconductor device test method for comparing a first area with a second area
‌
US Patent 7550983 Membrane probing system with local contact scrub
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US Patent 7550984 Probe station with low noise characteristics
‌
US Patent 7554350 Burn-in system with heating blocks accommodated in cooling blocks
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US Patent 7554352 Method for determining information about the internal workings of a chip based on electro-magnetic emissions therefrom
‌
US Patent 7560941 Method and system for compensating thermally induced motion of probe cards
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US Patent 7560942 Probe receptacle for mounting a probe for testing semiconductor components, probe holder arm and test apparatus
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US Patent 7560944 Differential measurement probe having a ground clip system for the probing tips
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US Patent 7564256 Integrated circuit testing methods using well bias modification
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US Patent 7567075 Single latch manual actuator for testing microcircuits, and having a mechanical interlock for controlling opening and closing
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US Patent 7573281 Probe for inspecting one or more semiconductor chips
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US Patent 7573283 Method for measurement of a device under test
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US Patent 7576551 Test socket and test board for wafer level semiconductor testing
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US Patent 7583094 Method for fabricating light-emitting device through inspection
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US Patent 7583099 Method for re-registering an object to be aligned by re-capturing images using previously registered conditions and storage medium storing a program for executing the method
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US Patent 7586300 Isolation buffers with controlled equal time delays
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US Patent 7586317 Inspection apparatus, probe card and inspection method
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US Patent 7586318 Differential measurement probe having a ground clip system for the probing tips
‌
US Patent 7589548 Design-for-test micro probe
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US Patent 7592821 Apparatus and method for managing thermally induced motion of a probe card assembly
‌
US Patent 7592822 Probing adapter for a signal acquisition probe having pivoting, compliant, variable spacing probing tips
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US Patent 7592823 Electrical component handler having self-cleaning lower contact
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US Patent 7592825 Methods and systems for semiconductor diode junction screening and lifetime estimation
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US Patent 7595629 Method and apparatus for calibrating and/or deskewing communications channels
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US Patent 7595650 Magnetic field probe apparatus and a method for measuring magnetic field
‌
US Patent 7612571 System and method for estimation of integrated circuit signal characteristics using optical measurements
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US Patent 7616019 Low profile electronic assembly test fixtures
‌
US Patent 7622942 Method and apparatus for measuring device mismatches
‌
US Patent RE41016 Probe card having groups of probe needles in a probing test apparatus for testing semiconductor integrated circuits
‌
US Patent 7626413 Parallel testing of semiconductor devices using a dividing voltage supply unit
‌
US Patent 7633309 Inspection method, inspection apparatus and computer-readable storage medium storing program for inspecting an electrical property of an object
‌
US Patent 7635973 Electronic component handler test plate
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US Patent 7635986 Power source noise measuring device, integrated circuit, and semiconductor device
‌
US Patent 7639000 Apparatus for electronically measuring or distributing electrical energy
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US Patent 7639029 Heat sink pedestal with interface medium chamber
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US Patent 7642794 Method and system for compensating thermally induced motion of probe cards
‌
US Patent 7642795 Drive method and drive circuit of peltier element, attaching structure of peltier module and electronic device handling apparatus
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US Patent 7649348 Auxiliary element for fixing a current sensor to an electrical conductor
‌
US Patent 7649367 Low profile probe having improved mechanical scrub and reduced contact inductance
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US Patent 7649374 Temperature control in an integrated circuit
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US Patent 7649377 Test structure
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US Patent 7656151 Printed circuit board with an opening to access components attached to the printed circuit board
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US Patent 7656170 Multiple directional scans of test structures on semiconductor integrated circuits
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US Patent 7659735 Probe card capable of multi-probing
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US Patent 7659736 Mechanically reconfigurable vertical tester interface for IC probing
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US Patent 7659739 Knee probe having reduced thickness section for control of scrub motion
‌
US Patent 7659743 Method and apparatus for testing electronic components within horizontal and vertical boundary lines of a wafer
‌
US Patent 7671617 Test system to test multi-chip package compensating a signal distortion
‌
US Patent 7675301 Electronic components with plurality of contoured microelectronic spring contacts
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US Patent 7675304 Probe assembly with multi-directional freedom of motion and mounting assembly therefor
‌
US Patent 7679358 System and method for voltage noise and jitter measurement using time-resolved emission
‌
US Patent 7679386 Probe card including contactors formed projection portion
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US Patent 7679387 Inspection method, inspection apparatus, and control program for performing electrical inspection by using probe
‌
US Patent 7679393 Testing apparatus for fixing and testing a LCD panel
‌
US Patent 7688060 Electronic revenue meter with automatic service sensing
‌
US Patent 7688061 Apparatus for electronically measuring electrical energy
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US Patent 7688087 Test apparatus
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US Patent 7688089 Compliant membrane thin film interposer probe for intergrated circuit device testing
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US Patent 7688098 Power supply noise measuring circuit and power supply noise measuring method
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US Patent 7692421 Control meter with safety deactivation
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US Patent 7692433 Sawing tile corners on probe card substrates
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US Patent 7692435 Probe card and probe device for inspection of a semiconductor device
‌
US Patent 7696742 Method and circuit for reducing noise when measuring intensity of electric current
‌
US Patent 7696744 Screw-less latching system for securing load boards
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US Patent 7701199 Modular meter configuration and methodology
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US Patent 7719259 Temperature stable current sensor system
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US Patent 7719294 Systems configured to perform a non-contact method for determining a property of a specimen
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US Patent 7719297 Probe apparatus and method for measuring electrical characteristics of chips and storage medium therefor
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US Patent 7719299 Process and temperature insensitive flicker noise monitor circuit
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US Patent 7733101 Knee probe having increased scrub motion
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US Patent 7733109 Test structure for resistive open detection using voltage contrast inspection and related methods
‌
US Patent 7737708 Contact for use in testing integrated circuits
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US Patent 7737711 Test apparatus having pogo probes for chip scale package
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US Patent 7741834 Method to monitor substrate viability by a sensor mounted to a substrate
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US Patent 7741862 Semiconductor device including a signal generator activated upon occurring of a timing signal
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US Patent 7746053 Tester for RF devices
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US Patent 7746054 System and method for detecting the presence of an unsafe line condition in a disconnected power meter
‌
US Patent 7746056 Integrated sensor
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US Patent 7746061 Method of performing signal-measured calibration
‌
US Patent 7746062 Radio frequency testing system and testing circuit utilized thereby
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US Patent 7746088 In-line electron beam test system
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US Patent 7746093 Driving chip package, display device including the same, and method of testing driving chip package
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US Patent 7750622 Method of applying the analysis of scrub mark morphology and location to the evaluation and correction of semiconductor testing, analysis and manufacture
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US Patent 7750658 Integrated circuit and testing circuit therein for testing and failure analysis
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US Patent 7755373 Device and method for sensing topographical variations on a surface using a probe
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US Patent 7755375 Test apparatus, probe card, and test method
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US Patent 7759949 Probes with self-cleaning blunt skates for contacting conductive pads
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US Patent 7759950 Electronic component device testing apparatus
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US Patent 7759957 Method for fabricating a test structure
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US Patent 7759960 Integrated circuit testing methods using well bias modification
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US Patent 7768255 Interconnection substrate, skew measurement method, and test apparatus
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US Patent 7772829 Power meter and method for measuring power consumption
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US Patent 7772864 Contact probe with reduced voltage drop and heat generation
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US Patent 7777513 Power supply voltage detection circuit and semiconductor integrated circuit device
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US Patent 7777514 Methods for transferring integrated circuits to a printed circuit board
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US Patent 7786743 Probe tile for probing semiconductor wafer
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US Patent 7795896 High-power optical burn-in
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US Patent 7800383 Apparatus and method for testing keyboard of mobile phone
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US Patent 7800391 Apparatus for testing a chip and methods of making and using the same
‌
US Patent 7804316 Pusher, pusher unit and semiconductor testing apparatus
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US Patent 7816907 Integrated circuit with a measuring circuit and method of configuring an integrated circuit with a measuring circuit
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US Patent 7816930 High temperature range electrical circuit testing
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US Patent 7821253 Direct current measuring device having magnetic sensors for current generated magnetic fields
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US Patent 7821255 Test system with wireless communications
‌
US Patent 7821276 Method and article of manufacture to generate IC test vector for synchronized physical probing
‌
US Patent 7821284 Semiconductor test head apparatus using field programmable gate array
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US Patent 7821286 Testing device for performing a test on a liquid crystal display and a method of driving the testing device
‌
US Patent 7834650 Method and apparatus for testing liquid crystal display using probe unit reduced the number of connecter pads
‌
US Patent 7839158 Method of detecting abnormality in burn-in apparatus
‌
US Patent 7839159 ZQ calibration circuit and a semiconductor device including a ZQ calibration circuit
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US Patent 7843189 Current sensor having coil mounted to current carrying bus and related system
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US Patent 7843203 Support member assembly having reinforcement member for conductive contact members
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US Patent 7847537 Electricity meter with resilient connectors
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US Patent 7847538 Testing micromirror devices
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US Patent 7847567 Verifying a printed circuit board manufacturing process prior to electrical intercoupling
‌
US Patent 7852094 Sharing resources in a system for testing semiconductor devices
‌
US Patent 7852096 Spring-loaded, removable test fixture for circuit board testers
‌
US Patent 7852101 Semiconductor device testing apparatus and power supply unit for semiconductor device testing apparatus
‌
US Patent 7855546 Current sensor having core with magnetic gap
‌
US Patent 7855571 Testing circuit board for preventing tested chip positions from being wrongly positioned
‌
US Patent 7859278 Probe holder for a probe for testing semiconductor components
‌
US Patent 7859279 Charge eliminating apparatus and method, and program storage medium
‌
US Patent 7859288 Test apparatus and test method for testing a device based on quiescent current
‌
US Patent 7863886 Method for determining the resonant frequency(s) of an energized power line carrier line (wave) trap
‌
US Patent 7863887 State detection device for detecting abnormal operation of a high-frequency magnetron heating apparatus
‌
US Patent 7863912 Circuit board testing system using free space optical communications
‌
US Patent 7863922 Evaluation method of insulating film and measurement circuit thereof
‌
US Patent 7872485 System and method for use in functional failure analysis by induced stimulus
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US Patent 7876086 Current measuring device for measuring the electrical current flowing in an electrical conductor electrically isolated from the current measuring device
‌
US Patent 7876118 Test equipment
‌
US Patent 7884631 Parking structure memory-module tester that moves test motherboards along a highway for remote loading/unloading
‌
US Patent 7888954 Method of utilizing an interposer in an automated test system and an automated test system having an interposer
‌
US Patent 7888957 Probing apparatus with impedance optimized interface
‌
US Patent 7893704 Membrane probing structure with laterally scrubbing contacts
‌
US Patent 7898271 Position changing apparatus for test handler and power transferring apparatus
‌
US Patent 7898273 Probe for testing a device under test
‌
US Patent 7902816 Electromagnetic tracking method and apparatus for compensation of metal artifacts using modular arrays of reference sensors
‌
US Patent 7906980 Rapid sweeping load testing circuit and method
‌
US Patent 7915905 Process and temperature insensitive flicker noise monitor circuit
‌
US Patent 7919973 Method and apparatus for monitoring via's in a semiconductor fab
‌
US Patent 7924035 Probe card assembly for electronic device testing with DC test resource sharing
‌
US Patent 7924043 Method and product for testing a device under test
‌
US Patent 7928745 Endurance testing system and method
‌
US Patent 7928753 Device and method for evaluating electrostatic discharge protection capabilities
‌
US Patent 7932733 Apparatus for detecting defect by examining electric characteristics of a semiconductor device
‌
US Patent 7940039 Transformer meter and system for using same
‌
US Patent 7940065 Probe apparatus and method for measuring electrical characteristics of chips
‌
US Patent 7944224 Low profile probe having improved mechanical scrub and reduced contact inductance
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US Patent 7948227 Electrical circuit diagnostic tool
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US Patent 7948228 Technique for measuring power source noise generated inside integrated circuit
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US Patent 7948256 Measurement apparatus, test system, and measurement method for measuring a characteristic of a device
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US Patent 7952369 Device and method for sensing a position of a probe
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US Patent 7952370 On-chip detection of power supply vulnerabilities
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US Patent 7956629 Probe tile for probing semiconductor wafer
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US Patent 7960966 State detection device for detecting operation state of high-frequency heating apparatus
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US Patent 7960969 Electromagnetic imaging method and device
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US Patent 7960990 Closed-grid bus architecture for wafer interconnect structure
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US Patent 7960993 Method for capacitive testing of flat panel displays
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US Patent 7960995 Testing apparatus and testing method
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US Patent 7965088 Method for determining the type of connection of at least two electrical devices and system comprising several electric devices
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US Patent 7965093 Test apparatus and test method for testing a device under test using a multi-strobe
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US Patent 7969169 Semiconductor integrated circuit wafer, semiconductor integrated circuit chip, and method of testing semiconductor integrated circuit wafer
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US Patent 7969170 Microcontactor probe with reduced number of sliding contacts for Conduction, and electric probe unit
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US Patent 7969171 Test circuit and system
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US Patent 7973546 In-line electron beam test system
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US Patent 7986155 Method of manufacturing a heat sink pedestal device with interface medium chamber
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US Patent 7994803 Calibration substrate
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US Patent 7999532 Apparatus for electronically measuring or distributing electrical energy
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US Patent 7999556 Method and apparatus for identifying and selecting proper cable connections
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US Patent 7999563 Chuck for supporting and retaining a test substrate and a calibration substrate
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US Patent 7999566 Wafer level testing
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US Patent 8004292 Electrical penetration graph system
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US Patent 8004302 Semiconductor device including switch for coupling power line
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US Patent 8008911 Method and device for the determination of the road clearance of a vehicle
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US Patent 8008922 Ballast and wiring lamp fixture tester
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US Patent 8008935 Tester and a method for testing an integrated circuit
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US Patent 8008937 Diagnosis board electrically connected with a test apparatus for testing a device under test
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US Patent 8008940 Circuit board test system and test method
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US Patent 8008935 Tester and a method for testing an integrated circuit
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US Patent 8008940 Circuit board test system and test method
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US Patent 8008922 Ballast and wiring lamp fixture tester
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edited on 8 Dec, 2021
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US Patent 8008911 Method and device for the determination of the road clearance of a vehicle
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edited on 8 Dec, 2021
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Patent primary examiner of
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US Patent 8004302 Semiconductor device including switch for coupling power line
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Patent primary examiner of
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US Patent 8004292 Electrical penetration graph system
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US Patent 7999563 Chuck for supporting and retaining a test substrate and a calibration substrate
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Patent primary examiner of
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US Patent 7999556 Method and apparatus for identifying and selecting proper cable connections
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edited on 8 Dec, 2021
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Patent primary examiner of
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US Patent 7999566 Wafer level testing
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edited on 8 Dec, 2021
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Patent primary examiner of
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US Patent 7999532 Apparatus for electronically measuring or distributing electrical energy
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edited on 8 Dec, 2021
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Infobox
Patent primary examiner of
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US Patent 7994803 Calibration substrate
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edited on 8 Dec, 2021
Edits made to:
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Infobox
Patent primary examiner of
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US Patent 7986155 Method of manufacturing a heat sink pedestal device with interface medium chamber
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Golden AI
edited on 8 Dec, 2021
Edits made to:
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Infobox
Patent primary examiner of
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US Patent 7973546 In-line electron beam test system
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edited on 8 Dec, 2021
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edited on 8 Dec, 2021
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US Patent 7969171 Test circuit and system
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US Patent 7965093 Test apparatus and test method for testing a device under test using a multi-strobe
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