Log in
Sign up
Golden has been acquired by ComplyAdvantage.Read about it here ⟶
‌

Minh N. Tang

OverviewStructured DataIssuesContributorsActivity

All edits

Edits on 14 Dec, 2021
"Remove inverse infobox"
Golden AI profile picture
Golden AI
edited on 14 Dec, 2021
Edits made to:
Infobox (-450 properties)
Infobox
Patent primary examiner of
‌
US Patent 7091715 Method and apparatus for micro-machined sensors using enhanced modulated integrative differential optical sensing
‌
US Patent 7091739 System and method for detecting an operational fault condition in a power supply
‌
US Patent 7098678 Multiple local probe measuring device and method
‌
US Patent 7102378 Testing apparatus and method for thin film transistor display array
‌
US Patent 7106050 Apparatus for shielding a device under test from electromagnetic waves
‌
US Patent 7106083 Testing system and testing method for DUTs
‌
US Patent 7109700 Multimeter having off-device display device and selection device
‌
US Patent 7109740 Method for retesting semiconductor device
‌
US Patent 7112951 MEMS based current sensor using magnetic-to-mechanical conversion and reference components
‌
US Patent 7112953 Method for detecting epitaxial (EPI) induced buried layer shifts in semiconductor devices
‌
US Patent 7112983 Apparatus and method for single die backside probing of semiconductor devices
‌
US Patent 7112987 Semiconductor sensor with a field-effect transistor
‌
US Patent 7116120 Clamping test fixture for a high frequency miniature probe assembly
‌
US Patent 7119569 Real-time in-line testing of semiconductor wafers
‌
US Patent 7126363 Die carrier
‌
US Patent 7129697 Dynamic register with IDDQ testing capability
‌
US Patent 7129724 Plasma probe
‌
US Patent 7132834 Capacitive sensor measurement method for discrete time sampled system for in-circuit test
‌
US Patent 7132843 Method and apparatus for positioning a test head on a printed circuit board
‌
US Patent 7135850 Electricity meter with power supply load management
‌
US Patent 7135853 Semiconductor test system
‌
US Patent 7135881 Method and system for producing signals to test semiconductor devices
‌
US Patent 7135882 Semiconductor integrated circuit device and control method for the semiconductor integrated circuit device
‌
US Patent 7141996 Flip chip test structure
‌
US Patent 7142003 Test apparatus
‌
US Patent 7145357 Mother substrate, substrate for display panel and method of manufacturing display panel
‌
US Patent 7151389 Dual channel source measurement unit for semiconductor device testing
‌
US Patent 7154287 Method and apparatus for light-controlled circuit characterization
‌
US Patent 7154288 Method and an apparatus for testing transmitter and receiver
‌
US Patent 7154292 Method of detecting defects in TFT-arrays and a TFT-array testing system incorporating the same
‌
US Patent 7157921 TFT array inspection apparatus
‌
US Patent 7157926 Universal padset concept for high-frequency probing
‌
US Patent 7161346 Method of holding an electronic component in a controlled orientation during parametric testing
‌
US Patent 7164264 Dynamic silicon characterization observability using functional clocks for system or run-time process characterization
‌
US Patent 7164284 Dynamic gamma for a liquid crystal display
‌
US Patent 7167010 Pin-in elastomer electrical contactor and methods and processes for making and using the same
‌
US Patent 7170276 Device for compensating for heat deviation in a modular IC test handler
‌
US Patent 7170305 Apparatus and method for terminating probe apparatus of semiconductor wafer
‌
US Patent 7173446 Mechanism to stabilize power delivered to a device under test
‌
US Patent 7180282 Apparatus for metering at least one type of electrical power over a predetermined range of service voltages
‌
US Patent 7180312 Probe card and method for manufacturing probe card
‌
US Patent 7180315 Substrate with patterned conductive layer
‌
US Patent 7183787 Contact resistance device for improved process control
‌
US Patent 7183788 Wireless radio frequency technique design and method for testing of integrated circuits and wafers
‌
US Patent 7190186 Method and apparatus for determining concentration of defects and/or impurities in a semiconductor wafer
‌
US Patent 7199599 Integrated circuit socket with removable support
‌
US Patent 7205758 Systems and methods for adjusting threshold voltage
‌
US Patent 7208965 Planar view TEM sample preparation from circuit layer structures
‌
US Patent 7212020 Device and method for isolating a short-circuited integrated circuit (IC) from other ICs on a semiconductor wafer
‌
US Patent 7212021 Manufacturing integrated circuits and testing on-die power supplies using distributed programmable digital current sinks
‌
US Patent 7215134 Apparatus for determining burn-in reliability from wafer level burn-in
‌
US Patent 7218092 Magnetic bridge type current sensor, magnetic bridge type current detecting method, and magnetic bridge for use in that sensor and detecting method
‌
US Patent 7218097 Wafer test equipment and method of aligning test equipment
‌
US Patent 7218127 Method and apparatus for probing an electronic device in which movement of probes and/or the electronic device includes a lateral component
‌
US Patent 7221144 Micro-electromechanical system (MEMS) based current and magnetic field sensor having improved sensitivities
‌
US Patent 7221179 Bendable conductive connector
‌
US Patent 7227370 Semiconductor inspection apparatus and manufacturing method of semiconductor device
‌
US Patent 7233163 Mapping variations in local temperature and local power supply voltage that are present during operation of an integrated circuit
‌
US Patent 7235988 Method for generating high-contrast images of semiconductor sites via one-photon optical beam-induced current imaging and confocal reflectance microscopy
‌
US Patent 7235996 Functionality test method
‌
US Patent 7235997 CMOS leakage current meter
‌
US Patent 7245138 POGO pin and test socket including the same
‌
US Patent 7245141 Shared bond pad for testing a memory within a packaged semiconductor device
‌
US Patent 7248063 Plasma probe systems
‌
US Patent 7248068 Semiconductor device and method for testing semiconductor device
‌
US Patent 7250785 Method and apparatus for inspecting printed circuit boards
‌
US Patent 7253650 Increase productivity at wafer test using probe retest data analysis
‌
US Patent 7256573 Distributed active transformer power control techiques
‌
US Patent 7256591 Probe card, having cantilever-type probe and method
‌
US Patent 7259579 Method and apparatus for semiconductor testing utilizing dies with integrated circuit
‌
US Patent 7259582 Bonding pads for testing of a semiconductor device
‌
US Patent 7262612 Methods for evaluating characteristics of a plasma or the effects of a plasma on a substrate
‌
US Patent 7262621 Method and apparatus for integrated mixed-signal or analog testing
‌
US Patent 7262625 Increased yield manufacturing for integrated circuits
‌
US Patent 7265562 Cantilever microprobes for contacting electronic components and methods for making such probes
‌
US Patent 7265565 Cantilever microprobes for contacting electronic components and methods for making such probes
‌
US Patent 7265566 Semiconductor component arrangement having a temperature-based defect identification
‌
US Patent 7265570 Integrated circuit testing module
‌
US Patent 7265572 Image display device and method of testing the same
‌
US Patent 7268574 Systems and methods for sensing obstructions associated with electrical testing of microfeature workpieces
‌
US Patent 7271602 Probe card assembly and method of attaching probes to the probe card assembly
‌
US Patent 7274201 Method and system for stressing semiconductor wafers during burn-in
‌
US Patent 7276926 Method for isolating a short-circuited integrated circuit (IC) from other ICs on a semiconductor wafer
‌
US Patent 7276927 Device and method for isolating a short-circuited integrated circuit (IC) from other ICs on a semiconductor wafer
‌
US Patent 7276928 System and method for testing devices utilizing capacitively coupled signaling
‌
US Patent 7279886 Slidable mounting plate
‌
US Patent 7279912 Dual arcuate blade probe tip
‌
US Patent 7282905 System and method for IDDQ measurement in system on a chip (SOC) design
‌
US Patent 7282933 Probe head arrays
‌
US Patent 7282936 Die design with integrated assembly aid
‌
US Patent 7282937 On-chip frequency degradation compensation
‌
US Patent 7282938 Testing apparatus and method for providing temperature stress to electronic component
‌
US Patent 7282940 Semiconductor device with electrode pads for test probe
‌
US Patent 7285947 Power metering using current-indicative signal
‌
US Patent 7288951 Burn-in system having multiple power modes
‌
US Patent 7288956 Device and method for detecting rotor speed of a multiple phase motor with bipolar drive
‌
US Patent 7292055 Interposer for use with test apparatus
‌
US Patent 7295020 Cap at resistors of electrical test probe
‌
US Patent 7295022 Method and system for automatically determining electrical properties of a semiconductor wafer or sample
‌
US Patent 7295024 Contact signal blocks for transmission of high-speed signals
‌
US Patent 7301325 Method and apparatus for creating performance limits from parametric measurements
‌
US Patent 7301358 Contactor assembly for testing electrical circuits
‌
US Patent 7307438 Thermal transferring member, test board and test apparatus
‌
US Patent 7307440 Semiconductor integrated circuit tester with interchangeable tester module
‌
US Patent 7307442 Integrated circuit test array including test module
‌
US Patent 7309980 Current sensing circuit for use in a current measurement probe
‌
US Patent 7309999 Electronic device having an interface supported testing mode
‌
US Patent 7310000 Integrated circuit testing module including command driver
‌
US Patent 7312604 Portable manipulator for stackable semiconductor test system
‌
US Patent 7312619 Multiple local probe measuring device and method
‌
US Patent 7315161 Micro-electromechanical system (MEMS) based current and magnetic field sensor having capacitive sense components
‌
US Patent 7315175 Probe apparatus and method for examining a sample
‌
US Patent 7315176 Electrical test probes, methods of making, and methods of using
‌
US Patent 7315179 System for isolating a short-circuited integrated circuit (IC) from other ICs on a semiconductor wafer
‌
US Patent 7317323 Signal test procedure for testing semi-conductor components and a test apparatus for testing semi-conductor components
‌
US Patent 7317325 Line short localization in LCD pixel arrays
‌
US Patent 7319338 Chip tester for testing validity of a chipset
‌
US Patent 7323892 Probe having a frame to align spring pins perpendicularly to a printed circuit board, and method of making same
‌
US Patent 7323894 Needle alignment verification circuit and method for semiconductor device
‌
US Patent 7323896 Device and method for isolating a short-circuited integrated circuit (IC) from other ICs on a semiconductor wafer
‌
US Patent 7330041 Localizing a temperature of a device for testing
‌
US Patent 7332905 Fixture for circuit board
‌
US Patent 7332924 Embedded test circuitry and a method for testing a semiconductor device for breakdown, wearout or failure
‌
US Patent 7332925 Engaging device of circuit board
‌
US Patent 7336063 Voltage detector
‌
US Patent 7339392 Apparatus measuring substrate leakage current and surface voltage and related method
‌
US Patent 7339393 Gate drive circuit for an insulated gate power transistor
‌
US Patent 7342406 Methods and apparatus for inline variability measurement of integrated circuit components
‌
US Patent 7348769 Electricity meter with power supply load management
‌
US Patent 7352169 Testing components of I/O paths of an integrated circuit
‌
US Patent 7352196 Probe card assembly and kit
‌
US Patent 7352200 Functional and stress testing of LGA devices
‌
US Patent 7355381 Current sensor with reduced sensitivity to parasitic magnetic fields
‌
US Patent 7358718 Semiconductor device and electronics device
‌
US Patent 7358752 Signal launch for high speed differential signals
‌
US Patent 7362091 Test probe having modular components
‌
US Patent 7365557 Integrated circuit testing module including data generator
‌
US Patent 7368925 Probe station with two platens
‌
US Patent 7368932 Testing device for printed circuit board
‌
US Patent 7372249 Load measurement for a thermal microwave power sensor
‌
US Patent 7375508 Device and a process for the calibration of a semiconductor component test system
‌
US Patent 7375541 Testing method utilizing at least one signal between integrated circuits, and integrated circuit and testing system thereof
‌
US Patent 7378837 Method and system for calibrating a micro-electromechanical system (MEMS) based sensor using tunneling current sensing
‌
US Patent 7378862 Method and apparatus for eliminating automated testing equipment index time
‌
US Patent 7382141 Testing a batch of electrical components
‌
US Patent 7388392 Die design with integrated assembly aid
‌
US Patent 7394274 On-chip frequency degradation compensation
‌
US Patent 7394277 Testing apparatus, testing method, jitter filtering circuit, and jitter filtering method
‌
US Patent 7402993 Electrical profile monitoring system for detection of atypical consumption
‌
US Patent 7403031 Measurement apparatus for FET characteristics
‌
US Patent 7405580 Self-calibration in non-contact surface photovoltage measurement of depletion capacitance and dopant concentration
‌
US Patent 7405582 Measurement board for electronic device test apparatus
‌
US Patent 7405583 Functional and stress testing of LGA devices
‌
US Patent 7405586 Ultra low pin count interface for die testing
‌
US Patent 7408337 Compensating for loss in a transmission path
‌
US Patent 7423440 Functional and stress testing of LGA devices
‌
US Patent 7425822 Functional and stress testing of LGA devices
‌
US Patent 7425838 Body for keeping a wafer and wafer prober using the same
‌
US Patent 7427868 Active wafer probe
‌
US Patent 7436190 Transparent conductive film roll and production method thereof, touch panel using it, and non-contact surface resistance measuring device
‌
US Patent 7439725 Multimeter
‌
US Patent 7439756 Testing circuit and testing method for liquid crystal display device
‌
US Patent 7443188 Electronic device having an interface supported testing mode
‌
US Patent 7446543 Non-contact electrical connections test device
‌
US Patent 7446544 Probe apparatus, wafer inspecting apparatus provided with the probe apparatus and wafer inspecting method
‌
US Patent 7446551 Integrated circuit testing module including address generator
‌
US Patent 7446556 Multiple testing bars for testing liquid crystal display and method thereof
‌
US Patent 7449877 Current measurement apparatus
‌
US Patent 7449903 Method and system for the optical inspection of contact faces at semiconductor devices with different appearances
‌
US Patent 7449905 Automated characterization system for laser chip on a submount
‌
US Patent 7449906 Probe for testing an electrical device
‌
US Patent 7449907 Test unit to test a board having an area array package mounted thereon
‌
US Patent 7449912 Fault detection circuit
‌
US Patent 7453256 Micro-electromechanical system (MEMS) based current and magnetic field sensor
‌
US Patent 7453257 System and method for precision current source
‌
US Patent 7453273 Method and apparatus for analyzing current in an integrated circuit under test
‌
US Patent 7453279 Functional and stress testing of LGA devices
‌
US Patent 7456640 Structure for coupling probes of probe device to corresponding electrical contacts on product substrate
‌
US Patent 7456644 Functional and stress testing of LGA devices
‌
US Patent 7459925 Probe card
‌
US Patent 7463017 Functional and stress testing of LGA devices
‌
US Patent 7463043 Methods of probing an electronic device
‌
US Patent 7463047 Increase productivity at wafer test using probe retest data analysis
‌
US Patent 7466121 MEMS based current sensor using magnetic-to-mechanical conversion and reference components
‌
US Patent 7466155 Functional and stress testing of LGA devices
‌
US Patent 7471079 Microscope enclosure system
‌
US Patent 7471096 Contactor for electronic parts and a contact method
‌
US Patent 7471100 Semiconductor integrated circuit tester with interchangeable tester module
‌
US Patent 7474087 Energy meter system and method for calibration
‌
US Patent 7474089 Contact mechanism cleaning
‌
US Patent 7474113 Flexible head probe for sort interface units
‌
US Patent 7479796 Functional and stress testing of LGA devices
‌
US Patent 7482822 Apparatus and method for limiting over travel in a probe card assembly
‌
US Patent 7482830 Semiconductor device and method for testing semiconductor device
‌
US Patent 7486091 Test unit usable with a board having an electronic component
‌
US Patent 7486094 Apparatus for testing un-moulded IC devices using air flow system and the method of using the same
‌
US Patent 7486099 System and method for testing power transistors
‌
US Patent 7489125 Calibrating a tester using ESD protection circuitry
‌
US Patent 7492177 Bendable conductive connector
‌
US Patent 7495430 MEMS based current sensor using magnetic-to-mechanical conversion and reference components
‌
US Patent 7501839 Interposer and test assembly for testing electronic devices
‌
US Patent 7501845 On-chip frequency degradation compensation
‌
US Patent 7501847 Increased yield manufacturing for integrated circuits
‌
US Patent 7504840 Electrochemically fabricated microprobes
‌
US Patent 7508189 Micro-electromechanical system (MEMS) based current and magnetic field sensor having improved sensitivities
‌
US Patent 7508192 Circuit with a capacitive element with method for testing the same
‌
US Patent 7511518 Method of making an interposer
‌
US Patent 7511523 Cantilever microprobes for contacting electronic components and methods for making such probes
‌
US Patent 7511527 Methods and apparatus to test power transistors
‌
US Patent 7521917 Method and apparatus for testing material integrity
‌
US Patent 7521946 Electrical measurements on semiconductors using corona and microwave techniques
‌
US Patent 7525300 Current measuring device and method
‌
US Patent 7525327 Apparatus for evaluating semiconductor wafer
‌
US Patent 7525328 Cap at resistors of electrical test probe
‌
US Patent 7525331 On-chip critical path test circuit and method
‌
US Patent 7532000 Method and system for measurement of current flows in fastener arrays
‌
US Patent 7532025 Mother substrate, substrate for display panel and method of manufacturing display panel
‌
US Patent 7538539 Current meter with reduced range switching and load transients
‌
US Patent 7538567 Probe card with balanced lateral force
‌
US Patent 7541828 Burn-in sorter and sorting method using the same
‌
US Patent 7545137 Current detecting circuit
‌
US Patent 7548081 System and method for controlling environmental parameters of a device under test
‌
US Patent 7550987 Method and circuit for measuring operating and leakage current of individual blocks within an array of test circuit blocks
‌
US Patent 7554319 Circuits and methods for voltage sensing
‌
US Patent 7554346 Test equipment for automated quality control of thin film solar modules
‌
US Patent 7557595 Cantilever microprobes for contacting electronic components and methods for making such probes
‌
US Patent 7567089 Two-part microprobes for contacting electronic components and methods for making such probes
‌
US Patent 7567090 Liquid recovery, collection method and apparatus in a non-recirculating test and burn-in application
‌
US Patent 7567091 Method for isolating a short-circuited integrated circuit (IC) from other ICs on a semiconductor wafer
‌
US Patent 7573284 Increase productivity at wafer test using probe retest data analysis
‌
US Patent 7576554 Semiconductor devices and methods of testing the same
‌
US Patent 7579850 Probe card and method for assembling the same
‌
US Patent 7579855 Method for manufacturing electrical contact element for testing electronic device and electrical contact element manufactured thereby
‌
US Patent 7579858 Semiconductor device and inspection method thereof
‌
US Patent 7583076 Test tray and handler using the test tray
‌
US Patent 7583088 System and method for reducing noise in sensors with capacitive pickup
‌
US Patent 7583097 Contactor nest for an IC device and method
‌
US Patent 7586316 Probe board mounting apparatus
‌
US Patent 7589541 Method and apparatus for inspecting solid-state image pick-up device
‌
US Patent 7589542 Hybrid probe for testing semiconductor devices
‌
US Patent 7592797 Semiconductor device and electronics device
‌
US Patent 7592826 Method and apparatus for detecting EM energy using surface plasmon polaritons
‌
US Patent 7595628 Probing apparatus for illuminating an electrical device under test
‌
US Patent 7595654 Methods and apparatus for inline variability measurement of integrated circuit components
‌
US Patent 7598731 Systems and methods for adjusting threshold voltage
‌
US Patent 7598760 High temperature ceramic die package and DUT board socket
‌
US Patent 7605599 Organic electro luminescence display (OELD) to perform sheet unit test and testing method using the OELD
‌
US Patent 7609081 Testing system and method for testing an electronic device
‌
US Patent 7615990 Loadboard enhancements for automated test equipment
‌
US Patent 7616015 Wafer type probe card, method for fabricating the same, and semiconductor test apparatus having the same
‌
US Patent 7616016 Probe card assembly and kit
‌
US Patent 7619404 System and method for testing integrated circuit timing margins
‌
US Patent 7619426 Performance board and cover member
‌
US Patent 7619430 Electrical testing probe assembly having nonparallel facing surfaces and slots formed thereon for receiving probes
‌
US Patent 7619433 Test circuit for a semiconductor integrated circuit
‌
US Patent 7626377 Hall-effect device with merged and/or non-merged complementary structure
‌
US Patent 7626405 Suspension system and adjustment mechanism for an integrated chip and method
‌
US Patent 7626414 Multiple testing bars for testing liquid crystal display and method thereof
‌
US Patent 7629788 Test carrier
‌
US Patent 7629803 Probe card assembly and test probes therein
‌
US Patent 7629806 Method for forming connection pin, probe, connection pin, probe card and method for manufacturing probe card
‌
US Patent 7642797 Power supply stabilizing circuit, an electronic device and a test apparatus
‌
US Patent 7642803 Address pin reduction mode circuit with parallel input for semiconductor memory device and test method using the same
‌
US Patent 7649372 Die design with integrated assembly aid
‌
US Patent 7649373 Semiconductor integrated circuit with voltage drop detector
‌
US Patent 7649376 Semiconductor device including test element group and method for testing therefor
‌
US Patent 7649378 Methods for evaluating permanent magnet motors after manufacture and during service
‌
US Patent 7652467 Carrier tray for use with prober
‌
US Patent 7652493 Test arrangement having chips of a first substrate on a second substrate and chips of the second substrate on a third substrate
‌
US Patent 7656174 Probe cassette, semiconductor inspection apparatus and manufacturing method of semiconductor device
‌
US Patent 7659707 RF detector with crest factor measurement
‌
US Patent 7659744 Pixel testing circuit and method for liquid crystal display device
‌
US Patent 7663390 Inspection apparatus and method
‌
US Patent 7663394 Start signal detector circuit
‌
US Patent 7667480 Anisotropic conductive sheet, its production method, connection method and inspection method
‌
US Patent 7675302 Probe card assembly and method of attaching probes to the probe card assembly
‌
US Patent 7675308 Test circuit and test method for power switch
‌
US Patent 7679383 Cantilever probe card
‌
US Patent 7679384 Parametric testline with increased test pattern areas
‌
US Patent 7679388 Cantilever microprobes for contacting electronic components and methods for making such probes
‌
US Patent 7679392 Methods and systems for semiconductor testing using reference dice
‌
US Patent 7683608 Handler comprising an acceleration device for testing electronic components
‌
US Patent 7683646 Probe card and method of producing the same by a fine inkjet process
‌
US Patent 7688063 Apparatus and method for adjusting thermally induced movement of electro-mechanical assemblies
‌
US Patent 7688092 Measuring board for electronic device test apparatus
‌
US Patent 7688093 Sharing conversion board for testing chips
‌
US Patent 7688095 Interposer structures and methods of manufacturing the same
‌
US Patent 7688101 Semiconductor chip test apparatus and testing method
‌
US Patent 7691676 Mold array process for semiconductor packages
‌
US Patent 7692436 Probe card substrate with bonded via
‌
US Patent 7692441 Test apparatus and pin electronics card
‌
US Patent 7692443 Display substrate and method of testing the display substrate
‌
US Patent 7696743 Zero-phase current detecting apparatus
‌
US Patent 7701197 Current sensing assembly
‌
US Patent 7701198 Power measurement apparatus
‌
US Patent 7701239 Detection circuit
‌
US Patent 7701241 Circuit for protecting DUT, method for protecting DUT, testing apparatus and testing method
‌
US Patent 7701243 Electronic device testing using a probe tip having multiple contact features
‌
US Patent 7705583 Micro-electromechanical system (MEMS) based current and magnetic field sensor
‌
US Patent 7710106 Temporary planar electrical contact device and method using vertically-compressible nanotube contact structures
‌
US Patent 7714567 Power cable magnetic field sensor
‌
US Patent 7714601 Apparatus for controlling substrate voltage of semiconductor device
‌
US Patent 7719260 Method for pre-treating epitaxial layer, method for evaluating epitaxial layer, and apparatus for evaluating epitaxial layer
‌
US Patent 7719301 Testing method of semiconductor integrated circuit and information recording medium
‌
US Patent 7724005 High-frequency structures for nanoelectronics and molecular electronics
‌
US Patent 7724009 Method of making high-frequency probe, probe card using the high-frequency probe
‌
US Patent 7724011 Semiconductor integrated circuit device with power lines improved
‌
US Patent 7724015 Data processing device and methods thereof
‌
US Patent 7728578 Method and apparatus for high current measurement
‌
US Patent 7728580 Connecting device for electronic testing system
‌
US Patent 7728608 Method for assembling electrical connecting apparatus
‌
US Patent 7728610 Test instrument probe with MEMS attenuator circuit
‌
US Patent 7728614 Operating characteristic measurement device and methods thereof
‌
US Patent 7728615 Test apparatus that tests a device under test and connecting apparatus that connects a first apparatus and a second apparatus
‌
US Patent 7733102 Ultra-fine area array pitch probe card
‌
US Patent 7733104 Low force interconnects for probe cards
‌
US Patent 7733108 Method and arrangement for positioning a probe card
‌
US Patent 7733111 Segmented optical and electrical testing for photovoltaic devices
‌
US Patent 7737679 Poly phase solid state watt hour meters
‌
US Patent 7741832 Micro-electromechanical system (MEMS) based current and magnetic field sensor using tunneling current sensing
‌
US Patent 7746055 Current measuring device
‌
US Patent 7746060 Attachment apparatus, test head, and electronic device test system
‌
US Patent 7746068 Method and apparatus for measuring current
‌
US Patent 7746092 Intelligent multi-meter with automatic function selection
‌
US Patent 7746094 Testing system for power supply
‌
US Patent 7750663 Method and apparatus for testing an electronic motor
‌
US Patent 7755379 Configurations and method for carrying out wafer level unclamped inductive switching (UIS) tests
‌
US Patent 7759953 Active wafer probe
‌
US Patent 7759962 Methodology for bias temperature instability test
‌
US Patent 7764074 Probe of detector for testing pins of electronic component
‌
US Patent 7768279 Control method and control program for prober
‌
US Patent 7768280 Apparatus for a low-cost semiconductor test interface system
‌
US Patent 7768282 Apparatus and method for terminating probe apparatus of semiconductor wafer
‌
US Patent 7768283 Universal socketless test fixture
‌
US Patent 7768286 Electronic device testing apparatus and temperature control method in an electronic device testing apparatus
‌
US Patent 7768291 Display device
‌
US Patent 7772859 Probe for testing semiconductor devices with features that increase stress tolerance
‌
US Patent 7772861 Probe card
‌
US Patent 7772863 Mechanical decoupling of a probe card assembly to improve thermal response
‌
US Patent RE41515 Contactor and production method for contactor
‌
US Patent 7776719 Method for manufacturing bonded wafer
‌
US Patent 7777478 Touch and auditory sensors based on nanotube arrays
‌
US Patent 7777515 Methods and systems for semiconductor testing using reference dice
‌
US Patent 7782070 Probing device
‌
US Patent 7782074 System that detects damage in adjacent dice
‌
US Patent 7782076 Method and apparatus for statistical CMOS device characterization
‌
US Patent 7786720 Passive mixer power detector method and apparatus
‌
US Patent 7786742 Prober for electronic device testing on large area substrates
‌
US Patent 7791362 Inspection apparatus
‌
US Patent 7791363 Low temperature probing apparatus
‌
US Patent 7795889 Probe device
‌
US Patent 7795890 Reduced ground spring probe array and method for controlling signal spring probe impedance
‌
US Patent 7795892 Probe card
‌
US Patent 7800386 Contact device and method for producing the same
‌
US Patent 7800388 Curved spring structure with elongated section located under cantilevered section
‌
US Patent 7800389 Integrated circuit having built-in self-test features
‌
US Patent 7800392 Detection control circuit for anti-leakage
‌
US Patent 7800393 Electronic device test apparatus for successively testing electronic devices
‌
US Patent 7804314 Adjustable electrical probes for circuit breaker tester
‌
US Patent 7804318 Burning system having optic-electric transformer and comparator circuit and method for burning liquid crystal display
‌
US Patent 7808230 Voltage detection device and voltage detection method
‌
US Patent 7808260 Probes for a wafer test apparatus
‌
US Patent 7812623 Transparent conductive film roll and production method thereof, touch panel using the same, and non-contact surface resistance measuring device
‌
US Patent 7812624 Testing method for LED module
‌
US Patent 7816936 Apparatus for controlling substrate voltage of semiconductor device
‌
US Patent 7816937 Apparatus for testing a semiconductor package
‌
US Patent 7816939 Liquid crystal display panel and testing and manufacturing methods thereof
‌
US Patent 7821251 Current sensor
‌
US Patent 7821277 Parallel test fixture for mixed signal integrated circuits
‌
US Patent 7821279 Element substrate, inspecting method, and manufacturing method of semiconductor device
‌
US Patent 7825652 Method and apparatus for remotely buffering test channels
‌
US Patent 7825678 Test pad design for reducing the effect of contact resistances
‌
US Patent 7825679 Dielectric film and layer testing
‌
US Patent 7830164 Ducted test socket
‌
US Patent 7834649 Method and apparatus for statistical CMOS device characterization
‌
US Patent 7839136 System and method for testing radio frequency (RF) shielding defects
‌
US Patent 7839139 Pusher block
‌
US Patent 7843204 Electrical connecting apparatus
‌
US Patent 7843207 Methods and apparatus to test electronic devices
‌
US Patent 7847566 Configurable prober for TFT LCD array test
‌
US Patent 7847571 Semiconductor test system with self-inspection of electrical channel for Pogo tower
‌
US Patent 7847576 Comparator with latching function
‌
US Patent 7847577 Active matrix substrate, display device, and active matrix substrate inspecting method
‌
US Patent 7852064 Meter device and method of testing a cut neutral conductor
‌
US Patent 7852095 Device and method for electrical contacting semiconductor devices for testing
‌
US Patent 7852102 Method and apparatus for inspecting semiconductor device
‌
US Patent 7852105 Winding diagnostic system and method
‌
US Patent 7855569 Wafer holder for wafer prober and wafer prober equipped with the same
‌
US Patent 7855570 Semiconductor device for performing mount test in response to internal test mode signals
‌
US Patent 7855572 Semiconductor integrated circuit device operating frequency determining apparatus, determining method and computer-readable information recording medium
‌
US Patent 7859246 Modular energy meter
‌
US Patent 7859280 Probe card for testing semiconductor devices
‌
US Patent 7859281 Finger tester for testing unpopulated printed circuit boards and method for testing unpopulated printed circuit boards using a finger tester
‌
US Patent 7859282 Electrical connecting apparatus
‌
US Patent 7859286 Electronic device test system
‌
US Patent 7863915 Probe card cooling assembly with direct cooling of active electronic components
‌
US Patent 7863918 Disposable built-in self-test devices, systems and methods for testing three dimensional integrated circuits
‌
US Patent 7863924 Pusher assemblies for use in microfeature device testing, systems with pusher assemblies, and methods for using such pusher assemblies
‌
US Patent 7868632 Composite motion probing
‌
US Patent 7868633 Modular liquid cooled burn in system
‌
US Patent 7872483 Circuit board having bypass pad
‌
US Patent 7872489 Radiation induced fault analysis
‌
US Patent 7880487 Test lead probe with retractable insulative sleeve
‌
US Patent 7880488 Universal current leakage testing adapter
‌
US Patent 7880491 Multilayer semiconductor device
‌
US Patent 7880493 Probe pad, substrate having a semiconductor device, method of testing a semiconductor device and tester for testing a semiconductor device
‌
US Patent 7880495 Display device and test probe for testing display device
‌
US Patent 7884596 Self-balancing frequency determining bridge
‌
US Patent 7884617 ESD detection circuit and related method thereof
‌
US Patent 7884633 Wide area soft defect localization
‌
US Patent 7888928 Component test apparatus having a pair of rotary transport hands
‌
US Patent 7888956 Apparatus for testing a semiconductor device and a method of fabricating and using the same
‌
US Patent 7888958 Current test probe having a solder guide portion, and related probe assembly and production method
‌
US Patent 7893685 RF meter with input noise suppression
‌
US Patent 7893701 Method and apparatus for enhanced probe card architecture
‌
US Patent 7893707 Physical property measuring method for TFT liquid crystal panel and physical property measuring apparatus for TFT liquid crystal panel
‌
US Patent 7902814 Microscope enclosure system
‌
US Patent 7911197 Arrangement for measuring the current flowing in an electric conductor
‌
US Patent 7911198 Arrangement and method for measuring a current flowing in an electrical conductor
‌
US Patent 7915889 Linear displacement detection apparatus
‌
US Patent 7919959 Signal readout circuit of amperometric sensor
‌
US Patent 7919966 Method of estimating surface ion density
‌
US Patent 7924038 Probe and electrical connecting apparatus using it
‌
US Patent 7928722 Apparatus and method for voltage sensing in electrical metering systems
‌
US Patent 7928725 Rotational angle detector and rotational angle detector incorporated bearing assembly
‌
US Patent 7936167 Rotary velocity sensor and rotary position and velocity sensor
‌
US Patent 7944196 RF detector with crest factor measurement
‌
US Patent 7944226 Test apparatus and transmission apparatus
‌
US Patent 7944228 Mother substrate, substrate for display panel and method of manufacturing display panel
‌
US Patent 7948258 Semiconductor arrangement and method for the measurement of a resistance
‌
US Patent 7952376 Method and apparatus for equalizer testing
‌
US Patent 7956631 Test socket for testing semiconductor package
‌
US Patent 7960967 Sealing ring with a pulsar ring for a rotary encoder
‌
US Patent 7960970 Magnetic sensor and manufacturing method of the same
‌
US Patent 7960983 Circuit for detecting bonding defect in multi-bonding wire
‌
US Patent 7965087 Method for ascertaining and monitoring fill level of a medium in a container
‌
US Patent 7969148 Magnetic sensor device, magnetic encoder device and magnetic scale manufacturing method
‌
US Patent 7969168 Integrated circuit with built-in self test circuit
‌
US Patent 7973544 Thermal monitoring and management of integrated circuits
‌
US Patent 7977960 Cantilever type probe head having introducing portion with end face having a tapered portion and an extended rectangular portion
‌
US Patent 7977961 Component for testing device for electronic component and testing method of the electronic component
‌
US Patent 7982451 Sensing instrument
‌
US Patent 7982471 Capacitance measurement system and method
‌
US Patent 7982474 System and method for online monitoring of corrosion
‌
US Patent 7990160 Capacitive sensing with combinatorial sensor layout
‌
US Patent 7994770 Transmitter of a system for detecting a buried conductor
‌
US Patent 7999550 Multi-sensor system for the detection and characterization of unexploded ordnance
‌
US Patent 8004287 Method of detecting the wet arc fault in the AC power distribution applications
‌
US Patent 8008912 Method and system for testing P2 stiffness of a magnetoresistance transducer at the wafer level
‌
US Patent 8009887 Method and system for automatic quantification of aortic valve function from 4D computed tomography data using a physiological model
Edits on 8 Dec, 2021
Golden AI profile picture
Golden AI
edited on 8 Dec, 2021
Golden AI profile picture
Golden AI
edited on 8 Dec, 2021
Golden AI profile picture
Golden AI
edited on 8 Dec, 2021
Edits made to:
Infobox (+1 properties)
Infobox
Patent primary examiner of
‌
US Patent 8004287 Method of detecting the wet arc fault in the AC power distribution applications
Golden AI profile picture
Golden AI
edited on 8 Dec, 2021
Edits made to:
Infobox (+1 properties)
Infobox
Patent primary examiner of
‌
US Patent 7999550 Multi-sensor system for the detection and characterization of unexploded ordnance
Golden AI profile picture
Golden AI
edited on 8 Dec, 2021
Edits made to:
Infobox (+1 properties)
Infobox
Patent primary examiner of
‌
US Patent 7994770 Transmitter of a system for detecting a buried conductor
Golden AI profile picture
Golden AI
edited on 8 Dec, 2021
Edits made to:
Infobox (+1 properties)
Infobox
Patent primary examiner of
‌
US Patent 7990160 Capacitive sensing with combinatorial sensor layout
Golden AI profile picture
Golden AI
edited on 8 Dec, 2021
Edits made to:
Infobox (+1 properties)
Infobox
Patent primary examiner of
‌
US Patent 7982471 Capacitance measurement system and method
Golden AI profile picture
Golden AI
edited on 8 Dec, 2021
Edits made to:
Infobox (+1 properties)
Infobox
Patent primary examiner of
‌
US Patent 7982474 System and method for online monitoring of corrosion
Golden AI profile picture
Golden AI
edited on 8 Dec, 2021
Edits made to:
Infobox (+1 properties)
Infobox
Patent primary examiner of
‌
US Patent 7982451 Sensing instrument
Golden AI profile picture
Golden AI
edited on 8 Dec, 2021
Golden AI profile picture
Golden AI
edited on 8 Dec, 2021
Golden AI profile picture
Golden AI
edited on 8 Dec, 2021
Edits made to:
Infobox (+1 properties)
Infobox
Patent primary examiner of
‌
US Patent 7973544 Thermal monitoring and management of integrated circuits
Golden AI profile picture
Golden AI
edited on 8 Dec, 2021
Edits made to:
Infobox (+1 properties)
Infobox
Patent primary examiner of
‌
US Patent 7969168 Integrated circuit with built-in self test circuit
Golden AI profile picture
Golden AI
edited on 8 Dec, 2021
Edits made to:
Infobox (+1 properties)
Infobox
Patent primary examiner of
‌
US Patent 7969148 Magnetic sensor device, magnetic encoder device and magnetic scale manufacturing method
Golden AI profile picture
Golden AI
edited on 8 Dec, 2021
Edits made to:
Infobox (+1 properties)
Infobox
Patent primary examiner of
‌
US Patent 7965087 Method for ascertaining and monitoring fill level of a medium in a container
Golden AI profile picture
Golden AI
edited on 7 Dec, 2021
Edits made to:
Infobox (+1 properties)
Infobox
Patent primary examiner of
‌
US Patent 7960983 Circuit for detecting bonding defect in multi-bonding wire
Golden AI profile picture
Golden AI
edited on 7 Dec, 2021
Edits made to:
Infobox (+1 properties)
Infobox
Patent primary examiner of
‌
US Patent 7960967 Sealing ring with a pulsar ring for a rotary encoder
Golden AI profile picture
Golden AI
edited on 7 Dec, 2021
Edits made to:
Infobox (+1 properties)
Infobox
Patent primary examiner of
‌
US Patent 7960970 Magnetic sensor and manufacturing method of the same
Golden AI profile picture
Golden AI
edited on 7 Dec, 2021
Edits made to:
Infobox (+1 properties)
Infobox
Patent primary examiner of
‌
US Patent 7956631 Test socket for testing semiconductor package

Find more people like Minh N. Tang

Use the Golden Query Tool to discover related individuals, professionals, or experts with similar interests, expertise, or connections in the Knowledge Graph.
Open Query Tool
Access by API
Golden Query Tool
Golden logo