Log in
Sign up
Golden has been acquired by ComplyAdvantage.Read about it here ⟶
‌

Ha Tran T Nguyen

OverviewStructured DataIssuesContributorsActivity

All edits

Edits on 24 Sep, 2022
"Edit from table cell"
Софья Левина profile picture
Софья Левина
edited on 24 Sep, 2022
Edits made to:
Infobox (+1 properties)
Infobox
Facebook URL
https://www.facebook.com/thanhha.trannguyen.1
Edits on 19 Sep, 2022
"rollback to version 39705886"
Megan Gustafson profile picture
Megan Gustafson
edited on 19 Sep, 2022
Edits made to:
Infobox (-1 properties)
Infobox
Facebook URL
https://www.facebook.com/HaTranSinger
Edits on 27 Aug, 2022
"rollback to version 39404654"
Megan Gustafson profile picture
Megan Gustafson
edited on 27 Aug, 2022
Edits made to:
Infobox (-1 properties)
Infobox
Facebook URL
https://www.facebook.com/HaTranSinger
Edits on 12 Aug, 2022
"Edit from table cell"
Екатерина Петровская profile picture
Екатерина Петровская
edited on 12 Aug, 2022
Edits made to:
Infobox (+1 properties)
Infobox
Location
Edits on 11 Aug, 2022
"Edit from table cell"
Дмитрий Лукьянов profile picture
Дмитрий Лукьянов
edited on 11 Aug, 2022
Edits made to:
Infobox (+1 properties)
Infobox
Company Operating Status
Active
Edits on 14 Dec, 2021
"Remove inverse infobox"
Golden AI profile picture
Golden AI
edited on 14 Dec, 2021
Edits made to:
Infobox (-1158 properties)
Infobox
Patent primary examiner of
‌
US Patent 7442644 Method for manufacturing nitride semiconductor wafer or nitride semiconductor device; nitride semiconductor wafer or nitride semiconductor device made by the same; and laser irradiating apparatus used for the same
‌
US Patent 7443184 Apparatus and methods for self-heating burn-in processes
‌
US Patent 7446549 Semiconductor leakage current detector and leakage current measurement method, semiconductor leakage current detector with voltage trimming function and reference voltage trimming method, and semiconductor integrated circuit thereof
‌
US Patent 7446552 Semiconductor device testing
‌
US Patent 7449901 Grounding scheme for high speed probing with reduced loop area
‌
US Patent 7453280 Method for testing semiconductor devices
‌
US Patent 7459344 Method for forming micromachined structure
‌
US Patent 7459351 Method of manufacturing an AMOLED
‌
US Patent 7459903 Multi-level voltage detection circuit
‌
US Patent 7463016 Current sensor
‌
US Patent 7463042 Connector probing system
‌
US Patent 7466162 Electronic load
‌
US Patent 7468609 Switched suspended conductor and connection
‌
US Patent 7468610 Electrical connecting apparatus
‌
US Patent 7470604 Method for manufacturing display device
‌
US Patent 7470927 Semiconductor chip with coil element over passivation layer
‌
US Patent 7471078 Stiffener assembly for use with testing devices
‌
US Patent 7471095 Electrical connecting apparatus and method for use thereof
‌
US Patent 7471102 Measuring threshold voltage of transistors in a circuit
‌
US Patent 7473605 Corner dominated trigate field effect transistor
‌
US Patent 7474109 Contact terminal for measurement, measurement apparatus, probe card set, wafer probe apparatus, and testing apparatus
‌
US Patent 7474110 Probe card
‌
US Patent 7474114 System and method for characterizing silicon wafers
‌
US Patent 7474115 Organic electronic device display defect detection
‌
US Patent 7476618 Selective formation of metal layers in an integrated circuit
‌
US Patent 7477062 LSI test socket for BGA
‌
US Patent 7477064 Probing apparatus and positional deviation acquiring method
‌
US Patent 7477067 Semiconductor integrated circuit which can be burn-in-tested even when packaged and method of burn-in-testing semiconductor integrated circuit even when the semiconductor integrated circuit is packaged
‌
US Patent 7479779 Image sensor test system
‌
US Patent 7479780 Tester for in-circuit testing bed of nails fixture and testing circuit thereof
‌
US Patent 7479787 Current regulator for loop powered time of flight and level measurement systems
‌
US Patent 7479793 Apparatus for testing semiconductor test system and method thereof
‌
US Patent 7479794 Spring loaded probe pin assembly
‌
US Patent 7479795 Temperature control apparatus
‌
US Patent 7482215 Self-aligned dual segment liner and method of manufacturing the same
‌
US Patent 7482261 Interconnect structure for BEOL applications
‌
US Patent 7482703 Semiconductor device having align mark layer and method of fabricating the same
‌
US Patent 7482800 Wired circuit board and connecting structure thereof
‌
US Patent 7482821 Probe card and the production method
‌
US Patent 7482826 Probe for scanning over a substrate and a data storage device
‌
US Patent 7482827 Integrated circuit with testable clock circuits
‌
US Patent 7482829 Electric power applying circuit and test apparatus
‌
US Patent 7485512 Method of manufacturing an adaptive AIGaN buffer layer
‌
US Patent 7485513 One-device non-volatile random access memory cell
‌
US Patent 7485557 Method for fabricating semiconductor device having flask type recess gate
‌
US Patent 7485563 Method of providing solder bumps of mixed sizes on a substrate using a sorting mask and bumped substrate formed according to the method
‌
US Patent 7486089 Method for controlling parallelism between probe card and mounting table, storage medium storing inspection program, and inspection apparatus
‌
US Patent 7486090 Testing device
‌
US Patent 7486095 System for measuring signal path resistance for an integrated circuit tester interconnect structure
‌
US Patent 7486100 Active matrix panel inspection device and inspection method
‌
US Patent 7486101 Method and apparatus for inspecting flexible display medium layer
‌
US Patent 7488691 Method of fabricating semiconductor device
‌
US Patent 7489147 Inspection equipment of circuit board and inspection method of circuit board
‌
US Patent 7489150 Apparatus and methods for self-heating burn-in processes
‌
US Patent 7489151 Layout for DUT arrays used in semiconductor wafer testing
‌
US Patent 7489153 Semiconductor memory device
‌
US Patent 7489154 Testing high frequency signals on a trace
‌
US Patent 7489157 System and method for automatically measuring carrier density distribution by using capacitance-voltage characteristics of a MOS transistor device
‌
US Patent 7491660 Method of forming nitride films with high compressive stress for improved PFET device performance
‌
US Patent 7492146 Impedance controlled via structure
‌
US Patent 7492172 Chuck for holding a device under test
‌
US Patent 7492173 Probe accessories, and methods for probing test points using same
‌
US Patent 7492174 Testing apparatus for surface mounted connectors
‌
US Patent 7492175 Membrane probing system
‌
US Patent 7492179 Systems and methods for reducing testing times on integrated circuit dies
‌
US Patent 7492180 Apparatus and methods for performing a test
‌
US Patent 7492181 Method and device for enabling the measurement of device under test voltages using a testing instrument of limited range
‌
US Patent 7494866 Semiconductor device and related method of manufacture
‌
US Patent 7494916 Design structures incorporating interconnect structures with liner repair layers
‌
US Patent 7495457 Semiconductor device evaluation method and apparatus using the same
‌
US Patent 7495458 Probe card and temperature stabilizer for testing semiconductor devices
‌
US Patent 7495460 Body for keeping a wafer, heater unit and wafer prober
‌
US Patent 7495463 System and method for transferring trays within a test handler
‌
US Patent 7495464 Inspection device of a semiconductor device
‌
US Patent 7498800 Methods and apparatus for rotationally accessed tester interface
‌
US Patent 7498825 Probe card assembly with an interchangeable probe insert
‌
US Patent 7498826 Probe array wafer
‌
US Patent 7498827 Probe card
‌
US Patent 7498828 Probe station with low inductance path
‌
US Patent 7498831 Conduction-cooled accelerated test fixture
‌
US Patent 7501651 Test structure of semiconductor device
‌
US Patent 7501808 Current sensing device
‌
US Patent 7501809 Electronic component handling and testing apparatus and method for electronic component handling and testing
‌
US Patent 7501838 Contact assembly and LSI chip inspecting device using the same
‌
US Patent 7501843 Movement amount operation correction method for prober, movement amount operation correction processing program, and prober
‌
US Patent 7501844 Liquid cooled DUT card interface for wafer sort probing
‌
US Patent 7501846 Measurement apparatus and measurement method
‌
US Patent 7501848 Method and apparatus for measuring leakage current
‌
US Patent 7504819 Dynamic line rating system with real-time tracking of conductor creep to establish the maximum allowable conductor loading as limited by clearance
‌
US Patent 7504820 Current sensor with alternating magnetic excitation
‌
US Patent 7504823 Thermal optical chuck
‌
US Patent 7504841 High-impedance attenuator
‌
US Patent 7504843 Probe unit substrate
‌
US Patent 7504844 Inspection apparatus and method
‌
US Patent 7504848 Panel and test method for display device
‌
US Patent 7507675 Device manufacturing method and device
‌
US Patent 7508079 Circuit substrate and method of manufacturing the same
‌
US Patent 7508188 On-chip current sensing methods and systems
‌
US Patent 7508190 Test pulses for enabling revenue testable panel meters
‌
US Patent 7508191 Pin electronics implemented system and method for reduced index time
‌
US Patent 7508226 Versatile materials probe
‌
US Patent 7508228 Method and system for monitoring test signals for semiconductor devices
‌
US Patent 7508229 Method and device for testing array substrate
‌
US Patent 7511468 Harmonics measurement instrument with in-situ calibration
‌
US Patent 7511470 Electronic tamper detection circuit for an electricity meter
‌
US Patent 7511471 Magnetic bridge electric power sensor
‌
US Patent 7511472 Power measuring apparatus
‌
US Patent 7511473 Pressing member and electronic component handling device
‌
US Patent 7511517 Semi-automatic multiplexing system for automated semiconductor wafer testing
‌
US Patent 7511519 Electric signal connecting device and probe assembly and probing device using the same
‌
US Patent 7511522 Electronic device test apparatus
‌
US Patent 7511526 Circuit module testing apparatus and method
‌
US Patent 7514325 Fin-FET having GAA structure and methods of fabricating the same
‌
US Patent 7514340 Composite integrated device and methods for forming thereof
‌
US Patent 7514942 Probe based patterning of microelectronic and micromechanical devices
‌
US Patent 7514943 Coordinate transforming apparatus for electrical signal connection
‌
US Patent 7514945 Systems configured for utilizing semiconductor components
‌
US Patent 7514946 Semiconductor carrier tray, and burn-in board, burn-in test method, and semiconductor manufacturing method using the semiconductor carrier tray
‌
US Patent 7514947 Method of and system for functionally testing multiple devices in parallel in a burn-in-environment
‌
US Patent 7514948 Vertical probe array arranged to provide space transformation
‌
US Patent 7517808 Method for forming and removing a patterned silicone film
‌
US Patent 7518355 Package level voltage sensing of a power gated die
‌
US Patent 7518379 Connection unit, a board for mounting a device under test, a probe card and a device interfacing part
‌
US Patent 7518383 Inspection apparatus and inspection method using electron beam
‌
US Patent 7518385 Probe using high pass ground signal path
‌
US Patent 7518388 Contactor for electronic components and test method using the same
‌
US Patent 7518389 Interface assembly and dry gas enclosing apparatus using same
‌
US Patent 7518393 Pixel circuit board, pixel circuit board test method, pixel circuit, pixel circuit test method, and test apparatus
‌
US Patent 7521305 Method for fabricating semiconductor device
‌
US Patent 7521918 Microcomputer chip with function capable of supporting emulation
‌
US Patent 7521947 Probe needle protection method for high current probe testing of power devices
‌
US Patent 7521949 Test pin, method of manufacturing same, and system containing same
‌
US Patent 7521950 Wafer level I/O test and repair enabled by I/O layer
‌
US Patent 7521951 Non-invasive, low pin count test circuits and methods utilizing emulated stress conditions
‌
US Patent 7521952 Test structure for electromigration analysis and related method
‌
US Patent 7521953 Test apparatus for testing operation of a printed circuit board
‌
US Patent 7521954 Method for determining a minority carrier diffusion length using surface photo voltage measurements
‌
US Patent 7524689 Active matrix display device and manufacturing method thereof
‌
US Patent 7524701 Chip-scale package
‌
US Patent 7524728 Thin film transistor manufacturing method and organic electroluminescent display device
‌
US Patent 7524732 Semiconductor device with L-shaped spacer and method of manufacturing the same
‌
US Patent 7525303 Automatic testing apparatus and method
‌
US Patent 7525304 Measurement of effective capacitance
‌
US Patent 7525305 Core wrappers with input and output linking circuitry
‌
US Patent 7525325 System and method for floating-substrate passive voltage contrast
‌
US Patent 7525326 Test apparatus capable of accurately connecting a test object to a substrate
‌
US Patent 7525329 Electrical connecting apparatus
‌
US Patent 7525333 Current sense circuit
‌
US Patent 7525335 Display element and inspecting method of the same
‌
US Patent 7525336 Method and apparatus for testing liquid crystal display device
‌
US Patent 7527998 Method of manufacturing MEMS devices providing air gap control
‌
US Patent 7528592 Magnetoresistive sensor for current sensing
‌
US Patent 7528593 Current measuring device
‌
US Patent 7528594 Device for the reading of direct and/or alternating currents
‌
US Patent 7528595 Method for detecting and correcting wiring errors in power monitoring applications
‌
US Patent 7528596 Fixture for manual functional testing of wireless devices
‌
US Patent 7528620 Probe card transfer assist apparatus and inspection equipment using same
‌
US Patent 7532020 Probe assembly
‌
US Patent 7532024 Methods and systems for semiconductor testing using reference dice
‌
US Patent 7534651 Seedless wirebond pad plating
‌
US Patent 7535213 Method and system for prediction of atmospheric upsets in an integrated circuit
‌
US Patent 7535239 Probe card configured for interchangeable heads
‌
US Patent 7535240 Semiconductor device
‌
US Patent 7535242 Interface test circuit
‌
US Patent 7538430 Semiconductor device and a method of manufacturing the same
‌
US Patent 7538541 Split Rogowski coil current measuring device and methods
‌
US Patent 7538564 Methods and apparatus for utilizing an optical reference
‌
US Patent 7538566 Electrical test system including coaxial cables
‌
US Patent 7538568 Spring loaded probe pin
‌
US Patent 7538569 Integrated circuits with programmable well biasing
‌
US Patent 7538570 Supply voltage monitoring
‌
US Patent 7541235 Method for providing a programmable electrostatic discharge (ESD) protection device
‌
US Patent 7541258 Method of manufacturing semiconductor substrate and method of manufacturing semiconductor device
‌
US Patent 7541799 Method and device for measuring a current flowing in an electrical conductor
‌
US Patent 7541800 Methods and systems for detecting DC influence in a current sensor
‌
US Patent 7541818 Method and apparatus of electromagnetic measurement
‌
US Patent 7541820 Probe card
‌
US Patent 7541822 Wafer burn-in and text employing detachable cartridge
‌
US Patent 7541825 Isolation circuit
‌
US Patent 7541827 BGA package holder device and method for testing of BGA packages
‌
US Patent 7544527 Method and apparatus for providing optoelectronic communication with an electronic device
‌
US Patent 7545015 Photo-detection device and manufacturing method thereof
‌
US Patent 7545136 Device for measuring current
‌
US Patent 7545138 Precision, temperature-compensated, shielded current measurement device
‌
US Patent 7545157 Shielded probe apparatus for probing semiconductor wafer
‌
US Patent 7545158 Method for testing system-in-package devices
‌
US Patent 7545159 Electrical test probes with a contact element, methods of making and using the same
‌
US Patent 7545161 Method and apparatus to measure threshold shifting of a MOSFET device and voltage difference between nodes
‌
US Patent 7545163 Three phase motor diagnostics and phase voltage feedback utilizing a single A/D input
‌
US Patent 7548077 Measuring apparatus and a measuring method for measuring a polarization characteristic of an optical system
‌
US Patent 7548079 Semiconductor device including analog voltage output driver LSI chip having test circuit
‌
US Patent 7548080 Method and apparatus for burn-in optimization
‌
US Patent 7548082 Inspection probe
‌
US Patent 7550312 Image sensor
‌
US Patent 7550327 Method for fabricating thin film transistor substrate
‌
US Patent 7550349 Method for forming gate dielectric layers
‌
US Patent 7550961 Systems and methods for evaluating electromagnetic interference
‌
US Patent 7550962 Wide bandwidth attenuator input circuit for a measurement probe
‌
US Patent 7550964 Apparatus and method for linked slot-level burn-in
‌
US Patent 7553775 Method for coating semiconductor surface, process for production of semiconductor particles using said method, and optical element using said semiconductor particles
‌
US Patent 7554322 Probe station
‌
US Patent 7554348 Multi-offset die head
‌
US Patent 7557562 Inverted magnetic isolator
‌
US Patent 7557563 Current sensor assembly
‌
US Patent 7557592 Method of expanding tester drive and measurement capability
‌
US Patent 7557594 Automated contact alignment tool
‌
US Patent 7557596 Test assembly including a test die for testing a semiconductor product die
‌
US Patent 7557597 Stacked chip security
‌
US Patent 7557599 Apparatus and method for determining a current through a power semiconductor component
‌
US Patent 7560293 Evaluation method using a TEG, a method of manufacturing a semiconductor device having the TEG, an element substrate and a panel having the TEG, a program for controlling dosage and a computer-readable recording medium recording the program
‌
US Patent 7560369 Method of forming metal line in semiconductor device
‌
US Patent 7560370 Method for manufacturing semiconductor device
‌
US Patent 7560939 Electrical defect detection using pre-charge and sense scanning with prescribed delays
‌
US Patent 7560940 Method and installation for analyzing an integrated circuit
‌
US Patent 7560947 Pin electronics driver
‌
US Patent 7560948 Circuit for minimizing or eliminating pulse anomalies in human body model electrostatic discharge tests
‌
US Patent 7564252 Semiconductor inspection apparatus
‌
US Patent 7566605 Epitaxial silicon germanium for reduced contact resistance in field-effect transistors
‌
US Patent 7567076 Automated loading/unloading of devices for burn-in testing
‌
US Patent 7567092 Liquid crystal display driver including test pattern generating circuit
‌
US Patent 7569471 Method of providing mixed size solder bumps on a substrate using a solder delivery head
‌
US Patent 7569474 Method and apparatus for soldering modules to substrates
‌
US Patent 7569480 Semiconductor devices and methods of fabricating the same
‌
US Patent 7569482 Method for the selective removal of an unsilicided metal
‌
US Patent 7570044 Signal detecting circuit
‌
US Patent 7570072 Display device including test circuit and electronic apparatus having the display device
‌
US Patent 7570314 Display device including a bottom chassis having coupling areas and support areas
‌
US Patent 7572667 Method of forming an organic semiconductor pattern and method of manufacturing an organic thin film transistor using the same
‌
US Patent 7573082 CMOS image sensor and method of fabricating the same
‌
US Patent 7573256 Semiconductor wafer examination method and semiconductor chip manufacturing method
‌
US Patent 7573271 Apparatus for measuring electric characteristics of semiconductor
‌
US Patent 7573276 Probe card layout
‌
US Patent 7573278 Semiconductor device
‌
US Patent 7573279 Jig for Kelvin test
‌
US Patent 7573285 Multiple point gate oxide integrity test method and system for the manufacture of semiconductor integrated circuits
‌
US Patent 7576016 Process for manufacturing semiconductor device
‌
US Patent 7576550 Automatic multiplexing system for automated wafer testing
‌
US Patent 7576552 Surface mount package fault detection apparatus
‌
US Patent 7576553 Integrated circuit probing apparatus having a temperature-adjusting mechanism
‌
US Patent 7576555 Current measuring apparatus, test apparatus, current measuring method and test method
‌
US Patent 7576556 Liquid crystal display device having test architecture and related test method
‌
US Patent 7579824 High-precision Rogowski current transformer
‌
US Patent 7579825 Device and method for measuring a current flowing in an electrical conductor
‌
US Patent 7579826 Test socket for semiconductor
‌
US Patent 7579847 Probe card cooling assembly with direct cooling of active electronic components
‌
US Patent 7579851 Operation voltage supply apparatus and operation voltage supply method for semiconductor device
‌
US Patent 7579854 Probe station and method for measurements of semiconductor devices under defined atmosphere
‌
US Patent 7579859 Method for determining time dependent dielectric breakdown
‌
US Patent 7582530 Managing floating gate-to-floating gate spacing to support scalability
‌
US Patent 7582545 Forming method for film pattern, device, electro-optical apparatus, electronic apparatus, and manufacturing method for active matrix substrate
‌
US Patent 7583072 Current sensor for measuring current flowing through bus bar
‌
US Patent 7583073 Core-less current sensor
‌
US Patent 7583093 Electrical test method of an integrated circuit
‌
US Patent 7583095 High-density probe array
‌
US Patent 7583096 Probing apparatus and probing method
‌
US Patent 7583098 Automated probe card planarization and alignment methods and tools
‌
US Patent 7583101 Probing structure with fine pitch probes
‌
US Patent 7585707 Low dark current image sensors with epitaxial SiC and/or carbonated channels for array transistors
‌
US Patent 7585733 Method of manufacturing semiconductor device having multiple gate insulation films
‌
US Patent 7585742 Semiconductor device manufacturing method
‌
US Patent 7586319 Methods of retaining semiconductor component configurations within sockets
‌
US Patent 7586320 Plunger and chip-testing module applying the same
‌
US Patent 7586321 Electrical test probe and electrical test probe assembly
‌
US Patent 7586322 Test structure and method for measuring mismatch and well proximity effects
‌
US Patent 7589011 Semiconductor device and method of forming intermetal dielectric layer
‌
US Patent 7589515 Method for reducing temperature-dependent error in photocurrent sensor, and photocurrent sensor device
‌
US Patent 7589516 Poly-phase electric energy meter
‌
US Patent 7589521 Universal cover for a burn-in socket
‌
US Patent 7589545 Device for final inspection
‌
US Patent 7589546 Inspection apparatus and method for semiconductor IC
‌
US Patent 7589547 Forked probe for testing semiconductor devices
‌
US Patent 7589549 Driver circuit and test apparatus
‌
US Patent 7589551 On-wafer AC stress test circuit
‌
US Patent 7592190 Method of evaluating characteristics of and forming of an insulating film for a semiconductor device
‌
US Patent 7592196 Method for fabricating a CMOS image sensor
‌
US Patent 7592226 Method for manufacturing non-volatile semiconductor memory device, and non-volatile semiconductor memory device
‌
US Patent 7592796 Plate with an indicator for discerning among pre-identified probe holes in the plate
‌
US Patent 7592824 Method and apparatus for test and characterization of semiconductor components
‌
US Patent 7592827 Apparatus and method for electrical detection and localization of shorts in metal interconnect lines
‌
US Patent 7595220 Image sensor package and fabrication method thereof
‌
US Patent 7595630 Automated laser header testing
‌
US Patent 7595631 Wafer level assemble chip multi-site testing solution
‌
US Patent 7595651 Cantilever-type probe card for high frequency application
‌
US Patent 7595653 Pressure testing apparatus and method for pressure testing
‌
US Patent 7598095 Ferroelectric memory and ferroelectric capacitor with Ir-alloy electrode or Ru-alloy electrode and method of manufacturing same
‌
US Patent 7598143 Method for producing an integrated circuit with a trench transistor structure
‌
US Patent 7598722 Method and apparatus for sensing temperature
‌
US Patent 7598726 Methods and apparatuses for test methodology of input-output circuits
‌
US Patent 7598727 Probe card head protection device for wafer sort set up
‌
US Patent 7598730 Semiconductor wafer examination method and semiconductor chip manufacturing method
‌
US Patent 7598755 Probe navigation method and device and defect inspection device
‌
US Patent 7598756 Inspection device and inspection method
‌
US Patent 7598758 MP3 micro probe
‌
US Patent 7598759 Routing engine, method of routing a test probe and testing system employing the same
‌
US Patent 7598762 Semiconductor driver circuit with signal swing balance and enhanced testing
‌
US Patent 7598763 Probe contacting electrode and electronic device
‌
US Patent 7598764 Transistor arrangement
‌
US Patent 7601592 Method for forming multi-gate non-volatile memory devices using a damascene process
‌
US Patent 7602199 Mini-prober for TFT-LCD testing
‌
US Patent 7602200 Probe for electrical test comprising a positioning mark and probe assembly
‌
US Patent 7602202 Semiconductor probe with high resolution resistive tip having doping control layer and method of fabricating the same
‌
US Patent 7602203 Probe and probe card
‌
US Patent 7602204 Probe card manufacturing method including sensing probe and the probe card, probe card inspection system
‌
US Patent 7602205 Electromigration tester for high capacity and high current
‌
US Patent 7605584 Voltage generating apparatus, current generating apparatus, and test apparatus
‌
US Patent 7605596 Probe card, apparatus and method for inspecting an object
‌
US Patent 7605598 Undercurrent sense arrangement and method
‌
US Patent 7608520 Method for bonding substrate, bonded substrate, and direct bonded substrate
‌
US Patent 7608529 Method for selective laser crystallization and display panel fabricated by using the same
‌
US Patent 7609051 Energy metering system
‌
US Patent 7609052 Contact pusher, contact arm, and electronic device handling apparatus
‌
US Patent 7609053 Wafer testing system integrated with RFID techniques and thesting method thereof
‌
US Patent 7609077 Differential signal probe with integral balun
‌
US Patent 7609078 Contact alignment verification/adjustment fixture
‌
US Patent 7609080 Voltage fault detection and protection
‌
US Patent 7609082 System for measuring signal path resistance for an integrated circuit tester interconnect structure
‌
US Patent 7611949 Method of fabricating metal-oxide-semiconductor transistor
‌
US Patent 7611983 Semiconductor device and a manufacturing method of the same
‌
US Patent 7611986 Dual damascene patterning method
‌
US Patent 7612394 Thin film transistor array substrate
‌
US Patent 7612553 Current sensor having sandwiched magnetic permeability layer
‌
US Patent 7612570 Surface-potential distribution measuring apparatus, image carrier, and image forming apparatus
‌
US Patent 7612572 Probe and method of manufacturing a probe
‌
US Patent 7612573 Probe sensing pads and methods of detecting positions of probe needles relative to probe sensing pads
‌
US Patent 7612575 Electronic device test apparatus for successively testing electronic devices
‌
US Patent 7612576 Method for detecting an inverter hardware failure in an electric power train
‌
US Patent 7615385 Double-masking technique for increasing fabrication yield in superconducting electronics
‌
US Patent 7615430 Field effect transistor and method of manufacturing a field effect transistor
‌
US Patent 7615432 HDP/PECVD methods of fabricating stress nitride structures for field effect transistors
‌
US Patent 7615445 Methods of reducing coupling between floating gates in nonvolatile memory
‌
US Patent 7615448 Method of forming low resistance void-free contacts
‌
US Patent 7615986 Temperature detection function-incorporating current sensor
‌
US Patent 7615988 Wide range current sensing method and system
‌
US Patent 7615989 Method and apparatus for DC integrated current sensor
‌
US Patent 7616017 Probe station thermal chuck with shielding for capacitive current
‌
US Patent 7616018 Integrated circuit probing apparatus having a temperature-adjusting mechanism
‌
US Patent 7616020 Probe pad, substrate having a semiconductor device, method of testing a semiconductor device and tester for testing a semiconductor device
‌
US Patent 7616021 Method and device for determining an operational lifetime of an integrated circuit device
‌
US Patent 7616022 Circuit and method for detecting skew of transistors in a semiconductor device
‌
US Patent 7618845 Fabrication of an integrated circuit package
‌
US Patent 7618848 Integrated circuit package system with supported stacked die
‌
US Patent 7619425 Electrical connecting apparatus
‌
US Patent 7619427 Temperature control device and temperature control method
‌
US Patent 7619428 Wafer level burn-in and electrical test system and method
‌
US Patent 7619429 Integrated probe module for LCD panel light inspection
‌
US Patent 7619432 Tandem handler system and method for reduced index time
‌
US Patent 7619434 System for multiple layer printed circuit board misregistration testing
‌
US Patent 7619435 Method and system for derivation of breakdown voltage for MOS integrated circuit devices
‌
US Patent 7619436 Display substrate and apparatus and method for testing display panel having the same
‌
US Patent 7622909 Magnetic field sensor and electrical current sensor therewith
‌
US Patent 7622910 Method and apparatus for AC integrated current sensor
‌
US Patent 7622912 Method for enabling monitoring of power consumption
‌
US Patent 7622936 Contact device for touch contacting an electrical test specimen, and corresponding method
‌
US Patent 7622937 Electrical signal connector
‌
US Patent 7622939 Methods and apparatuses for improved stabilization in a probing system
‌
US Patent 7622940 Semiconductor device having contact failure detector
‌
US Patent 7625788 Display element and method of manufacturing the same
‌
US Patent 7625810 Wafer processing method
‌
US Patent 7625811 Method for producing distinct first and second active semi-conducting zones and use thereof for fabricating C-MOS structures
‌
US Patent 7626375 System and method for configuring a display for a digital multimeter
‌
US Patent 7626376 Electric current detector having magnetic detector
‌
US Patent 7626379 Probe station having multiple enclosures
‌
US Patent 7626404 Replaceable probe apparatus for probing semiconductor wafer
‌
US Patent 7626406 Probing method, probe apparatus and storage medium
‌
US Patent 7626410 Apparatus for testing a semiconductor device
‌
US Patent 7626412 Adaptive test time reduction for wafer-level testing
‌
US Patent 7629192 Passive electrically testable acceleration and voltage measurement devices
‌
US Patent 7629194 Metal contact RF MEMS single pole double throw latching switch
‌
US Patent 7629242 Method for fabricating semiconductor device having recess gate
‌
US Patent 7629649 Method and materials to control doping profile in integrated circuit substrate material
‌
US Patent 7629804 Probe head assembly for use in testing multiple wafer die
‌
US Patent 7629807 Electrical test probe
‌
US Patent 7629808 Parallel scan distributors and collectors and process of testing integrated circuits
‌
US Patent 7632731 Semiconductor device and method for fabricating the same
‌
US Patent 7632754 Method for forming metal line in a semiconductor device
‌
US Patent 7633285 Sensors and sensing methods for three-phase, gas insulated devices
‌
US Patent 7633287 Current sensor
‌
US Patent 7633288 Method of testing semiconductor devices and handler used for testing semiconductor devices
‌
US Patent 7633304 Device for testing electronic components, in particular ICs, having a sealing board arranged inside a pressure test chamber
‌
US Patent 7633305 Method for evaluating semiconductor wafer and apparatus for evaluating semiconductor wafer
‌
US Patent 7633308 Combined pulse and DC test system
‌
US Patent 7635602 Simulator of ion implantation and method for manufacturing semiconductor device
‌
US Patent 7635635 Method for bonding a semiconductor substrate to a metal substrate
‌
US Patent 7635639 Method for the interconnection of active and passive components and resulting thin heterogeneous component
‌
US Patent 7635643 Method for forming C4 connections on integrated circuit chips and the resulting devices
‌
US Patent 7635972 Rechargeable powering system in an electricity meter
‌
US Patent 7638403 Manufacturing method of integrated circuit structure
‌
US Patent 7638787 Phase changeable memory cell array region and method of forming the same
‌
US Patent 7638998 Electronic tamper detection circuit for an electricity meter
‌
US Patent 7638999 Protective relay device, system and methods for Rogowski coil sensors
‌
US Patent 7639002 Non-invasive, low pin count test circuits and methods
‌
US Patent 7639003 Guarded tub enclosure
‌
US Patent 7639026 Electronic device test set and contact used therein
‌
US Patent 7639028 Probe card assembly with ZIF connectors
‌
US Patent 7639030 Creating a jet impingement pattern for a thermal control system
‌
US Patent 7639033 On-chip voltage regulator using feedback on process/product parameters
‌
US Patent 7642133 Method of making a semiconductor package and method of making a semiconductor device
‌
US Patent 7642769 Insert and tray for electronic device handling apparatus, and electronic device handling apparatus
‌
US Patent 7642770 Light-driving system capable of providing signal-measured calibration and a method for performing the same
‌
US Patent 7642771 Pin fixture for glue dispenser
‌
US Patent 7642772 Non-contact method and apparatus for measurement of leakage current of p-n junctions in IC product wafers
‌
US Patent 7642793 Ultra-fine pitch probe card structure
‌
US Patent 7642796 Control system and method of semiconductor inspection system
‌
US Patent 7642798 Probe card needle cleaning frequency optimization
‌
US Patent 7642799 Test chip socket and method for testing a chip
‌
US Patent 7642801 Circuit testing apparatus for testing a device under test
‌
US Patent 7642802 Method and apparatus for cooling non-native instrument in automatic test equipment
‌
US Patent 7642804 Testing high frequency signals on a trace
‌
US Patent 7642805 Short detection circuit
‌
US Patent 7646193 Device inspection device, device inspection system using the same, and mobile telephone holding device
‌
US Patent 7649366 Method and apparatus for switching tester resources
‌
US Patent 7649369 Probe and method of manufacturing probe
‌
US Patent 7649375 Connector-to-pad printed circuit board translator and method of fabrication
‌
US Patent 7651927 Semiconductor device and method for fabricating the same
‌
US Patent 7652494 Operating an integrated circuit at a minimum supply voltage
‌
US Patent 7652496 Commutation failure detection circuit for back-to-back SCR circuit and controlling method thereof having relatively better efficiency
‌
US Patent 7652497 Sequential semiconductor device tester
‌
US Patent 7655576 Insulator film, manufacturing method of multilayer wiring device and multilayer wiring device
‌
US Patent 7656148 Over-power detector
‌
US Patent 7656149 Current transformer and electric energy meter
‌
US Patent 7656150 Test handler and loading method thereof
‌
US Patent 7656152 Pusher for match plate of test handler
‌
US Patent 7656175 Inspection unit
‌
US Patent 7656176 Probe member for wafer inspection, probe card for wafer inspection and wafer inspection equipment
‌
US Patent 7656177 Test apparatus
‌
US Patent 7656181 Apparatus and method for testing circuit characteristics by using eye mask
‌
US Patent 7656182 Testing method using a scalable parametric measurement macro
‌
US Patent 7659153 Sectional field effect devices and method of fabrication
‌
US Patent 7659734 Semiconductor inspection system and apparatus utilizing a non-vibrating contact potential difference sensor and controlled illumination
‌
US Patent 7659740 System and method of digitally testing an analog driver circuit
‌
US Patent 7659742 Vacuum chamber AC/DC probe
‌
US Patent 7662659 Methods of forming arrays of nanoscale building blocks
‌
US Patent 7662718 Trim process for critical dimension control for integrated circuits
‌
US Patent 7663359 Testing mechanism for casings
‌
US Patent 7663386 Probe card
‌
US Patent 7663387 Test socket
‌
US Patent 7663388 Active thermal control unit for maintaining the set point temperature of a DUT
‌
US Patent 7663389 Automated test equipment with DIB mounted three dimensional tester electronics bricks
‌
US Patent 7663393 Mobility measurements of inversion charge carriers
‌
US Patent 7663395 Display device, display panel therefor, and inspection method thereof
‌
US Patent 7667246 Field programmable gate array (FPGA) multi-parallel structure
‌
US Patent 7667453 Test tray for test handler
‌
US Patent 7667471 Contact pin probe card and electronic device test apparatus using same
‌
US Patent 7667472 Probe assembly, method of producing it and electrical connecting apparatus
‌
US Patent 7667473 Flip-chip package having thermal expansion posts
‌
US Patent 7667475 Electronics tester with a signal distribution board and a wafer chuck having different coefficients of thermal expansion
‌
US Patent 7667476 Measuring module for rapid measurement of electrical, electronic and mechanical components at cryogenic temperatures and measuring device having such a module
‌
US Patent 7667478 System and method for measuring negative bias thermal instability with a ring oscillator
‌
US Patent 7667481 Surface electron emission device array and thin film transistor inspection system using the same
‌
US Patent 7667482 Inductively powered power bus apparatus
‌
US Patent 7670863 Method of fabricating complementary metal oxide silicon image sensor
‌
US Patent 7671362 Test structure for determining optimal seed and liner layer thicknesses for dual damascene processing
‌
US Patent 7671580 Integrated current sensing transformer and current sensing circuit using such transformer
‌
US Patent 7671609 Sheet-like probe, method of producing the probe, and application of the probe
‌
US Patent 7671611 Apparatus, system and method for testing electronic elements
‌
US Patent 7671613 Probing blade conductive connector for use with an electrical test probe
‌
US Patent 7671615 Method and apparatus for controlling the temperature of electronic components
‌
US Patent 7671616 Semiconductor probe having embossed resistive tip and method of fabricating the same
‌
US Patent 7671618 Analog IC having test arrangement and test method for such an IC
‌
US Patent 7671620 Testing system for solar cells
‌
US Patent 7674639 GaN based LED with etched exposed surface for improved light extraction efficiency and method for making the same
‌
US Patent 7674641 Method for fabricating white-light-emitting flip-chip diode having silicon quantum dots
‌
US Patent 7674688 Sawing method for a semiconductor element with a microelectromechanical system
‌
US Patent 7674723 Plasma immersion ion implantation using an electrode with edge-effect suppression by a downwardly curving edge
‌
US Patent 7675300 Charged particle beam device probe operation
‌
US Patent 7675303 Connector for measuring electrical resistance, and apparatus and method for measuring electrical resistance of circuit board
‌
US Patent 7675305 Vertical-type electric contactor and manufacture method thereof
‌
US Patent 7675306 Prober apparatus and operating method therefor
‌
US Patent 7675309 Probing system for integrated circuit device
‌
US Patent 7675311 Wireless test system
‌
US Patent 7675312 Sub-sampling of weakly-driven nodes
‌
US Patent 7678587 Cantilever-type probe and method of fabricating the same
‌
US Patent 7678607 Methods for forming resistive switching memory elements
‌
US Patent 7678620 Antifuse one time programmable memory array and method of manufacture
‌
US Patent 7678709 Method of forming low-temperature conformal dielectric films
‌
US Patent 7678713 Energy beam treatment to improve packaging reliability
‌
US Patent 7679356 Digital multimeter having improved recording functionality
‌
US Patent 7679357 Current sensor
‌
US Patent 7679359 Application-specific integrated circuit with automatic time-constant matching
‌
US Patent 7679381 Method and apparatus for nondestructively evaluating light-emitting materials
‌
US Patent 7679382 Stepped PCB for probe card, probe card having the same and method for clamping the probe card
‌
US Patent 7679385 Probe card for inspecting electric properties of an object
‌
US Patent 7679389 Probe for electrical test and electrical connecting apparatus using it
‌
US Patent 7679391 Test equipment and semiconductor device
‌
US Patent 7682845 Methods for calibrating a process for growing an epitaxial silicon film and methods for growing an epitaxial silicon film
‌
US Patent 7682923 Method of forming metal trench pattern in thin-film device
‌
US Patent 7682942 Method for reducing pillar structure dimensions of a semiconductor device
‌
US Patent 7682953 Method of forming p-type compound semiconductor layer
‌
US Patent 7682958 Method for producing an integrated circuit including a fuse element, a fuse-memory element or a resistor element
‌
US Patent 7683603 Automatic disconnect system, transfer system and method
‌
US Patent 7683604 Amplifier topology and method for connecting to printed circuit board traces used as shunt resistors
‌
US Patent 7683605 Test pulses for enabling revenue testable panel meters
‌
US Patent 7683647 Instrument per pin test head
‌
US Patent 7683648 Integrated circuit socket and method of use for providing adjustable contact pitch
‌
US Patent 7683649 Testing system contactor
‌
US Patent 7683650 Measurement instrument with synchronized interference signals
‌
US Patent 7683651 Test structure for electromigration analysis and related method
‌
US Patent 7687300 Method of dynamic temperature control during microcrystalline SI growth
‌
US Patent 7687304 Current-driven device using NiMn alloy and method of manufacture
‌
US Patent 7687355 Method for manufacturing fin transistor that prevents etching loss of a spin-on-glass insulation layer
‌
US Patent 7688062 Probe station
‌
US Patent 7688083 Analogue measurement of alignment between layers of a semiconductor device
‌
US Patent 7688084 Testing apparatus and method for detecting a contact deficiency of an electrically conductive connection
‌
US Patent 7688085 Contactor having a global spring structure and methods of making and using the contactor
‌
US Patent 7688086 Fabrication method of semiconductor integrated circuit device and probe card
‌
US Patent 7688094 Electrical connecting apparatus
‌
US Patent 7688096 Contact load measuring apparatus and inspecting apparatus
‌
US Patent 7688099 Sequential semiconductor device tester
‌
US Patent 7688100 Integrated circuit and a method for measuring a quiescent current of a module
‌
US Patent 7691727 Method for manufacturing an integrated circuit with fully depleted and partially depleted transistors
‌
US Patent 7692420 Fiber-optic current sensor with polarimetric detection scheme
‌
US Patent 7692437 Systems and methods for testing packaged microelectronic devices
‌
US Patent 7692442 Apparatus for detecting a current and temperature for an integrated circuit
‌
US Patent 7696008 Wafer-level chip packaging process and chip package structure
‌
US Patent 7696033 Method of fabricating complementary metal-oxide semiconductor (CMOS) thin film transistor (TFT)
‌
US Patent 7696745 Operating method of test handler
‌
US Patent 7696767 Inspection device and inspection method
‌
US Patent 7696770 Self-centering nest for electronics testing
‌
US Patent 7699604 Manufacturing apparatus for semiconductor device and manufacturing method for semiconductor device
‌
US Patent 7700396 Image sensor and fabricating method thereof
‌
US Patent 7700416 Tensile strained semiconductor on insulator using elastic edge relaxation and a sacrificial stressor layer
‌
US Patent 7701200 Active test socket
‌
US Patent 7701232 Rotational positioner and methods for semiconductor wafer test systems
‌
US Patent 7701233 Heat-resistant lens kit
‌
US Patent 7701234 Inspection contact structure and probe card
‌
US Patent 7701235 Substrate test probing equipment having forcing part for test head and force-receiving pattern for probe card and methods of using the same
‌
US Patent 7701237 Semiconductor integrated circuit device, method of testing semiconductor integrated circuit device, and probe card used for burn-in stress and D/S tests
‌
US Patent 7701238 Active thermal control using a burn-in socket heating element
‌
US Patent 7701242 Method and apparatus for array-based electrical device characterization
‌
US Patent 7704788 Methods of fabricating multi-bit phase-change memory devices and devices formed thereby
‌
US Patent 7704810 Manufacturing method of display device
‌
US Patent 7704854 Method for fabricating semiconductor device having conductive liner for rad hard total dose immunity
‌
US Patent 7704866 Methods for forming composite nanoparticle-metal metallization contacts on a substrate
‌
US Patent 7704867 Method of manufacturing semiconductor devices
‌
US Patent 7704881 Producing a covered through substrate via using a temporary cap layer
‌
US Patent 7705619 Small pitch ball grid array of a package assembly for use with conventional burn-in sockets
‌
US Patent 7705620 Measuring and identifying analog characteristics of a microelectronic component at a wafer level and a platform level
‌
US Patent 7705622 Method to synchronize two different pulse generators
‌
US Patent 7705623 Method and device for detecting interlaminar short circuits
‌
US Patent 7709285 Method of manufacturing a MEMS device and MEMS device
‌
US Patent 7709357 Silicon epitaxial wafer and method for manufacturing the same
‌
US Patent 7709372 Semiconductor device and method for manufacturing the same
‌
US Patent 7710104 Out-of-line measurement of a current flowing through a load
‌
US Patent 7710133 Testing method for semiconductor device having ball-shaped external electrode
‌
US Patent 7710135 Method for registering probe card and a storage medium storing program thereof
‌
US Patent 7710136 Intergrated circuit self-test architecture
‌
US Patent 7710137 Method and apparatus for relative testing of integrated circuit devices
‌
US Patent 7710138 Semiconductor chip and semiconductor device including the same
‌
US Patent 7710139 Electro-optical device and electronic apparatus
‌
US Patent 7710140 Methods and apparatus for testing electronic circuits
‌
US Patent 7710142 Semiconductor integrated circuit
‌
US Patent 7713784 Thin quad flat package with no leads (QFN) fabrication methods
‌
US Patent 7714566 Clamp-on current and voltage module for a power monitoring system
‌
US Patent 7714569 Adaptor for electrical connector
‌
US Patent 7714597 Support member assembly for conductive contact members
‌
US Patent 7714598 Contact carriers (tiles) for populating larger substrates with spring contacts
‌
US Patent 7714599 Integrated circuit burn-in test system and associated methods
‌
US Patent 7714600 Load fluctuation correction circuit, electronic device, testing device, and timing generating circuit
‌
US Patent 7714602 Socket for connecting ball-grid-array integrated circuit device to test circuit
‌
US Patent 7718448 Method of monitoring process misalignment to reduce asymmetric device operation and improve the electrical and hot carrier performance of LDMOS transistor arrays
‌
US Patent 7718470 Package substrate and method for fabricating the same
‌
US Patent 7718497 Method for manufacturing semiconductor device
‌
US Patent 7718508 Semiconductor bonding and layer transfer method
‌
US Patent 7718518 Low temperature doped silicon layer formation
‌
US Patent 7719258 Method and apparatus for current measurement using hall sensors without iron cores
‌
US Patent 7719295 Method and apparatus for implementing IC device testing with improved SPQL, reliability and yield performance
‌
US Patent 7719296 Inspection contact structure and probe card
‌
US Patent 7719302 On-chip electromigration monitoring
‌
US Patent 7719303 Liquid crystal display device and analysis device including the same
‌
US Patent 7723978 Instrumentation device and interface combining multiple elements
‌
US Patent 7723979 Integrated energy metering system
‌
US Patent 7723981 Method for transferring test trays in a side-docking type test handler
‌
US Patent 7723999 Calibration structures for differential signal probing
‌
US Patent 7724004 Probing apparatus with guarded signal traces
‌
US Patent 7724006 Probe card, manufacturing method of probe card, semiconductor inspection apparatus and manufacturing method of semiconductor device
‌
US Patent 7724007 Probe apparatus and probing method
‌
US Patent 7724013 On-chip self test circuit and self test method for signal distortion
‌
US Patent 7724017 Multi-channel pulse tester
‌
US Patent 7724019 Active device array substrate
‌
US Patent 7727816 Integrated circuit package system with offset stacked die
‌
US Patent 7727824 Liquid crystal display device and fabricating method thereof
‌
US Patent 7727845 Ultra shallow junction formation by solid phase diffusion
‌
US Patent 7727865 Method for controlling conductivity of Ga
‌
US Patent 7727886 Forming vias using sacrificial material
‌
US Patent 7727894 Formation of an integrated circuit structure with reduced dishing in metallization levels
‌
US Patent 7727907 Manufacturing method of semiconductor device and semiconductor device produced therewith
‌
US Patent 7728365 CMOS image sensor structure
‌
US Patent 7728607 Electrical probe
‌
US Patent 7728609 Replaceable probe apparatus for probing semiconductor wafer
‌
US Patent 7728616 Apparatus and method for testing picture quality of liquid crystal display
‌
US Patent 7732264 Fabrication methods of thin film transistor substrates
‌
US Patent 7732302 Integrated sensor and circuitry and process therefor
‌
US Patent 7733080 Revolvable clamp meter
‌
US Patent 7733081 Automated test equipment interface
‌
US Patent 7733100 System and method for modulation mapping
‌
US Patent 7733103 Probe card
‌
US Patent 7733105 Voltage clamp circuit and semiconductor device, overcurrent protection circuit, voltage measurement probe, voltage measurement device and semiconductor evaluation device respectively using the same
‌
US Patent 7733106 Apparatus and method of testing singulated dies
‌
US Patent 7733112 Semiconductor testing circuit and semiconductor testing method
‌
US Patent 7733113 Semiconductor test device
‌
US Patent 7733116 Method of testing a power supply controller and structure therefor
‌
US Patent 7737031 Insitu formation of inverse floating gate poly structures
‌
US Patent 7737046 Quantum dot array and production method therefor, and dot array element and production method therefor
‌
US Patent 7737677 Wide area protection control measurement system and method
‌
US Patent 7737680 Non contact method and apparatus for measurement of sheet resistance of P-N junctions
‌
US Patent 7737681 Non contact method and apparatus for measurement of sheet resistance of P-N junctions
‌
US Patent 7737709 Methods for planarizing a semiconductor contactor
‌
US Patent 7737710 Socket, and test apparatus and method using the socket
‌
US Patent 7737713 Apparatus for hot-probing integrated semiconductor circuits on wafers
‌
US Patent 7737714 Probe assembly arrangement
‌
US Patent 7737715 Compensation for voltage drop in automatic test equipment
‌
US Patent 7737716 Methods and systems for semiconductor testing using reference dice
‌
US Patent 7737717 Current-voltage-based method for evaluating thin dielectrics based on interface traps
‌
US Patent 7737718 Power supply assembly and semiconductor testing system using same
‌
US Patent 7741147 Method of field-controlled diffusion and devices formed thereby
‌
US Patent 7741197 Systems and methods for harvesting and reducing contamination in nanowires
‌
US Patent 7741833 Non contact method and apparatus for measurement of sheet resistance of p-n junctions
‌
US Patent 7741835 Electric meter having a detachable measuring bar
‌
US Patent 7741837 Probe apparatus
‌
US Patent 7741861 Test apparatus for the testing of electronic components
‌
US Patent 7741863 Apparatus and methods for performing a test
‌
US Patent 7745242 Method for fabricating liquid crystal display device
‌
US Patent 7745263 System and method for routing supply voltages or other signals between side-by-side die and a lead frame for system in a package (SIP) devices
‌
US Patent 7745335 Semiconductor device manufactured by reducing hillock formation in metal interconnects
‌
US Patent 7745345 ZnO based semiconductor device manufacture method
‌
US Patent 7745352 Curing methods for silicon dioxide thin films deposited from alkoxysilane precursor with harp II process
‌
US Patent 7745889 Metal oxide semiconductor transistor with Y shape metal gate
‌
US Patent 7746051 Voltmeter with dual displays
‌
US Patent 7746057 Power meter having complex quadrature output current and voltage filters
‌
US Patent 7746058 Sequential equivalent—time sampling with an asynchronous reference clock
‌
US Patent 7746089 Method and apparatus for indirect planarization
‌
US Patent 7746090 System for testing connections of two connectors
‌
US Patent 7746091 Sensor apparatus
‌
US Patent 7749799 Back-illuminated imager and method for making electrical and optical connections to same
‌
US Patent 7749801 Phase change memory device using carbon nanotube and method for fabricating the same
‌
US Patent 7749840 Methods of forming a semiconductor device including buried bit line
‌
US Patent 7749841 Method of fabricating nonvolatile semiconductor memory device
‌
US Patent 7749858 Process for producing an MOS transistor and corresponding integrated circuit
‌
US Patent 7749886 Microelectronic assemblies having compliancy and methods therefor
‌
US Patent 7749902 Methods of manufacturing semiconductor device
‌
US Patent 7749907 Method for manufacturing semiconductor device
‌
US Patent 7750621 Clamp meter for measuring consumption of current and power of electrical product
‌
US Patent 7750651 Wafer level test probe card
‌
US Patent 7750652 Test structure and probe for differential signals
‌
US Patent 7750653 Automated contact alignment tool
‌
US Patent 7750655 Multilayer substrate and probe card
‌
US Patent 7750656 Circuit for distributing a test signal applied to a pad of an electronic device
‌
US Patent 7750657 Polishing head testing with movable pedestal
‌
US Patent 7750659 Voltage detecting circuit and semiconductor device including the same
‌
US Patent 7750660 Integrated circuit with improved test capability via reduced pin count
‌
US Patent 7750661 Method of testing liquid crystal display
‌
US Patent 7750662 Electro-optical device and electronic apparatus
‌
US Patent 7754548 Thin film transistor, method of fabricating the same, and method of fabricating liquid crystal display device having the same
‌
US Patent 7754563 Nanolaminate-structure dielectric film forming method
‌
US Patent 7754564 Method for fabricating three-dimensional control-gate architecture for single poly EPROM memory devices in planar CMOS technology
‌
US Patent 7754590 Method of manufacturing a semiconductor device comprising a field stop zone at a specific depth
‌
US Patent 7754592 Method for fabricating semiconductor device
‌
US Patent 7755347 Current and voltage measurement device
‌
US Patent 7755348 Current sensor output measurement system and method
‌
US Patent 7755372 Method for automated stress testing of flip-chip packages
‌
US Patent 7755376 Camera based pin grid array (PGA) inspection system with pin base mask and low angle lighting
‌
US Patent 7755377 Driver circuit and test apparatus
‌
US Patent 7755378 Clamping top plate using magnetic force
‌
US Patent 7759162 Flip chip mounting process and flip chip assembly
‌
US Patent 7759182 Dummy active area implementation
‌
US Patent 7759779 Semiconductor device and method of manufacturing the same
‌
US Patent 7759926 Dynamic phase offset measurement
‌
US Patent 7759951 Semiconductor testing device with elastomer interposer
‌
US Patent 7759954 Semiconductor probe having resistive tip and method of fabricating the same
‌
US Patent 7759955 Method and device for position detection using connection pads
‌
US Patent 7759959 Voltage sensing device and associated method
‌
US Patent 7759963 Method for determining threshold voltage variation using a device array
‌
US Patent 7759964 Apparatus, system, and method determining voltage, current, and power in a switching regulator
‌
US Patent 7759966 Methods and systems for evaluating permanent magnet motors
‌
US Patent 7763480 Method for manufacturing thin film transistor array substrate
‌
US Patent 7763518 Ultra-thin SOI vertical bipolar transistors with an inversion collector on thin-buried oxide (BOX) for low substrate-bias operation and methods thereof
‌
US Patent 7763532 Technique for forming a dielectric etch stop layer above a structure including closely spaced lines
‌
US Patent 7763539 Method for manufacturing semiconductor device
‌
US Patent 7763553 Manufacturing method of semiconductor device subjected to heat treatment by use of optical heating apparatus
‌
US Patent 7764072 Differential signal probing system
‌
US Patent 7764073 Electrical connecting apparatus
‌
US Patent 7764078 Test structure for monitoring leakage currents in a metallization layer
‌
US Patent 7764079 Modular probe system
‌
US Patent 7764080 Methods of operating an electronic circuit for measurement of transistor variability and the like
‌
US Patent 7767473 Multiple die wafers having increased reliability and methods of increasing reliability in same
‌
US Patent 7767576 Wafer level package having floated metal line and method thereof
‌
US Patent 7768253 Sampling module and a method of sampling one or more analogue characteristics of a power transmission system
‌
US Patent 7768278 High impedance, high parallelism, high temperature memory test system architecture
‌
US Patent 7768281 Probe assembly for lapping a bar using a patterned probe
‌
US Patent 7768285 Probe card for semiconductor IC test and method of manufacturing the same
‌
US Patent 7768287 Methods and apparatus for managing defective processors through power gating
‌
US Patent 7768288 Detection device
‌
US Patent 7768289 Testing method and testing device for an integrated circuit
‌
US Patent 7772019 Method for packaging LED device
‌
US Patent 7772030 Multipurpose decapsulation holder and method for a ball grid array package
‌
US Patent 7772038 CMOS process for fabrication of ultra small or non standard size or shape semiconductor die
‌
US Patent 7772066 DRAM tunneling access transistor
‌
US Patent 7772074 Method of forming conformal silicon layer for recessed source-drain
‌
US Patent 7772085 Controlling overspray coating in semiconductor devices
‌
US Patent 7772104 Dynamic pad size to reduce solder fatigue
‌
US Patent 7772832 Manipulator for positioning a test head on a tester
‌
US Patent 7772834 Handler and process for testing a semiconductor chips using the handler
‌
US Patent 7772858 Probe card
‌
US Patent 7772866 Structure and method of mapping signal intensity to surface voltage for integrated circuit inspection
‌
US Patent 7772867 Structures for testing and locating defects in integrated circuits
‌
US Patent 7772870 Method and apparatus for layer short detection of electric rotating machine
‌
US Patent RE41516 Socketless/boardless test interposer card
‌
US Patent 7776622 Method for fabricating semiconductor devices
‌
US Patent 7776662 TFT LCD array substrate and manufacturing method thereof
‌
US Patent 7776755 Solution for polymer and capping layer removing with wet dipping in HK metal gate etching process
‌
US Patent 7777479 Current detector with variable output voltage level
‌
US Patent 7777507 Integrated circuit testing with laser stimulation and emission analysis
‌
US Patent 7777509 Method and apparatus for electrical testing
‌
US Patent 7777510 Wafer inspecting apparatus, wafer inspecting method and computer program
‌
US Patent 7781239 Semiconductor device defect type determination method and structure
‌
US Patent 7781270 Method for fabricating electronic devices integrated on a single substrate
‌
US Patent 7781309 Method for manufacturing direct bonded SOI wafer and direct bonded SOI wafer manufactured by the method
‌
US Patent 7782071 Probe card analysis system and method
‌
US Patent 7782072 Single support structure probe group with staggered mounting pattern
‌
US Patent 7782075 Electronic device, load fluctuation compensation circuit, power supply, and test apparatus
‌
US Patent 7785918 Image device and method of manufacturing the same
‌
US Patent 7785947 Method for manufacturing semiconductor device comprising the step of forming nitride/oxide by high-density plasma
‌
US Patent 7785981 Solid-state imaging device and method of manufacturing solid-state imaging device
‌
US Patent 7785987 Isolating chip-to-chip contact
‌
US Patent 7786719 Optical sensor, optical current sensor and optical voltage sensor
‌
US Patent 7786722 Automated tray transfer device for prevention of mixing post and pre-test dies, and method of using same
‌
US Patent 7786723 Test stage for a carrier having printhead integrated circuitry thereon
‌
US Patent 7790517 Method of manufacturing semiconductor device
‌
US Patent 7790543 Device structures for a metal-oxide-semiconductor field effect transistor and methods of fabricating such device structures
‌
US Patent 7790620 Method for fabricating semiconductor device
‌
US Patent 7791358 Dual tip probe
‌
US Patent 7791360 Connection unit, a board for mounting a device under test, a probe card and a device interfacing part
‌
US Patent 7791361 Planarizing probe card
‌
US Patent 7791364 Electronic device probe card with improved probe grouping
‌
US Patent 7795043 Method of manufacturing oscillator device
‌
US Patent 7795053 Light-emitting device manufacturing method and light-emitting device
‌
US Patent 7795063 Micro-electro-mechanical systems (MEMS) device and process for fabricating the same
‌
US Patent 7795102 ESD high frequency diodes
‌
US Patent 7795127 Electronic device manufacturing method and electronic device
‌
US Patent 7795140 Method of manufacturing substrate
‌
US Patent 7795860 Multiple probe acquisition system
‌
US Patent 7795885 Optically isolated current monitoring for ionization systems
‌
US Patent 7795887 Photoconductive based electrical testing of transistor arrays
‌
US Patent 7795891 Tester with low signal attenuation
‌
US Patent 7795894 Built-in-self-test arrangement for a single multiple-integrated circuit package and methods thereof
‌
US Patent 7795895 Loop-back testing method and apparatus for IC
‌
US Patent 7795897 Test apparatus and driver circuit
‌
US Patent 7799595 Semiconductor physical quantity sensor of electrostatic capacitance type and method for manufacturing the same
‌
US Patent 7799652 Method for producing epitaxial wafer with buried diffusion layer and epitaxial wafer with buried diffusion layer
‌
US Patent 7799673 Semiconductor device manufacturing method
‌
US Patent 7799674 Ruthenium alloy film for copper interconnects
‌
US Patent 7800381 Test structures, systems, and methods for semiconductor devices
‌
US Patent 7800384 Probe unit substrate
‌
US Patent 7800385 Apparatus and method for testing electrical interconnects
‌
US Patent 7800387 Method for detecting tips of probes, alignment method and storage medium storing the methods, and probe apparatus
‌
US Patent 7800394 Display device, driving method thereof, and electronic appliance
‌
US Patent 7803662 Warpage control using a package carrier assembly
‌
US Patent 7803701 Method for fabricating a semiconductor device
‌
US Patent 7804292 Method for testing integrated circuits mounted on a carrier
‌
US Patent 7804294 Non contact method and apparatus for measurement of sheet resistance of P-N junctions
‌
US Patent 7804313 Semiconductor device
‌
US Patent 7804315 Probe card
‌
US Patent 7804317 Test device for determining charge damage to a transistor
‌
US Patent 7807512 Semiconductor packages and methods of fabricating the same
‌
US Patent 7807548 Process of forming and controlling rough interfaces
‌
US Patent 7808229 Magnetic device and frequency analyzer
‌
US Patent 7808259 Component assembly and alignment
‌
US Patent 7808261 Contact with plural beams
‌
US Patent 7808262 Integrated systems testing
‌
US Patent 7808263 Non-invasive, low pin count test circuits and methods utilizing emulated stress conditions
‌
US Patent 7808264 Isolated conductive leads extending across to opposite sides of IC
‌
US Patent 7808266 Method and apparatus for evaluating the effects of stress on an RF oscillator
‌
US Patent 7808267 Module and method for detecting defect of thin film transistor substrate
‌
US Patent 7811888 Method for fabricating semiconductor memory device
‌
US Patent 7811896 Semiconductor structure and method of manufacture
‌
US Patent 7811927 Method of manufacturing metal line
‌
US Patent 7812594 Optical device and method of controlling the same
‌
US Patent 7812595 Electronic device identifying method
‌
US Patent 7812625 Chip test apparatus and probe card circuit
‌
US Patent 7812628 Method of on-chip current measurement and semiconductor IC
‌
US Patent 7816164 MEMS processing
‌
US Patent 7816235 Semiconductor package and method for producing the same
‌
US Patent 7816255 Methods of forming a semiconductor device including a diffusion barrier film
‌
US Patent 7816906 Method for determining anisotropy of 1-D conductor or semiconductor synthesis
‌
US Patent 7816909 Mechanical stress characterization in semiconductor device
‌
US Patent 7816910 Test handler having size-changeable test site
‌
US Patent 7816929 Socket and electronic appliances using socket
‌
US Patent 7816932 Test system with high frequency interposer
‌
US Patent 7816933 Semi-generic in-circuit test fixture
‌
US Patent 7816934 Reconfigurable connections for stacked semiconductor devices
‌
US Patent 7816935 Test apparatus
‌
US Patent 7816938 Display apparatus and enable circuit thereof
‌
US Patent 7820462 Encapsulated optical package
‌
US Patent 7820500 Single mask scheme method and structure for integrating PMOS and NMOS transistors using strained silicon
‌
US Patent 7821254 Method and apparatus for improving load time for automated test equipment
‌
US Patent 7821280 Process monitor for monitoring and compensating circuit performance
‌
US Patent 7821281 Method and apparatus of testing die to die interconnection for system in package
‌
US Patent 7821282 Inverter that calculates an average value of direct current DC
‌
US Patent 7821283 Circuit board apparatus for wafer inspection, probe card, and wafer inspection apparatus
‌
US Patent 7825018 Plasma oxidation method and method for manufacturing semiconductor device
‌
US Patent 7825044 Curing methods for silicon dioxide multi-layers
‌
US Patent 7825650 Automated loader for removing and inserting removable devices to improve load time for automated test equipment
‌
US Patent 7825651 Resistor structures to electrically measure unidirectional misalignment of stitched masks
‌
US Patent 7825673 Failure analysis method and failure analysis apparatus
‌
US Patent 7825674 Probe card configuration for low mechanical flexural strength electrical routing substrates
‌
US Patent 7825675 Method and apparatus for providing active compliance in a probe card assembly
‌
US Patent 7825676 Contactor and test method using contactor
‌
US Patent 7825677 Test jig for testing a packaged high frequency semiconductor device
‌
US Patent 7825680 Componet supplied with an analog value
‌
US Patent 7829356 Thin film scribe process
‌
US Patent 7829405 Lateral bipolar transistor with compensated well regions
‌
US Patent 7829414 Method for manufacturing non-volatile semiconductor memory device, and non-volatile semiconductor memory device
‌
US Patent 7830134 Power meter with means to eliminate the need to zero and calibrating
‌
US Patent 7833848 Method for removing hard masks on gates in semiconductor manufacturing process
‌
US Patent 7833880 Process for manufacturing micromechanical devices containing a getter material and devices so manufactured
‌
US Patent 7833888 Integrated circuit system employing grain size enlargement
‌
US Patent 7833909 Method of manufacturing semiconductor device, and etching apparatus
‌
US Patent 7834402 Semiconductor integrated circuit device
‌
US Patent 7834614 Method and apparatus for evaluating rapid changes in current
‌
US Patent 7834651 Power supply circuit
‌
US Patent 7838308 Method of controlling embedded material/gate proximity
‌
US Patent 7838330 Method of field-controlled diffusion and devices formed thereby
‌
US Patent 7838373 Replacement spacers for MOSFET fringe capacitance reduction and processes of making same
‌
US Patent 7838375 System and method for providing a polyemit module for a self aligned heterojunction bipolar transistor architecture
‌
US Patent 7838378 Semiconductor device and manufacturing method thereof
‌
US Patent 7838439 Method of manufacturing an insulating film containing hafnium
‌
US Patent 7839138 Adjustable force electrical contactor
‌
US Patent 7839155 Methods and apparatus to analyze on-chip controlled integrated circuits
‌
US Patent 7839156 Method for detecting tip position of probe, alignment method, apparatus for detecting tip position of probe and probe apparatus
‌
US Patent 7839160 Stress programming of transistors
‌
US Patent 7842577 Two-step STI formation process
‌
US Patent 7842587 III-V MOSFET fabrication and device
‌
US Patent 7842606 Method of depositing thin film and method of manufacturing semiconductor using the same
‌
US Patent 7843202 Apparatus for testing devices
‌
US Patent 7843206 Semiconductor integrated circuit and method for inspecting same
‌
US Patent 7843208 Display substrate and apparatus and method for testing display panel having the same
‌
US Patent 7846772 Layered chip package and method of manufacturing same
‌
US Patent 7846776 Methods for releasably attaching sacrificial support members to microfeature workpieces and microfeature devices formed using such methods
‌
US Patent 7846782 Diode array and method of making thereof
‌
US Patent 7846789 Isolation trench with rounded corners for BiCMOS process
‌
US Patent 7846796 Semiconductor devices including buried bit lines
‌
US Patent 7846806 System and method for providing a self aligned silicon germanium (SiGe) heterojunction bipolar transistor using a mesa emitter-base architecture
‌
US Patent 7846838 Method for producing an electronic component
‌
US Patent 7847536 Hall sensor with temperature drift control
‌
US Patent 7847543 Precision flexible current sensor
‌
US Patent 7847568 Multi-site probe
‌
US Patent 7847569 Probe device and method of regulating contact pressure between object to be inspected and probe
‌
US Patent 7847570 Laser targeting mechanism
‌
US Patent 7847572 Test system, electronic device, and test apparatus
‌
US Patent 7847573 Test apparatus and performance board
‌
US Patent 7847575 Method and apparatus for nano probing a semiconductor chip
‌
US Patent 7851257 Integrated circuit stacking system with integrated passive components
‌
US Patent 7851266 Microelectronic device wafers including an in-situ molded adhesive, molds for in-situ molding adhesives on microelectronic device wafers, and methods of molding adhesives on microelectronic device wafers
‌
US Patent 7851291 Epitaxial silicon germanium for reduced contact resistance in field-effect transistors
‌
US Patent 7851352 Manufacturing method of semiconductor device and electronic device
‌
US Patent 7851361 Laser ablation to selectively thin wafers/die to lower device R
‌
US Patent 7851385 Low temperature conformal oxide formation and applications
‌
US Patent 7851899 Multi-chip ball grid array package and method of manufacture
‌
US Patent 7852063 Integrated power detector with temperature compensation for fully-closed loop control
‌
US Patent 7852065 Testing apparatus for testing electronic system with 4-wires resistive touch panel and the method therefor
‌
US Patent 7852097 Methods and apparatuses for improved positioning in a probing system
‌
US Patent 7852099 Frequency trimming for internal oscillator for test-time reduction
‌
US Patent 7852103 Implementing at-speed Wafer Final Test (WFT) with complete chip coverage
‌
US Patent 7855129 Method for manufacturing direct bonded SOI wafer and direct bonded SOI wafer manufactured by the method
‌
US Patent 7855547 Drawing waveforms in no dead time acquisition system
‌
US Patent 7855567 Electronic device testing system and method
‌
US Patent 7855568 Probe apparatus with mechanism for achieving a predetermined contact load
‌
US Patent 7858402 Integrated circuit package having reversible ESD protection
‌
US Patent 7858478 Method for producing an integrated circuit including a trench transistor and integrated circuit
‌
US Patent 7858492 Method of filling a trench and method of forming an isolating layer structure using the same
‌
US Patent 7858501 Semiconductor wafer for semiconductor components and production method
‌
US Patent 7859248 Electronic device test apparatus and method of setting an optimum pushing condition for contact arm of electronic device test apparatus
‌
US Patent 7859274 System for testing a flat panel display device and method thereof
‌
US Patent 7859275 Parallel scan distributors and collectors and process of testing integrated circuits
‌
US Patent 7859276 Non-destructive validation of semiconductor devices
‌
US Patent 7859277 Apparatus, systems and methods for processing signals between a tester and a plurality of devices under test at high temperatures and with single touchdown of a probe array
‌
US Patent 7859283 Probe apparatus, probing method, and storage medium
‌
US Patent 7859285 Device under test array for identifying defects
‌
US Patent 7859290 Apparatus and method for measuring effective channel
‌
US Patent 7859291 Method of measuring on-resistance in backside drain wafer
‌
US Patent 7863083 High temperature processing compatible metal gate electrode for pFETS and methods for fabrication
‌
US Patent 7863113 Transistor for active matrix display and a method for producing said transistor
‌
US Patent 7863161 Method of cutting a wafer
‌
US Patent 7863188 Semiconductor device and manufacturing method thereof
‌
US Patent 7863201 Methods of forming field effect transistors having silicided source/drain contacts with low contact resistance
‌
US Patent 7863890 Apparatus for testing integrated circuitry
‌
US Patent 7863913 Parallel scan distributors and collectors and process of testing integrated circuits
‌
US Patent 7863914 Method for testing semiconductor memory device using probe and semiconductor memory device using the same
‌
US Patent 7863917 Semiconductor chip having a crack test circuit and method of testing a crack of a semiconductor chip using the same
‌
US Patent 7863919 Applying test response start and command signals to power lead
‌
US Patent 7863920 Electrostatic discharge test system and electrostatic discharge test method
‌
US Patent 7863923 Adaptive test time reduction for wafer-level testing
‌
US Patent 7867786 Ferroelectric layer with domains stabilized by strain
‌
US Patent 7867790 Substrate of probe card and method for regenerating thereof
‌
US Patent 7867833 Semiconductor device utilizing a metal gate material such as tungsten and method of manufacturing the same
‌
US Patent 7867899 Wordline resistance reduction method and structure in an integrated circuit memory device
‌
US Patent 7867900 Aluminum contact integration on cobalt silicide junction
‌
US Patent 7867917 Etch stop layer for a metallization layer with enhanced adhesion, etch selectivity and hermeticity
‌
US Patent 7868608 Detecting open ground connections in surface mount connectors
‌
US Patent 7868630 Integrated light conditioning devices on a probe card for testing imaging devices, and methods of fabricating same
‌
US Patent 7868631 Solar cell testing apparatus
‌
US Patent 7868637 System and method for automated detection of singular faults in diode or'd power bus circuits
‌
US Patent 7868638 System and method for measuring negative bias thermal instability with a ring oscillator
‌
US Patent 7868639 Methods and apparatus for integrated circuit loopback testing
‌
US Patent 7868640 Array-based early threshold voltage recovery characterization measurement
‌
US Patent 7868641 Semiconductor device
‌
US Patent 7868642 Socket for connecting ball-grid-array integrated circuit device to test circuit
‌
US Patent 7868643 Proportional regulation for optimized current sensor performance
‌
US Patent 7868644 Apparatus and method for inspecting liquid crystal display
‌
US Patent 7871858 Semiconductor device and method of manufacturing the same, circuit board, and electronic instrument
‌
US Patent 7871868 LCD TFT array plate and fabricating method thereof
‌
US Patent 7871902 Crack stop trenches
‌
US Patent 7871915 Method for forming metal gates in a gate last process
‌
US Patent 7872468 Optically measuring electric field intensities
‌
US Patent 7872469 Apparatus and methods of integrated-circuit device testing
‌
US Patent 7872482 High density interconnect system having rapid fabrication cycle
‌
US Patent 7872484 Chip pin test apparatus
‌
US Patent 7872487 Semiconductor wafer having a multitude of sensor elements and method for measuring sensor elements on a semiconductor wafer
‌
US Patent 7872488 Tester for testing semiconductor device
‌
US Patent 7876085 Quasi-resonant valley voltage detecting method and apparatus
‌
US Patent 7876087 Probe card repair using coupons with spring contacts and separate atachment points
‌
US Patent 7876089 Test handler, method for loading and manufacturing packaged chips, and method for transferring test trays
‌
US Patent 7876111 System for measuring opposite sides of a wireless communication apparatus
‌
US Patent 7876112 Parallel scan distributors and collectors and process of testing integrated circuits
‌
US Patent 7876113 Method of inspecting pattern and inspecting instrument
‌
US Patent 7876115 Chuck for holding a device under test
‌
US Patent 7876116 Compliant chuck for semiconducting device testing and chiller thereof
‌
US Patent 7876117 Operating method of test handler
‌
US Patent 7876119 Method of inspecting semiconductor device chip patterns on a wafer
‌
US Patent 7876121 Link analysis compliance and calibration verification for automated printed wiring board test systems
‌
US Patent 7876122 Display device
‌
US Patent 7879703 Method of fabricating semiconductor device for reducing thermal burden on impurity regions of peripheral circuit region
‌
US Patent 7879706 Memory and manufacturing method thereof
‌
US Patent 7879729 Method of forming a micro pattern of a semiconductor device
‌
US Patent 7880473 Non-invasive monitoring and diagnosis of electric machines by measuring external flux density
‌
US Patent 7880486 Method and apparatus for increasing operating frequency of a system for testing electronic devices
‌
US Patent 7880490 Wireless interface probe card for high speed one-shot wafer test and semiconductor testing apparatus having the same
‌
US Patent 7880492 Integrated circuits with programmable well biasing
‌
US Patent RE42115 Mechanism for fixing probe card
‌
US Patent 7883937 Electronic package and method of forming the same
‌
US Patent 7883946 Angled implantation for deep submicron device optimization
‌
US Patent 7884595 Method for producing an electricity sensing device
‌
US Patent 7884598 Clamp jaw assembly
‌
US Patent 7884599 HDL design structure for integrating test structures into an integrated circuit design
‌
US Patent 7884627 Stiffener assembly for use with testing devices
‌
US Patent 7884628 Interposer and probe card having the same
‌
US Patent 7884629 Probe card layout
‌
US Patent 7884632 Semiconductor inspecting device
‌
US Patent 7884634 High density interconnect system having rapid fabrication cycle
‌
US Patent 7888238 Method of manufacturing semiconductor device having semiconductor formation regions of different planar sizes
‌
US Patent 7888247 Method of forming polycrystalline semiconductor film
‌
US Patent 7888273 Density gradient-free gap fill
‌
US Patent 7888942 Devices and methods for LED life test
‌
US Patent 7888953 Probe card
‌
US Patent 7888955 Method and apparatus for testing devices using serially controlled resources
‌
US Patent 7888959 Apparatus and method for hardening latches in SOI CMOS devices
‌
US Patent 7888960 Method of testing a power supply controller and structure therefor
‌
US Patent 7888961 Apparatus and method for electrical detection and localization of shorts in metal interconnect lines
‌
US Patent 7893478 Semiconductor storage device and driving method thereof
‌
US Patent 7893683 Device, probe, and method for the galvanically decoupled transmission of a measuring signal
‌
US Patent 7893684 Integrated power detector with temperature compensation for fully-closed loop control
‌
US Patent 7893699 Method for identifying electronic circuits and identification device
‌
US Patent 7893700 Configuration of shared tester channels to avoid electrical connections across die area boundary on a wafer
‌
US Patent 7893702 Apparatus for testing semiconductor device package and multilevel pusher thereof
‌
US Patent 7893703 Systems and methods for controlling deposition of a charge on a wafer for measurement of one or more electrical properties of the wafer
‌
US Patent 7893705 Module for test device for testing circuit boards
‌
US Patent 7898240 Current measuring apparatus
‌
US Patent 7898242 Probe card assembly with an interchangeable probe insert
‌
US Patent 7898270 Circuit for testing internal voltage of semiconductor memory apparatus
‌
US Patent 7898272 Probe card
‌
US Patent 7898274 Structure of probe
‌
US Patent 7898276 Probe card with stacked substrate
‌
US Patent 7898277 Hot-electronic injection testing of transistors on a wafer
‌
US Patent 7898279 Circuit for multi-pads test
‌
US Patent 7902811 Current sensor
‌
US Patent 7902813 Protective digital relay device
‌
US Patent 7902845 Inspection method and inspection apparatus
‌
US Patent 7902846 Electronics tester with a signal distribution board and a wafer chuck having different coefficients of thermal expansion
‌
US Patent 7902848 Reversible test probe and test probe tip
‌
US Patent 7902849 Apparatus and method for test structure inspection
‌
US Patent 7902850 Versatile materials probe
‌
US Patent 7902851 Hermeticity testing
‌
US Patent 7902852 High density test structure array to support addressable high accuracy 4-terminal measurements
‌
US Patent 7902854 Body capacitance electric field powered device for high voltage lines
‌
US Patent 7906955 On-chip current sensing methods and systems
‌
US Patent 7906957 High voltage connector and method having integrated voltage measurement probe points
‌
US Patent 7906979 High frequency differential test probe for automated printed wiring board test systems
‌
US Patent 7906981 Test apparatus and test method
‌
US Patent 7906982 Interface apparatus and methods of testing integrated circuits using the same
‌
US Patent 7911199 Method for eliminating the need to zero and calibrate a power meter before use
‌
US Patent 7911204 Reel shaft of barcode printer
‌
US Patent 7911216 Semiconductor integrated circuit, debug/trace circuit and semiconductor integrated circuit operation observing method
‌
US Patent 7911217 Liquid crystal display, connector and method of testing the liquid crystal display
‌
US Patent 7911218 Device and method for analyzing a sample plate
‌
US Patent 7911219 Wiring pattern characteristic evaluation mounting board
‌
US Patent 7911220 Semiconductor integrated circuit apparatus, measurement result management system, and management server
‌
US Patent 7915885 Sensor system and method
‌
US Patent 7915902 Dynamic burn-in systems and apparatuses
‌
US Patent 7915903 Batch-test method using a chip tray
‌
US Patent 7915904 System resistance simulating apparatus
‌
US Patent 7915906 Test circuit for liquid crystal display device, LCD device including test circuit, and testing method for LCD device
‌
US Patent 7915907 Faulty dangling metal route detection
‌
US Patent 7915908 Crosstalk suppression in wireless testing of semiconductor devices
‌
US Patent 7919960 Electricity meter capable of minimizing the risk of data destruction from lightning or surge
‌
US Patent 7919972 Integrated substrate transfer module
‌
US Patent 7919974 Electronic device test apparatus and method of configuring electronic device test apparatus
‌
US Patent 7923987 Magnetic sensor integrated circuit with test conductor
‌
US Patent 7923988 Test equipment and test system using the same
‌
US Patent 7924036 Contactor assembly for integrated circuit testing
‌
US Patent 7924037 Inspection apparatus comprising means for removing flux
‌
US Patent 7924039 Self-cleaning package testing socket
‌
US Patent 7924041 Liquid crystal display including sensing unit for compensation driving
‌
US Patent 7924042 Semiconductor device, and design method, inspection method, and design program therefor
‌
US Patent 7928721 Method and apparatus for amplifying a signal and test device using same
‌
US Patent 7928723 Measurement of dissipated power
‌
US Patent 7928738 Detecting system for detecting connection of connectors and connector assemblies having same
‌
US Patent 7928747 Operating an integrated circuit at a minimum supply voltage
‌
US Patent 7928749 Vertical probe comprising slots and probe card for integrated circuit devices using the same
‌
US Patent 7928750 Contactless interfacing of test signals with a device under test
‌
US Patent 7928754 Wafer level burn-in and electrical test system and method
‌
US Patent 7932713 Method and apparatus for amplifying a signal and test device using same
‌
US Patent 7932736 Integrated circuit with improved test capability via reduced pin count
‌
US Patent 7932738 Method and apparatus for reading a programmable anti-fuse element in a high-voltage integrated circuit
‌
US Patent 7932739 BGA package holder device and method for testing of BGA packages
‌
US Patent 7936165 Current sensor
‌
US Patent 7936176 Method for providing alignment of a probe
‌
US Patent 7936177 Providing an electrically conductive wall structure adjacent a contact structure of an electronic device
‌
US Patent 7936178 Test probe
‌
US Patent 7940042 Method and apparatus for testing magnetoresistive effect element
‌
US Patent 7940064 Method and apparatus for wafer level burn-in
‌
US Patent 7940067 Probe with printed tip
‌
US Patent 7940068 Test board
‌
US Patent 7940070 Singulated bare die testing fixture
‌
US Patent 7940072 Timing generator and semiconductor test apparatus
‌
US Patent 7943419 Organic triodes with novel grid structures and method of production
‌
US Patent 7944199 Voltage-measuring circuit and method
‌
US Patent 7944217 Object proximity detector and object position detector
‌
US Patent 7944223 Burn-in testing system
‌
US Patent 7944225 Method and apparatus for providing a tester integrated circuit for testing a semiconductor device under test
‌
US Patent 7944229 Method and apparatus for calibrating internal pulses in an integrated circuit
‌
US Patent 7948018 Multilayer image sensor structure for reducing crosstalk
‌
US Patent 7948033 Semiconductor device having trench edge termination structure
‌
US Patent 7948249 Semiconductor chip having a crack test circuit and method of testing a crack of a semiconductor chip using the same
‌
US Patent 7948251 Guide device and test apparatus for electronic devices
‌
US Patent 7948252 Multilayered probe card
‌
US Patent 7948254 Digital communications test system for multiple input, multiple output (MIMO) systems
‌
US Patent 7948259 Dielectric film and layer testing
‌
US Patent 7952359 Test apparatus having bidirectional differential interface
‌
US Patent 7952364 Power noise detecting device and power noise control device using the same
‌
US Patent 7952368 Apparatus and method for measuring diode chip
‌
US Patent 7952371 Integrated circuit device having ground open detection circuit
‌
US Patent 7952373 Construction structures and manufacturing processes for integrated circuit wafer probe card assemblies
‌
US Patent 7952375 AC coupled parameteric test probe
‌
US Patent 7952378 Tunable stress technique for reliability degradation measurement
‌
US Patent 7956606 Position sensing assembly
‌
US Patent 7956625 Undoped silicon heat spreader window
‌
US Patent 7956628 Chip-based prober for high frequency measurements and methods of measuring
‌
US Patent 7956630 Real-time effective-wavelength error correction for HDVSI
‌
US Patent 7956633 Stacked guard structures
‌
US Patent 7956634 Apparatus and method for performing an ion concentration analysis in liquid crystal panel
‌
US Patent 7956635 Stiffener assembly for use with testing devices
‌
US Patent 7956636 Generating test benches for pre-silicon validation of retimed complex IC designs against a reference design
‌
US Patent 7956637 System and method to determine electric motor efficiency using an equivalent circuit
‌
US Patent 7960249 Method for producing wafer for backside illumination type solid imaging device
‌
US Patent 7960254 Manufacturing method for epitaxial wafer
‌
US Patent 7960965 Multimeter having communications via measurement terminals and communication system for same
‌
US Patent 7960982 Supply current based testing of CMOS output stages
‌
US Patent 7960984 Semiconductor device having ESD protection circuit and method of testing the same
‌
US Patent 7960985 Identification of integrated circuit
‌
US Patent 7960987 Operation voltage supply method for semiconductor device
‌
US Patent 7960989 Mechanical decoupling of a probe card assembly to improve thermal response
‌
US Patent 7960991 Test apparatus and probe card
‌
US Patent 7960992 Conveyor-based memory-module tester with elevators distributing moving test motherboards among parallel conveyors for testing
‌
US Patent 7960998 Electrical test structure and method for characterization of deep trench sidewall reliability
‌
US Patent 7960999 Methods and systems for evaluating permanent magnet motors
‌
US Patent 7964934 Fuse target and method of forming the fuse target in a copper process flow
‌
US Patent 7965091 Test plate for electronic handler
‌
US Patent 7965092 Differential signal transmitting apparatus and a test apparatus
‌
US Patent 7965094 Packaged die heater
‌
US Patent 7965096 Circuit and method for detecting faulty diode
‌
US Patent 7969139 Rogowski sensor and method for measuring a current
‌
US Patent 7969172 Probing method and probing program
‌
US Patent 7969175 Separate test electronics and blower modules in an apparatus for testing an integrated circuit
‌
US Patent 7969176 Voltage margin test device
‌
US Patent 7969177 System and method for thermal limit control
‌
US Patent 7973547 Method and apparatus for detecting a crack in a semiconductor wafer, and a wafer chuck
‌
US Patent 7973549 Method and apparatus for calibrating internal pulses in an integrated circuit
‌
US Patent 7973551 Test fixture for printed circuit board
‌
US Patent 7977747 Composite substrate and method of fabricating the same
‌
US Patent 7977934 High bandwidth open-loop current sensor
‌
US Patent 7977937 GMR biosensor with aligned magnetic field
‌
US Patent 7977956 Method and apparatus for probe card alignment in a test system
‌
US Patent 7977958 Bi-directional buffer for interfacing test system channel
‌
US Patent 7977962 Apparatus and methods for through substrate via test
‌
US Patent 7977963 Methods, systems and apparatus for detecting abnormal operation of an inverter sub-module
‌
US Patent 7982216 Thin film field effect transistor with amorphous oxide active layer and display using the same
‌
US Patent 7982279 Method of manufacturing stacked-type semiconductor device
‌
US Patent 7982450 Device and method allowing the detection and display of objects located behind an obscuring surface
‌
US Patent 7982452 Detection of a load state of a half-bridge
‌
US Patent 7982456 Magnetic detection apparatus
‌
US Patent 7982457 Method and eddy current system for non-contact determination of interface resistance
‌
US Patent 7982465 Electromagnetic method on shallow water using a controlled source
‌
US Patent 7982473 Position detector
‌
US Patent 7982476 Conduction-cooled accelerated test fixture
‌
US Patent 7982477 Universal test fixture for high-power packaged transistors and diodes
‌
US Patent 7982479 Inspection methods for defects in electrophoretic display and related devices
‌
US Patent 7982480 Calibrated wideband high frequency passive impedance probe
‌
US Patent 7982481 Module for a parallel tester for the testing of circuit boards
‌
US Patent 7982484 System for making contact between a transmit/receive module and a testing device
‌
US Patent 7982486 Method for measuring PN-junction temperature of light-emitting diode (LED)
‌
US Patent 7986140 Systems and methods for RF magnetic-field vector detection based on spin rectification effects
‌
US Patent 7986156 Semiconductor device including address signal generating protion and digital-to-analog converter
‌
US Patent 7986157 High speed probing apparatus for semiconductor devices and probe stage for the same
‌
US Patent 7989279 Method of fabricating semiconductor device
‌
US Patent 7989293 Trench device structure and fabrication
‌
US Patent 7989366 Dopant activation in doped semiconductor substrates
‌
US Patent 7989853 Integration of high voltage JFET in linear bipolar CMOS process
‌
US Patent 7990154 Cell voltage detecting apparatus
‌
US Patent 7990164 Method of designing a probe card apparatus with desired compliance characteristics
‌
US Patent 7990167 System and method for modulation mapping
‌
US Patent 7990170 Electrostatic discharge withstand voltage evaluating device and electrostatic discharge withstand voltage evaluating method
‌
US Patent 7993943 GaN based LED with improved light extraction efficiency and method for making the same
‌
US Patent 7993983 Method of making a semiconductor chip assembly with chip and encapsulant grinding
‌
US Patent 7994010 Process for fabricating a semiconductor device having embedded epitaxial regions
‌
US Patent 7994025 Wafer processing method without occurrence of damage to device area
‌
US Patent 7994029 Method for patterning crystalline indium tin oxide using femtosecond laser
‌
US Patent 7994634 Semiconductor element and semiconductor element fabrication method
‌
US Patent 7994772 Remote transmitter for analogue gauges
‌
US Patent 7994779 Method for continuously determining the tensile force F in a cable of a parking brake
‌
US Patent 7994792 Electric field sensor for marine environments
‌
US Patent 7994806 System and method for testing embedded circuits with test islands
‌
US Patent 7994808 Contact insert for a microcircuit test socket
‌
US Patent 7994810 Electro-optical device
‌
US Patent 7999290 Dual panel type organic electroluminescent device and method of fabricating the same
‌
US Patent 7999312 Insulated gate-type semiconductor device having a low concentration diffusion region
‌
US Patent 7999357 Electrostatic discharge circuit using forward biased circular-arc shaped steering diodes
‌
US Patent RE42637 Probe card
‌
US Patent 8003451 Method of manufacturing array substrate of liquid crystal display device
‌
US Patent 8003452 Compound semiconductor device and manufacturing method thereof
‌
US Patent 8003454 CMOS process with optimized PMOS and NMOS transistor devices
‌
US Patent 8003508 Method of forming gate line of semiconductor device
‌
US Patent 8004066 Crack stop and moisture barrier
‌
US Patent 8004305 Electronic circuit for measurement of transistor variability and the like
‌
US Patent RE42655 Mechanism for fixing probe card
‌
US Patent 8008128 Thin quad flat package with no leads (QFN) fabrication methods
‌
US Patent 8008214 Method of forming an insulation structure and method of manufacturing a semiconductor device using the same
‌
US Patent 8008644 Phase-change memory cell having two insulated regions
‌
US Patent 8008647 Nitride semiconductor device with superlattice active layer including barrier layers with different energy band gaps
‌
US Patent 8008688 Photodiode and method of fabrication
‌
US Patent 8008738 Integrated differential pressure sensor
‌
US Patent 8008743 Vapor deposition of silicon dioxide nanolaminates
‌
US Patent 8008786 Dynamic pad size to reduce solder fatigue
‌
US Patent 8008913 Automatic lift-off compensation for pulsed eddy current inspection
‌
US Patent 8008939 Component test apparatus and component transport method
‌
US Patent 8011513 Semiconductor workpiece carriers and methods for processing semiconductor workpieces
‌
US Patent 8012779 Gallium nitride-based light emitting diode and method of manufacturing the same
‌
US Patent 8012787 Photovoltaic device and manufacturing method thereof
‌
US Patent 8012801 Flip chip mounting process and flip chip assembly
Edits on 13 Dec, 2021
Golden AI profile picture
Golden AI
edited on 13 Dec, 2021
Edits made to:
Infobox (+1 properties)
Infobox
Patent primary examiner of
‌
US Patent 8012801 Flip chip mounting process and flip chip assembly
Golden AI profile picture
Golden AI
edited on 13 Dec, 2021
Edits made to:
Infobox (+1 properties)
Infobox
Patent primary examiner of
‌
US Patent 8012787 Photovoltaic device and manufacturing method thereof
Golden AI profile picture
Golden AI
edited on 13 Dec, 2021
Edits made to:
Infobox (+1 properties)
Infobox
Patent primary examiner of
‌
US Patent 8012779 Gallium nitride-based light emitting diode and method of manufacturing the same
Edits on 8 Dec, 2021
Golden AI profile picture
Golden AI
edited on 8 Dec, 2021
Edits made to:
Infobox (+1 properties)
Infobox
Patent primary examiner of
‌
US Patent 8011513 Semiconductor workpiece carriers and methods for processing semiconductor workpieces
Golden AI profile picture
Golden AI
edited on 8 Dec, 2021
Edits made to:
Infobox (+1 properties)
Infobox
Patent primary examiner of
‌
US Patent 8008939 Component test apparatus and component transport method
Golden AI profile picture
Golden AI
edited on 8 Dec, 2021
Edits made to:
Infobox (+1 properties)
Infobox
Patent primary examiner of
‌
US Patent 8008913 Automatic lift-off compensation for pulsed eddy current inspection
Golden AI profile picture
Golden AI
edited on 8 Dec, 2021
Edits made to:
Infobox (+1 properties)
Infobox
Patent primary examiner of
‌
US Patent 8008786 Dynamic pad size to reduce solder fatigue
Golden AI profile picture
Golden AI
edited on 8 Dec, 2021
Edits made to:
Infobox (+1 properties)
Infobox
Patent primary examiner of
‌
US Patent 8008743 Vapor deposition of silicon dioxide nanolaminates
Golden AI profile picture
Golden AI
edited on 8 Dec, 2021
Edits made to:
Infobox (+1 properties)
Infobox
Patent primary examiner of
‌
US Patent 8008738 Integrated differential pressure sensor
Golden AI profile picture
Golden AI
edited on 8 Dec, 2021
Edits made to:
Infobox (+1 properties)
Infobox
Patent primary examiner of
‌
US Patent 8008688 Photodiode and method of fabrication
Golden AI profile picture
Golden AI
edited on 8 Dec, 2021
Golden AI profile picture
Golden AI
edited on 8 Dec, 2021
Edits made to:
Infobox (+1 properties)
Infobox
Patent primary examiner of
‌
US Patent 8008644 Phase-change memory cell having two insulated regions
Golden AI profile picture
Golden AI
edited on 8 Dec, 2021
Golden AI profile picture
Golden AI
edited on 8 Dec, 2021
Edits made to:
Infobox (+1 properties)
Infobox
Patent primary examiner of
‌
US Patent 8008128 Thin quad flat package with no leads (QFN) fabrication methods

Find more people like Ha Tran T Nguyen

Use the Golden Query Tool to discover related individuals, professionals, or experts with similar interests, expertise, or connections in the Knowledge Graph.
Open Query Tool
Access by API
Golden Query Tool
Golden logo